找回密碼
 To register

QQ登錄

只需一步，快速開始

掃一掃，訪問微社區(qū)

打印 上一主題 下一主題

SCIE期刊JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS 2024/2025影響因子:1.142 (J ELECTRON TEST) (0923-8174). (ENGINEE

[復(fù)制鏈接]
查看: 43672|回復(fù): 35
樓主
發(fā)表于 2025-3-21 19:42:53 | 只看該作者 |倒序瀏覽 |閱讀模式
期刊全稱JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS
期刊簡稱J ELECTRON TEST
影響因子20241.142
視頻videohttp://file.papertrans.cn/17/16520/16520.mp4
ISSN0923-8174
eISSN1573-0727
出版商SPRINGER
發(fā)行地址ONE NEW YORK PLAZA, SUITE 4600 , NEW YORK, United States, NY, 10004
學(xué)科分類1.Science Citation Index Expanded (SCIE)--Engineering, Electrical & Electronic; 2.Current Contents Electronics & Telecommunications Collection--Electronics & Electrical Engineering; 3.Current Contents Engineering, Computing & Technology--Electrical & Electronics Engineering; 4.Essential Science Indicators--Engineering;
出版語言English
The information of publication is updating

SCIE(SCI)期刊JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS(20 21 REV HIST)影響因子


SCIE(SCI)期刊JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS(J ELECTRON TEST)影響因子@(工程，電氣和電子)學(xué)科排名


SCIE(SCI)期刊JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS(20 21 REV HIST)總引論文


SCIE(SCI)期刊JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS(J ELECTRON TEST)總引論文@(工程，電氣和電子)學(xué)科排名


SCIE(SCI)期刊JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS(20 21 REV HIST)影響因子


SCIE(SCI)期刊JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS(J ELECTRON TEST)總引頻次@(工程，電氣和電子)學(xué)科排名


SCIE(SCI)期刊JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS(20 21 REV HIST)即時影響因子


SCIE(SCI)期刊JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS(J ELECTRON TEST)即時影響因子@(工程，電氣和電子)學(xué)科排名


SCIE(SCI)期刊JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS(20 21 REV HIST)五年累積影響因子


SCIE(SCI)期刊JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS(J ELECTRON TEST)五年累積影響因子@(工程，電氣和電子)學(xué)科排名


單選投票, 共有 0 人參與投票
 

0票 0%

Perfect with Aesthetics
 

0票 0%

Better Implies Difficulty
 

0票 0%

Good and Satisfactory
 

0票 0%

Adverse Performance
 

0票 0%

Disdainful Garbage
您所在的用戶組沒有投票權(quán)限
沙發(fā)
發(fā)表于 2025-3-21 22:28:10 | 只看該作者
Submitted on: 22 June 2002. Revised on: 02 October 2002. Accepted on: 10 November 2002. ___________________JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS
板凳
發(fā)表于 2025-3-22 03:42:38 | 只看該作者
地板
發(fā)表于 2025-3-22 08:31:31 | 只看該作者
5#
發(fā)表于 2025-3-22 12:03:45 | 只看該作者
Submitted on: 10 November 2004. Revised on: 31 January 2005. Accepted on: 07 March 2005. ___________________JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS
6#
發(fā)表于 2025-3-22 14:27:13 | 只看該作者
7#
發(fā)表于 2025-3-22 20:06:53 | 只看該作者
Submitted on: 26 February 2003. Revised on: 21 June 2003. Accepted on: 15 August 2003. ___________________JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS
8#
發(fā)表于 2025-3-22 23:36:14 | 只看該作者
9#
發(fā)表于 2025-3-23 03:12:04 | 只看該作者
10#
發(fā)表于 2025-3-23 08:48:41 | 只看該作者
Submitted on: 26 November 2010. Revised on: 01 February 2011. Accepted on: 02 March 2011. ___________________JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS
 關(guān)于派博傳思  派博傳思旗下網(wǎng)站  友情鏈接
派博傳思介紹 公司地理位置 論文服務(wù)流程 影響因子官網(wǎng) 吾愛論文網(wǎng) 大講堂 北京大學(xué) Oxford Uni. Harvard Uni.
發(fā)展歷史沿革 期刊點(diǎn)評 投稿經(jīng)驗總結(jié) SCIENCEGARD IMPACTFACTOR 派博系數(shù) 清華大學(xué) Yale Uni. Stanford Uni.
QQ|Archiver|手機(jī)版|小黑屋| 派博傳思國際 ( 京公網(wǎng)安備110108008328) GMT+8, 2025-10-5 01:57
Copyright © 2001-2015 派博傳思   京公網(wǎng)安備110108008328 版權(quán)所有 All rights reserved
快速回復(fù) 返回頂部 返回列表
灯塔市| 澄江县| 华安县| 富民县| 宁南县| 二连浩特市| 方正县| 务川| 红桥区| 汽车| 邹平县| 绥中县| 石景山区| 平罗县| 屯昌县| 武宁县| 河曲县| 黔江区| 奉新县| 温泉县| 竹山县| 娱乐| 乌拉特后旗| 墨脱县| 南平市| 皮山县| 普格县| 尼勒克县| 安阳县| 阿拉善左旗| 安徽省| 芮城县| 泗阳县| 汉寿县| 高台县| 渑池县| 勐海县| 抚远县| 海南省| 汉中市| 车致|