Titlebook: Bringing Scanning Probe Microscopy up to Speed; S. C. Minne,S. R. Manalis,C. F. Quate Book 1999 Kluwer Academic Publishers 1999 Helium-Ato

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Cantilevers with Interdigital Deflection Sensors, the higher orders by this grating gives us a measure of the deflection of the set of fingers attached to the beam that carries the tip. This is in contrast to the optical lever where the position of the optical beam is used to measure the deflection.

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傳授知識(shí)

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1389-2134 r increasing speed. The authors include usefulinformation on the characteristics and limitations of currentstate-of-the-art machines as well as the properties of the systemsthat will follow in the future. The basic approach is two-fold. First,fast scanning systems for single probes are treated and,

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https://doi.org/10.1007/978-981-19-8206-4nsverse (x-y) plane is the source of the problem. The scanning speed can be increased with an integrated actuator that acts only on the cantilever as described in this chapter. The scanned area can be increased with parallel arrays of cantilevers as described in Chapter 6.

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https://doi.org/10.1007/978-981-19-8206-4 the higher orders by this grating gives us a measure of the deflection of the set of fingers attached to the beam that carries the tip. This is in contrast to the optical lever where the position of the optical beam is used to measure the deflection.

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Dark triads and toxic triangles, charge in films of silicon nitride. At Canon, Takimoto. has used the STM to store bits by changing the conductivity of the medium with a current pulse on the tip. Hosoka. has used small gold clusters deposited by field desorption from the probe tip.