Titlebook: Analog Circuit Design; Low-Noise, Low-Power Johan H. Huijsing,Rudy J. Plassche,Willy M. C. San Book 1996 Springer Science+Business Media Do

Preamble

Computer-Aided testability analysis for analog circuits for an objective quantification of the test effectiveness. This paper describes how the technique of Inductive Fault Analysis can be used to quantify the test effectiveness on basis of realistic data on manufacturing defects. Experiences with the tool suite developed to support this analysis show t

金絲雀

Concepts for bandgap References and voltage measurement systemsics of bipolar transistors, and methods to compensate for this temperature dependence for application in accurate bandgap References. Methods and technologies to calibrate bandgap References are discussed. As case studies, two types of bandgap References are discussed. One of them is implemented in

使迷惑

Monolithic Voltage and Current References: Theme and Variations are of moderate to high accuracy, and generally intended for operation in a low-voltage commercial context, which typically means a minimum supply of 2.7V and a minimum temperature of-30°C. In some cases, the supply may be as low as 1.2V and operation may be required at temperatures of-55°C, though

EXPEL

Integrated Current and Time Referenceswithout the need for external components, clocking, or trimming. Low temperature-drift current sources can also be realized with this method, which uses MOS threshold and mobility temperature-coefficient cancellation.

歡樂中國(guó)

regale

Johan H. Huijsing,Rudy J. Plassche,Willy M. C. San

finale

Enthralling

Ablation

BOOM

978-1-4419-5157-1Springer Science+Business Media Dordrecht 1996