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SCIE期刊JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS 2024/2025影響因子:1.142 (J ELECTRON TEST) (0923-8174). (ENGINEE

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發(fā)表于 2025-3-21 19:42:53 | 只看該作者 |倒序瀏覽 |閱讀模式
期刊全稱JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS
期刊簡稱J ELECTRON TEST
影響因子20241.142
視頻videohttp://file.papertrans.cn/17/16520/16520.mp4
ISSN0923-8174
eISSN1573-0727
出版商SPRINGER
發(fā)行地址ONE NEW YORK PLAZA, SUITE 4600 , NEW YORK, United States, NY, 10004
學(xué)科分類1.Science Citation Index Expanded (SCIE)--Engineering, Electrical & Electronic; 2.Current Contents Electronics & Telecommunications Collection--Electronics & Electrical Engineering; 3.Current Contents Engineering, Computing & Technology--Electrical & Electronics Engineering; 4.Essential Science Indicators--Engineering;
出版語言English
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SCIE(SCI)期刊JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS(20 21 REV HIST)影響因子


SCIE(SCI)期刊JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS(J ELECTRON TEST)影響因子@(工程，電氣和電子)學(xué)科排名


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SCIE(SCI)期刊JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS(20 21 REV HIST)影響因子


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SCIE(SCI)期刊JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS(J ELECTRON TEST)即時影響因子@(工程，電氣和電子)學(xué)科排名


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發(fā)表于 2025-3-21 22:28:10 | 只看該作者
Submitted on: 22 June 2002. Revised on: 02 October 2002. Accepted on: 10 November 2002. ___________________JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS
板凳
發(fā)表于 2025-3-22 03:42:38 | 只看該作者
地板
發(fā)表于 2025-3-22 08:31:31 | 只看該作者
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發(fā)表于 2025-3-22 12:03:45 | 只看該作者
Submitted on: 10 November 2004. Revised on: 31 January 2005. Accepted on: 07 March 2005. ___________________JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS
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發(fā)表于 2025-3-22 14:27:13 | 只看該作者
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發(fā)表于 2025-3-22 20:06:53 | 只看該作者
Submitted on: 26 February 2003. Revised on: 21 June 2003. Accepted on: 15 August 2003. ___________________JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS
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發(fā)表于 2025-3-22 23:36:14 | 只看該作者
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發(fā)表于 2025-3-23 03:12:04 | 只看該作者
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發(fā)表于 2025-3-23 08:48:41 | 只看該作者
Submitted on: 26 November 2010. Revised on: 01 February 2011. Accepted on: 02 March 2011. ___________________JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS
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