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SCIE期刊MICROELECTRONICS RELIABILITY 2024/2025影響因子:1.672 (MICROELECTRON RELIAB) (0026-2714). (NANOSCIENCE & NANOTECHNOLOG

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發(fā)表于 2025-3-21 19:08:15 | 只看該作者 |倒序瀏覽 |閱讀模式
期刊全稱MICROELECTRONICS RELIABILITY
期刊簡稱MICROELECTRON RELIAB
影響因子20241.672
視頻videohttp://file.papertrans.cn/22/21932/21932.mp4
ISSN0026-2714
eISSN1872-941X
出版商PERGAMON-ELSEVIER SCIENCE LTD
發(fā)行地址THE BOULEVARD, LANGFORD LANE, KIDLINGTON, OXFORD, ENGLAND, OX5 1GB
學(xué)科分類1.Science Citation Index Expanded (SCIE)--Engineering, Electrical & Electronic | Nanoscience & Nanotechnology | Physics, Applied; 2.Current Contents Electronics & Telecommunications Collection--Electronics & Electrical Engineering; 3.Current Contents Engineering, Computing & Technology--Electrical & Electronics Engineering; 4.Essential Science Indicators--Engineering;
出版語言English
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SCIE(SCI)期刊MICROELECTRONICS RELIABILITY(20 21 REV HIST)影響因子


SCIE(SCI)期刊MICROELECTRONICS RELIABILITY(MICROELECTRON RELIAB)影響因子@(納米科學(xué)與納米技術(shù))學(xué)科排名


SCIE(SCI)期刊MICROELECTRONICS RELIABILITY(20 21 REV HIST)總引論文


SCIE(SCI)期刊MICROELECTRONICS RELIABILITY(MICROELECTRON RELIAB)總引論文@(納米科學(xué)與納米技術(shù))學(xué)科排名


SCIE(SCI)期刊MICROELECTRONICS RELIABILITY(20 21 REV HIST)影響因子


SCIE(SCI)期刊MICROELECTRONICS RELIABILITY(MICROELECTRON RELIAB)總引頻次@(納米科學(xué)與納米技術(shù))學(xué)科排名


SCIE(SCI)期刊MICROELECTRONICS RELIABILITY(20 21 REV HIST)即時影響因子


SCIE(SCI)期刊MICROELECTRONICS RELIABILITY(MICROELECTRON RELIAB)即時影響因子@(納米科學(xué)與納米技術(shù))學(xué)科排名


SCIE(SCI)期刊MICROELECTRONICS RELIABILITY(20 21 REV HIST)五年累積影響因子


SCIE(SCI)期刊MICROELECTRONICS RELIABILITY(MICROELECTRON RELIAB)五年累積影響因子@(納米科學(xué)與納米技術(shù))學(xué)科排名


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沙發(fā)
發(fā)表于 2025-3-21 23:57:51 | 只看該作者
板凳
發(fā)表于 2025-3-22 01:10:20 | 只看該作者
Submitted on: 17 January 2010. Revised on: 25 February 2010. Accepted on: 03 March 2010. MICROELECTRONICS RELIABILITY---PERGAMON-ELSEVIER SCIENCE LTD
地板
發(fā)表于 2025-3-22 07:51:37 | 只看該作者
5#
發(fā)表于 2025-3-22 11:53:40 | 只看該作者
Submitted on: 28 April 2020. Revised on: 20 May 2020. Accepted on: 03 June 2020. MICROELECTRONICS RELIABILITY
6#
發(fā)表于 2025-3-22 15:25:00 | 只看該作者
Submitted on: 20 February 2017. Revised on: 14 March 2017. Accepted on: 22 March 2017. MICROELECTRONICS RELIABILITY---PERGAMON-ELSEVIER SCIENCE LTD
7#
發(fā)表于 2025-3-22 18:32:12 | 只看該作者
Submitted on: 19 September 2000. Revised on: 17 October 2000. Accepted on: 12 November 2000. MICROELECTRONICS RELIABILITY
8#
發(fā)表于 2025-3-22 22:10:17 | 只看該作者
Submitted on: 04 June 2015. Revised on: 03 July 2015. Accepted on: 29 July 2015. MICROELECTRONICS RELIABILITY---PERGAMON-ELSEVIER SCIENCE LTD
9#
發(fā)表于 2025-3-23 04:06:29 | 只看該作者
Submitted on: 04 January 2001. Revised on: 31 January 2001. Accepted on: 09 February 2001. MICROELECTRONICS RELIABILITY
10#
發(fā)表于 2025-3-23 06:35:55 | 只看該作者
Submitted on: 08 October 2018. Revised on: 08 November 2018. Accepted on: 29 November 2018. MICROELECTRONICS RELIABILITY
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