Titlebook: Algorithms for VLSI Physical Design Automation; Naveed Sherwani Book 1995Latest edition Springer Science+Business Media New York 1995 Fiel

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Physical Design Automation of MCMs,th the MCM designs. Let us just consider the problem of routing in MCM. The signal effects of long lines in terms of crosstalk, noise, and reflections must be taken into account during routing. In addition, as high speeds are explored, the transmission line behavior of the interconnect must be model

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Urs Büttner,Corinna Norrick-Rühlhe fab for fabrication. Symbolic database captures net and transistor attributes. It allows a designer to rapidly navigate throughout the database and make quick edits while working at a higher level. The symbolic database is converted into a polygon database prior to tapeout. In the polygon databas

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Urs Büttner,Corinna Norrick-Rühlermine the overall yield of the fabrication process. The key factor which describes the fab in terms of technology is minimum feature size it is capable of manufacturing. For example, a fab which runs a 0.35 micron fabrication process is simply referred to as a 0.35 micron fab.

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https://doi.org/10.1007/978-3-658-41633-1ces has led to a significant increase in number of interconnections. Interconnect delays, which were considered to be insignificant earlier, have now become comparable, if not more prominent than the gate delays.

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