Titlebook: Analysis and Design of Resilient VLSI Circuits; Mitigating Soft Erro Rajesh Garg,Sunil P. Khatri Book 2010 Springer-Verlag US 2010 Crosstal

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978-1-4899-8510-1Springer-Verlag US 2010

circuit

Rajesh Garg,Sunil P. KhatriDescribes the state of the art in the areas of radiation tolerance circuit design and process variation tolerant circuit design.Presents analytical approaches to test efficiently the severity of elect

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lytical approaches to test efficiently the severity of electThis monograph is motivated by the challenges faced in designing reliable VLSI systems in modern VLSI processes. The reliable operation of integrated circuits (ICs) has become increasingly dif?cult to achieve in the deep submicron (DSM) era

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Radiation

Book 2010 it is important to ef?ciently design robust VLSI circuits that are resilient to radiation particle strikes and process variations. The work presented in this research mo- graph presents several analysis and design techniques with the goal of realizing VLSI circuits, which are radiation and process

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Analytical Determination of the Radiation-induced Pulse Shape

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