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Titlebook: Atom Probe Microscopy; Baptiste Gault,Michael P. Moody,Simon P. Ringer Book 2012 Springer Science+Business Media, LLC 2012 Atom probe data

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發(fā)表于 2025-3-21 16:58:11 | 只看該作者 |倒序?yàn)g覽 |閱讀模式
期刊全稱Atom Probe Microscopy
影響因子2023Baptiste Gault,Michael P. Moody,Simon P. Ringer
視頻videohttp://file.papertrans.cn/165/164682/164682.mp4
發(fā)行地址Provides the most practical, up-to-date and critical review of atom probe microscopy techniques.Presents a detailed description of the analysis tools.Includes practical examples of how the technique c
學(xué)科分類Springer Series in Materials Science
圖書封面Titlebook: Atom Probe Microscopy;  Baptiste Gault,Michael P. Moody,Simon P. Ringer Book 2012 Springer Science+Business Media, LLC 2012 Atom probe data
影響因子.Atom probe microscopy enables the characterization of materials structure and chemistry in three dimensions with near-atomic resolution. This uniquely powerful technique has been subject to major instrumental advances over the last decade with the development of wide-field-of-view detectors and pulsed-laser-assisted evaporation that have significantly enhanced the instrument’s capabilities. The field is flourishing, and atom probe microscopy is being embraced as a mainstream characterization technique. This book covers all facets of atom probe microscopy—including field ion microscopy, field desorption microscopy and a strong emphasis on atom probe tomography..Atom Probe Microscopy. is aimed at researchers of all experience levels. It will provide the beginner with the theoretical background and practical information necessary to investigate how materials work using atom probe microscopy techniques. This includes detailed explanations of the fundamentals and the instrumentation, contemporary specimen preparation techniques, experimental details, and an overview of the results that can be obtained. The book emphasizes processes for assessing data quality, and the proper implementat
Pindex Book 2012
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Robin Doss,Selwyn Piramuthu,Wei Zhoueedle-shaped specimen. Field evaporation involves the ionisation of these surface atoms, whereupon they are subjected to an electric field force that causes them to accelerate towards a detector under a particular projection. The evaporation event follows immediately after the ionisation of the surf
地板
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Robin Doss,Selwyn Piramuthu,Wei Zhou and often extremely challenging, part of any experiment. Recent developments in instrumentation for atom probe microscopy, such as laser-pulsing and the use of wide-field-of-view detectors, have overcome many of the limitations on the types of materials and microstructures that may be studied. Now,
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https://doi.org/10.1007/978-3-319-65548-2r (eFIM) reveals details of the surface topography. Despite seemingly being static, each spot within a field ion micrograph, such as those presented in Fig. 5.1, constitutes a steady flow of gas ions, roughly 10. per second. There are a variety of experimental parameters that influence the quality o
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Biplob R. Ray,Morshed Chowdhury,Usman Atifre, which is the most usual termination of an experiment. The influence of the main experimental parameters—base temperature, detection rate, pulsing mode, etc.—is discussed with the aim of helping the atom probe user to understand the mechanisms underpinning how these parameters could change the da
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Future Network Systems and Securityerful. APT offers an unprecedented ability to map the positions of individual atoms in three dimensions to reveal the structural arrangement of the atoms inside a material is unprecedented. This chapter begins with an introduction of the main principles of the ion projection. We then present the pro
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Malware Biodiversity Using Static Analysis,cale microstructure with rigorous quantitative data analysis. Data-mining algorithms can be applied to identify regions of interest, ranging from isolating a single atom to highlighting discrete phases. In modern instruments, tens of millions and often hundreds of millions of ions are routinely acqu
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Quantum Computing and Its Impact,ials technology and engineering. Atom probe microscopy enables the characterisation of many important microstructural features that occur across various length scales in materials. This microscopy can enable new insights into the scientific and engineering aspects of how materials actually work. APM
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