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Titlebook: CMOS Integrated Analog-to-Digital and Digital-to-Analog Converters; Rudy Plassche Book 2003Latest edition Springer Science+Business Media

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樓主: 喜悅
11#
發(fā)表于 2025-3-23 12:01:45 | 只看該作者
Limitations of comparators,tage or the input stage of a comparator. The amplitude of the input signal is usually much larger than the linear range of the input amplifier stages. In this way a limitation of signals for the individual amplifier stages occurs. This amplitude limitation results in variations of the delay times of
12#
發(fā)表于 2025-3-23 13:58:05 | 只看該作者
Technology and device matching,ter for example needs for l. yield and ±? LSB INL an element matching of 2.5%. In case we want to increase the yield to 3. then the matching must be increased to 1.25%. In this section matching parameters of devices in MOS technology will be given. It must be noted, however, that mostly the matching
13#
發(fā)表于 2025-3-23 19:49:36 | 只看該作者
Testing of D/A and A/D converters,mously on the test procedures. In general, static performance tests can be performed by using digital voltmeters which can be a part of an Automatic Test Equipment set (ATE). Dynamic tests, especially in the case of high-dynamic-range tests, require special equipment. Furthermore, these dynamic test
14#
發(fā)表于 2025-3-23 23:38:09 | 只看該作者
Book 2003Latest edition Spurious Free Dynamic Range (SFDR), Integral Non-Linearity (INL), Differential Non-Linearity (DNL) and sampling clock jitter requirements. Relations between these specifications and practical issues like matching of components and offset parameters of differential pairs are derived. ..CMOS Integrat
15#
發(fā)表于 2025-3-24 05:28:32 | 只看該作者
16#
發(fā)表于 2025-3-24 09:11:29 | 只看該作者
Fields of Research and Technology,s are generally more difficult to standardize and consume more test time (see [35, 36, 16, 17]). Up until now dynamic test results have been listed very briefly in specification sheets. In this chapter we will determine test configurations and test procedures in order to arrive at a unanimous qualification of converters.
17#
發(fā)表于 2025-3-24 11:49:55 | 只看該作者
https://doi.org/10.1007/978-981-97-6814-1nal spectrum. The spurious free dynamic range is a very good measure for the linearity of the converter at high output signal frequencies. Therefore special designs are needed that perform this function. In many cases the resolution is limited to 10 to 12 bits, although extension into the 14 to 16 bit range will come up soon.
18#
發(fā)表于 2025-3-24 15:07:20 | 只看該作者
Ibtisam E. Tothill,Mohammed J. Abdinut low-pass filter reconstructs the analog signal and removes the modulation signal. Maximum speed of these types of converters is limited to the kHz range or low Mega Hertz range. The advantage of these systems is the small amount of accurate components that are needed in a practical implementation.
19#
發(fā)表于 2025-3-24 19:01:12 | 只看該作者
20#
發(fā)表于 2025-3-25 02:54:36 | 只看該作者
High-speed D/A converters,nal spectrum. The spurious free dynamic range is a very good measure for the linearity of the converter at high output signal frequencies. Therefore special designs are needed that perform this function. In many cases the resolution is limited to 10 to 12 bits, although extension into the 14 to 16 bit range will come up soon.
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