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Titlebook: Applied Scanning Probe Methods XI; Scanning Probe Micro Bharat Bhushan,Harald Fuchs Book 2009 Springer-Verlag Berlin Heidelberg 2009 AFM.RE

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樓主: supplementary
21#
發(fā)表于 2025-3-25 07:01:49 | 只看該作者
Hartmut Vogtmann,Nikolai Dobretsovergy scales of the system studied. The standard approach to data analysis is based on the single-step rate equation, from which the logarithmic relation between the pulling velocity and the most probable force of bond rupture/interstitial jump follows. An alternative method of analyzing the experime
22#
發(fā)表于 2025-3-25 10:31:32 | 只看該作者
Atomic Force Microscope Cantilevers Used as Sensors for Monitoring Microdrop Evaporation,ic surface, and how this difference becomes more pronounced towards the end of evaporation. We further show that one-side metal-coated cantilevers, acting as bimetals, allow measuring the average temperature of an evaporating microdrop. Finally, we will discuss two further applications of microdrops
23#
發(fā)表于 2025-3-25 12:16:12 | 只看該作者
24#
發(fā)表于 2025-3-25 17:47:51 | 只看該作者
25#
發(fā)表于 2025-3-25 22:38:29 | 只看該作者
26#
發(fā)表于 2025-3-26 02:38:20 | 只看該作者
27#
發(fā)表于 2025-3-26 06:13:31 | 只看該作者
Thermal Activation Effects in Dynamic Force Spectroscopy and Atomic Friction,ergy scales of the system studied. The standard approach to data analysis is based on the single-step rate equation, from which the logarithmic relation between the pulling velocity and the most probable force of bond rupture/interstitial jump follows. An alternative method of analyzing the experime
28#
發(fā)表于 2025-3-26 12:30:38 | 只看該作者
Oscillation Control in Dynamic SPM with Quartz Sensors,
29#
發(fā)表于 2025-3-26 16:23:44 | 只看該作者
Atomic Force Microscope Cantilevers Used as Sensors for Monitoring Microdrop Evaporation,onic microbalances or with quartz crystal microbalances have been employed in the past decades. Similar techniques are, however, hardly applicable to microscopic drops. Moreover, they do not provide a measure of the interfacial stresses arising at the contact area between liquid and solid. Here we d
30#
發(fā)表于 2025-3-26 20:48:58 | 只看該作者
Mechanical Diode-Based Ultrasonic Atomic Force Microscopies,the study of material elastic properties is explained in detail. Advantages of the application of UFM in nanofabrication are discussed. Mechanical-Diode Ultrasonic Friction Force Microscopy (MD-UFFM) is introduced, and compared with Lateral Acoustic Force Microscopy (LAFM) and Torsional Resonance (T
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