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Titlebook: CMOS Cantilever Sensor Systems; Atomic Force Microsc D. Lange,O. Brand,H. Baltes Book 2002 Springer-Verlag Berlin Heidelberg 2002 Atomic fo

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發(fā)表于 2025-3-21 19:13:47 | 只看該作者 |倒序瀏覽 |閱讀模式
書目名稱CMOS Cantilever Sensor Systems
副標(biāo)題Atomic Force Microsc
編輯D. Lange,O. Brand,H. Baltes
視頻videohttp://file.papertrans.cn/221/220332/220332.mp4
概述This book describes a vital measuring principle for analysing integrated circuits with a nano-electro-mechanical system.Includes supplementary material:
叢書名稱Microtechnology and MEMS
圖書封面Titlebook: CMOS Cantilever Sensor Systems; Atomic Force Microsc D. Lange,O. Brand,H. Baltes Book 2002 Springer-Verlag Berlin Heidelberg 2002 Atomic fo
描述This book is intended for scientists and engineers in the field of micro- and nano- electro-mechanical systems (MEMS and NEMS) and introduces the development of cantilever-based sensor systems using CMOS-compatible micromachining from the design concepts and simulations to the prototype. It is also a useful resource for researchers on cantilever sensors and resonant sensors in general The reader will become familiar with the potential of the combination of two technological approaches: IC fabrication technology, notably CMOS technology, and silicon micromachining and the resulting microstructures such as cantilever beams. It was recognized early that these two technologies should be merged in order to make the microstructures smart and devise integrated microsystems with on-chip driving and signal conditioning circuitry - now known as CMOS MEMS or, with the arrival of nanostructures, CMOS NEMS. One way to achieve the merger is the post-processing micro- or nano- machining of finished CMOS wafers, some of which is described in this book. The book introduces this approach based on work carried out at the Physical Electronics Laboratory of ETH Zurich on arrays of cantilever transducer
出版日期Book 2002
關(guān)鍵詞Atomic force microscopy; CMOS compatible micromachining; Cantilever; Chemical sensors; Sensor; Sensors; mi
版次1
doihttps://doi.org/10.1007/978-3-662-05060-6
isbn_softcover978-3-642-07728-9
isbn_ebook978-3-662-05060-6Series ISSN 1615-8326 Series E-ISSN 2365-0680
issn_series 1615-8326
copyrightSpringer-Verlag Berlin Heidelberg 2002
The information of publication is updating

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D. Lange,O. Brand,H. BaltesThis book describes a vital measuring principle for analysing integrated circuits with a nano-electro-mechanical system.Includes supplementary material:
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Microtechnology and MEMShttp://image.papertrans.cn/c/image/220332.jpg
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Benedict A. San Jose,Kazuo Akaginowledge of spring constant, resonance frequency and corresponding quality factor of a cantilever sensor have to be taken into account to optimize sensitivity and resolution. The goal of this chapter is to develop a basic understanding of the dependency of the resonator characteristics on geometry a
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Patrice Hesto,Jean-Michel Lourtioznstrument utilized in several areas of research as well as in industrial applications, e.g. for quality control. These instruments have improved in quality and usability significantly over the last decade. Still, the drawback of commercially available AFM systems is their low throughput due to the s
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Nanosciences and Nanotechnology They are fabricated utilizing IC technology and compatible micromachining, thus exploiting unique features such as cost effective batch fabrication and manufacturing with well established reliability. The cantilevers consist of single crystalline silicon and the dielectric layers from the CMOS proc
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978-3-642-07728-9Springer-Verlag Berlin Heidelberg 2002
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