| 期刊全稱(chēng) | Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching | | 期刊簡(jiǎn)稱(chēng) | Application to Rough | | 影響因子2023 | Gerd Kaupp | | 視頻video | http://file.papertrans.cn/165/164732/164732.mp4 | | 發(fā)行地址 | Presents the full range of application of nano-optic methods to studies in physics, chemistry, materials science, biology and medicine | | 學(xué)科分類(lèi) | NanoScience and Technology | | 圖書(shū)封面 |  | | 影響因子 | .Making a clear distinction is made between nano- and micro-mechanical testing for physical reasons, this monograph describes the basics and applications of the supermicroscopies AFM and SNOM, and of the nanomechanical testing on rough and technical natural surfaces in the submicron range down to a lateral resolution of a few nm. New or improved instrumentation, new physical laws and unforeseen new applications in all branches of natural sciences (around physics, chemistry, mineralogy, materials science, biology and medicine) and nanotechnology are covered as well as the sources for pitfalls and errors. It outlines the handling of natural and technical samples in relation to those of flat standard samples and emphasizes new special features. Pitfalls and sources of errors are clearly demonstrated as well as their efficient remedy when going from molecularly flat to rough surfaces. The academic or industrial scientist learns how to apply the principles for tackling their scientific or manufacturing tasks that include roughness far away from standard samples. . | | Pindex | Book 2006 |
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書(shū)目名稱(chēng)Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching影響因子(影響力)
書(shū)目名稱(chēng)Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching影響因子(影響力)學(xué)科排名
書(shū)目名稱(chēng)Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching網(wǎng)絡(luò)公開(kāi)度
書(shū)目名稱(chēng)Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching網(wǎng)絡(luò)公開(kāi)度學(xué)科排名
書(shū)目名稱(chēng)Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching被引頻次
書(shū)目名稱(chēng)Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching被引頻次學(xué)科排名
書(shū)目名稱(chēng)Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching年度引用
書(shū)目名稱(chēng)Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching年度引用學(xué)科排名
書(shū)目名稱(chēng)Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching讀者反饋
書(shū)目名稱(chēng)Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching讀者反饋學(xué)科排名
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