| 期刊全稱(chēng) | Analog and Mixed-Signal Boundary-Scan | | 期刊簡(jiǎn)稱(chēng) | A Guide to the IEEE | | 影響因子2023 | Adam Osseiran | | 視頻video | http://file.papertrans.cn/156/155870/155870.mp4 | | 學(xué)科分類(lèi) | Frontiers in Electronic Testing | | 圖書(shū)封面 |  | | 影響因子 | This book contains more than the IEEE Standard 1149.4. It also contains the thoughts of those who developed the standard. Adam Osseiran has edited the original writings of Brian Wilkins, Colin Maunder, Rod Tulloss, Steve Sunter, Mani Soma, Keith Lofstrom and John McDermid, all of whom have personally contributed to this standard. To preserve the original spirit, only minor changes were made, and the reader will sense a chapter-to-chapter variation in the style of expression. This may appear awkward to some, although I found the Iack of monotonicity refreshing. A system consists of a specific organization of parts. The function of the system cannot be performed by an individual part or even a disorganized collection ofthe same parts. Testing has a system-like characteristic. Testing of a system does not follow directly from the testing of its parts, and a system built with testable parts can sometimes be impossible to test. Therefore, testability of the system must be organized. Some years ago, the IEEE published the boundary-scan Standard 1149.1. That Standard provided an architecture for digital VLSI chips. The chips designed with the 1149.1 architecture can be integrated into a t | | Pindex | Book 1999 |
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