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Titlebook: Charged Semiconductor Defects; Structure, Thermodyn Edmund G. Seebauer,Meredith C. Kratzer Book 2009 Springer-Verlag London 2009 Catalysis.

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樓主: GERM
31#
發(fā)表于 2025-3-27 00:42:18 | 只看該作者
32#
發(fā)表于 2025-3-27 03:05:10 | 只看該作者
33#
發(fā)表于 2025-3-27 06:39:12 | 只看該作者
Intrinsic Defects: Structure,insic point defects, clusters, and associates that exist within the semiconductor bulk or on the surface, and then summarizes the extensive literature about the variation of the corresponding structures with charge state. Group IV, III-V, and common oxide semiconductors such as ZnO and TiO. are trea
34#
發(fā)表于 2025-3-27 09:56:03 | 只看該作者
Intrinsic Defects: Ionization Thermodynamics,gen pressure (for oxides). For most semiconductor defects, identification of the most stable charge states as a function of Fermi level (and other conditions) is best quantified via ionization levels. Numerous experimental and computational reports give values for the ionization levels of defects wi
35#
發(fā)表于 2025-3-27 15:41:28 | 只看該作者
Intrinsic Defects: Diffusion,tes and clusters. This chapter summarizes the literature regarding the mechanisms for charge state effects on defect site-to-site hopping as well as overall mass transport that depends upon the number of mobile defects. More than one type of defect (or defect charge state) can contribute to overall
36#
發(fā)表于 2025-3-27 21:27:47 | 只看該作者
37#
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38#
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39#
發(fā)表于 2025-3-28 08:27:37 | 只看該作者
https://doi.org/10.1007/978-3-8350-9053-8ct symmetry, as well as the magnitude and direction of the relaxation by nearby atoms, is described in detail for many specific bulk and surface defect types, with special emphasis upon how these features depend upon charge state. Related results for defect clusters and associates are also described.
40#
發(fā)表于 2025-3-28 12:55:57 | 只看該作者
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