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Titlebook: Applied Scanning Probe Methods VIII; Scanning Probe Micro Bharat Bhushan,Harald Fuchs,Masahiko Tomitori Book 2008 Springer-Verlag Berlin He

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發(fā)表于 2025-3-21 16:57:33 | 只看該作者 |倒序?yàn)g覽 |閱讀模式
期刊全稱(chēng)Applied Scanning Probe Methods VIII
期刊簡(jiǎn)稱(chēng)Scanning Probe Micro
影響因子2023Bharat Bhushan,Harald Fuchs,Masahiko Tomitori
視頻videohttp://file.papertrans.cn/161/160123/160123.mp4
發(fā)行地址First book summarizing the state-of-the-art of this technique.Real industrial applications included.Includes supplementary material:
學(xué)科分類(lèi)NanoScience and Technology
圖書(shū)封面Titlebook: Applied Scanning Probe Methods VIII; Scanning Probe Micro Bharat Bhushan,Harald Fuchs,Masahiko Tomitori Book 2008 Springer-Verlag Berlin He
影響因子The success of the Springer Series Applied Scanning Probe Methods I–VII and the rapidly expanding activities in scanning probe development and applications worldwide made it a natural step to collect further speci c results in the elds of development of scanning probe microscopy techniques (Vol. VIII), characterization (Vol. IX), and biomimetics and industrial applications (Vol. X). These three volumes complement the previous set of volumes under the subject topics and give insight into the recent work of leading specialists in their respective elds. Following the tradition of the series, the chapters are arranged around techniques, characterization and biomimetics and industrial applications. Volume VIII focuses on novel scanning probe techniques and the understanding of tip/sample interactions. Topics include near eld imaging, advanced AFM, s- cializedscanningprobemethodsinlifesciencesincludingnewselfsensingcantilever systems, combinations of AFM sensors and scanning electron and ion microscopes, calibration methods, frequency modulation AFM for application in liquids, Kelvin probe force microscopy, scanning capacitance microscopy, and the measurement of electrical transport prop
Pindex Book 2008
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Critical Dimension Atomic Force Microscopy for Sub-50-nm Microelectronics Technology Nodes,ral dimensions of 50 nm and less. Challenges in this measurement range call for research and development in probe design, tip–sample interaction control, tip shape characterization, and image reconstruction algorithms. Design considerations and performance improvements are reviewed throughout the ch
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Near Field Probes: From Optical Fibers to Optical Nanoantennas,ptical microscope (SNOM). In this frame, we consider the two main classes of sensors: aperture and apertureless probes. In particular, attention is focused on optical fiber probes and on nanoantenna probes. Recent developments in the improvement of optical throughput and in the control of the near f
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Scanning Probes for the Life Sciences,nd analyze the patterns using an atomic force microscope. Such devices are able to make much smaller biomolecule patterns, on the order of nanometers, than conventional techniques such as microcontact printing and optical lithography. A reduction in patterned feature size allows for greater sensitiv
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Self-Sensing Cantilever Sensor for Bioscience,he techniques is the use of a microcantilever mass sensor using a harmonic vibration with a resonance frequency. In this chapter, we describe a harmonic vibration-type self-sensing cantilever sensor in bioscience applications. Firstly, we introduce the cantilever mass sensor and its vibrations using
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Frequency Modulation Atomic Force Microscopy in Liquids,cantilever to detect variations in the interaction force between the cantilever tip and the sample of interest. Although it has been used extensively in ultrahigh vacuum, it is rarely used in liquids. Here we explore the application of the technique in the liquid environment, covering various experi
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