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Titlebook: Carbon; The Future Material Giacomo Messina,Saveria Santangelo Book 2006 Springer-Verlag Berlin Heidelberg 2006 Raman spectroscopy.Sensor.

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樓主: ARRAY
51#
發(fā)表于 2025-3-30 09:58:57 | 只看該作者
Effects of Nanoscale Clustering in Amorphous Carbon,e line width with increasing spin density and how this intracluster interaction can be extended to the intercluster transport properties, in particular, for electron field emission from the films. We also examine how the mechanical properties of carbon films are affected by clustering which can be enhanced by thermal annealing.
52#
發(fā)表于 2025-3-30 13:46:48 | 只看該作者
53#
發(fā)表于 2025-3-30 17:50:51 | 只看該作者
54#
發(fā)表于 2025-3-30 22:57:59 | 只看該作者
Aid of Scaling Laws in the Achievement of a Well-Controlled Film Deposition Process,stems and physical processes and, generally, for handling problems involving many variables. We indicate the path for deriving a scaling law for the growth parameters, referring to the synthesis of hydrogenated amorphous carbon-nitrides (.-CN:H ) by reactive sputtering as an example. Thanks to its g
55#
發(fā)表于 2025-3-31 02:20:01 | 只看該作者
A Spectroscopic Approach to Carbon Materials for Energy Storage,ptual tools will be introduced in Sect. 2 and Sect. 3; the basic structural and dynamical properties of the different crystalline or ordered aggregation forms of carbon will be described. With such a background we pave the way to the spectroscopic characterization (Raman and infrared) of disordered
56#
發(fā)表于 2025-3-31 07:12:26 | 只看該作者
57#
發(fā)表于 2025-3-31 11:55:48 | 只看該作者
58#
發(fā)表于 2025-3-31 14:56:07 | 只看該作者
59#
發(fā)表于 2025-3-31 19:38:54 | 只看該作者
,Defects in CVD Diamond Films from Their Response as?Nuclear Detectors,on requires high drift lengths of the carriers produced by the ionizing particle, the presence of defects severely limits the performance of these detectors. This is a major issue because the fabrication technology of CVD diamond is much less advanced than that of more conventional materials like si
60#
發(fā)表于 2025-4-1 00:59:39 | 只看該作者
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