| 期刊全稱 | Advanced Techniques for Embedded Systems Design and Test | | 影響因子2023 | Juan Carlos López,Román Hermida,Walter Geisselhard | | 視頻video | http://file.papertrans.cn/147/146272/146272.mp4 | | 圖書(shū)封面 |  | | 影響因子 | As electronic technology reaches the point where complexsystems can be integrated on a single chip, and higher degrees ofperformance can be achieved at lower costs, designers must devise newways to undertake the laborious task of coping with the numerous, andnon-trivial, problems that arise during the conception of suchsystems. On the other hand, shorter design cycles (so that electronicproducts can fit into shrinking market windows) put companies, andconsequently designers, under pressure in a race to obtain reliableproducts in the minimum period of time. New methodologies, supportedby automation and abstraction, have appeared which have been crucialin making it possible for system designers to take over thetraditional electronic design process and embedded systems is one ofthe fields that these methodologies are mainly targeting. The inherentcomplexity of these systems, with hardware and software componentsthat usually execute concurrently, and the very tight cost andperformance constraints, make them specially suitable to introducehigher levels of abstraction and automation, so as to allow thedesigner to better tackle the many problems that appear during theirdesign. ..Advanced | | Pindex | Book 1998 |
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