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Titlebook: Applied Scanning Probe Methods VII; Biomimetics and Indu Bharat Bhushan,Harald Fuchs Book 2007 Springer-Verlag Berlin Heidelberg 2007 AFM.B

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發(fā)表于 2025-3-21 18:05:17 | 只看該作者 |倒序?yàn)g覽 |閱讀模式
期刊全稱Applied Scanning Probe Methods VII
期刊簡稱Biomimetics and Indu
影響因子2023Bharat Bhushan,Harald Fuchs
視頻videohttp://file.papertrans.cn/161/160122/160122.mp4
發(fā)行地址First book summarizing the state-of-the-art of this technique.Real industrial applications included.Includes supplementary material:
學(xué)科分類NanoScience and Technology
圖書封面Titlebook: Applied Scanning Probe Methods VII; Biomimetics and Indu Bharat Bhushan,Harald Fuchs Book 2007 Springer-Verlag Berlin Heidelberg 2007 AFM.B
影響因子The scanning probe microscopy ?eld has been rapidly expanding. It is a demanding task to collect a timely overview of this ?eld with an emphasis on technical dev- opments and industrial applications. It became evident while editing Vols. I–IV that a large number of technical and applicational aspects are present and rapidly - veloping worldwide. Considering the success of Vols. I–IV and the fact that further colleagues from leading laboratories were ready to contribute their latest achie- ments, we decided to expand the series with articles touching ?elds not covered in the previous volumes. The response and support of our colleagues were excellent, making it possible to edit another three volumes of the series. In contrast to to- cal conference proceedings, the applied scanning probe methods intend to give an overview of recent developments as a compendium for both practical applications and recent basic research results, and novel technical developments with respect to instrumentation and probes. The present volumes cover three main areas: novel probes and techniques (Vol. V), charactarization (Vol. VI), and biomimetics and industrial applications (Vol. VII). Volume V includes an
Pindex Book 2007
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https://doi.org/10.1007/11785705AFM; Biosensor; Material Science; Microscopy; Nanoscience; Physical Chemistry; Polymer; STEM; Surface Scienc
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978-3-642-07213-0Springer-Verlag Berlin Heidelberg 2007
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Book 2007chnical dev- opments and industrial applications. It became evident while editing Vols. I–IV that a large number of technical and applicational aspects are present and rapidly - veloping worldwide. Considering the success of Vols. I–IV and the fact that further colleagues from leading laboratories w
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1434-4904 nning probe microscopy ?eld has been rapidly expanding. It is a demanding task to collect a timely overview of this ?eld with an emphasis on technical dev- opments and industrial applications. It became evident while editing Vols. I–IV that a large number of technical and applicational aspects are p
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Development of MOEMS Devices and Their Reliability Issues,scussed. Some of the failure mechanisms of the MOEMS were also discussed. It is believed that MOEMS failure mechanisms studies and the development of novel stiction, friction, wear, and residual stress reduction techniques will become critical for commercialization of MOEMS.
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