| 期刊全稱(chēng) | Advanced Scanning Electron Microscopy and X-Ray Microanalysis | | 影響因子2023 | Dale E. Newbury,David C. Joy,Joseph I. Goldstein | | 視頻video | http://file.papertrans.cn/147/146197/146197.mp4 | | 圖書(shū)封面 |  | | 影響因子 | This book has its origins in the intensive short courses on scanning elec- tron microscopy and x-ray microanalysis which have been taught annually at Lehigh University since 1972. In order to provide a textbook containing the materials presented in the original course, the lecturers collaborated to write the book Practical Scanning Electron Microscopy (PSEM), which was published by Plenum Press in 1975. The course con- tinued to evolve and expand in the ensuing years, until the volume of material to be covered necessitated the development of separate intro- ductory and advanced courses. In 1981 the lecturers undertook the project of rewriting the original textbook, producing the volume Scan- ning Electron Microscopy and X-Ray Microanalysis (SEMXM). This vol- ume contained substantial expansions of the treatment of such basic material as electron optics, image formation, energy-dispersive x-ray spectrometry, and qualitative and quantitative analysis. At the same time, a number of chapters, which had been included in the PSEM vol- ume, including those on magnetic contrast and electron channeling con- trast, had to be dropped for reasons of space. Moreover, these topics had naturally | | Pindex | Book 1986 |
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