| 期刊全稱 | Applied Scanning Probe Methods III | | 期刊簡稱 | Characterization | | 影響因子2023 | Bharat Bhushan,Harald Fuchs | | 視頻video | http://file.papertrans.cn/161/160117/160117.mp4 | | 發(fā)行地址 | First book summarizing the state of the art of this technique.Real industrial applications included.Includes supplementary material: | | 學科分類 | NanoScience and Technology | | 圖書封面 |  | | 影響因子 | The Nobel Prize of 1986 on Sc- ning Tunneling Microscopy sig- led a new era in imaging. The sc- ning probes emerged as a new i- trument for imaging with a pre- sion suf?cient to delineate single atoms. At ?rst there were two – the Scanning Tunneling Microscope, or STM, and the Atomic Force Mic- scope, or AFM. The STM relies on electrons tunneling between tip and sample whereas the AFM depends on the force acting on the tip when it was placed near the sample. These were quickly followed by the - gneticForceMicroscope,MFM,and the Electrostatic Force Microscope, EFM. The MFM will image a single magnetic bit with features as small as 10nm. With the EFM one can monitor the charge of a single electron. Prof. Paul Hansma at Santa Barbara opened the door even wider when he was able to image biological objects in aqueous environments. At this point the sluice gates were opened and a multitude of different instruments appeared. There are signi?cant differences between the Scanning Probe Microscopes or SPM, and others such as the Scanning Electron Microscope or SEM. The probe microscopes do not require preparation of the sample and they operate in ambient atmosphere, whereas, the SEM must ope | | Pindex | Book 2006 |
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