SCIE期刊IEEE TRANSACTIONS ON RELIABILITY 2024/2025影響因子:5.105 (IEEE T RELIAB) (0018-9529). (COMPUTER SCIENCE, HARDWARE & A

只看該作者 · 發(fā)表于 2025-3-21 16:21:58

SCIE(SCI)期刊IEEE TRANSACTIONS ON RELIABILITY(20 21 REV HIST)影響因子

SCIE(SCI)期刊IEEE TRANSACTIONS ON RELIABILITY(IEEE T RELIAB)影響因子@(計(jì)算機(jī)科學(xué)，硬件與架構(gòu))學(xué)科排名

SCIE(SCI)期刊IEEE TRANSACTIONS ON RELIABILITY(20 21 REV HIST)總引論文

SCIE(SCI)期刊IEEE TRANSACTIONS ON RELIABILITY(IEEE T RELIAB)總引論文@(計(jì)算機(jī)科學(xué)，硬件與架構(gòu))學(xué)科排名

SCIE(SCI)期刊IEEE TRANSACTIONS ON RELIABILITY(20 21 REV HIST)影響因子

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SCIE(SCI)期刊IEEE TRANSACTIONS ON RELIABILITY(20 21 REV HIST)即時(shí)影響因子

SCIE(SCI)期刊IEEE TRANSACTIONS ON RELIABILITY(IEEE T RELIAB)即時(shí)影響因子@(計(jì)算機(jī)科學(xué)，硬件與架構(gòu))學(xué)科排名

SCIE(SCI)期刊IEEE TRANSACTIONS ON RELIABILITY(20 21 REV HIST)五年累積影響因子

SCIE(SCI)期刊IEEE TRANSACTIONS ON RELIABILITY(IEEE T RELIAB)五年累積影響因子@(計(jì)算機(jī)科學(xué)，硬件與架構(gòu))學(xué)科排名

只看該作者 · 發(fā)表于 2025-3-21 23:13:31

Submitted on: 09 June 2023. Revised on: 24 July 2023. Accepted on: 17 September 2023. ___________________IEEE TRANSACTIONS ON RELIABILITY

只看該作者 · 發(fā)表于 2025-3-22 00:29:38

Submitted on: 06 May 2017. Revised on: 15 June 2017. Accepted on: 06 July 2017. ___________________IEEE TRANSACTIONS ON RELIABILITY

只看該作者 · 發(fā)表于 2025-3-22 07:49:59

只看該作者 · 發(fā)表于 2025-3-22 09:16:13

Submitted on: 07 December 2016. Revised on: 19 February 2017. Accepted on: 20 March 2017. ___________________IEEE TRANSACTIONS ON RELIABILITY

只看該作者 · 發(fā)表于 2025-3-22 15:57:06

Submitted on: 23 November 2005. Revised on: 26 January 2006. Accepted on: 26 February 2006. ___________________IEEE TRANSACTIONS ON RELIABILITY

只看該作者 · 發(fā)表于 2025-3-22 20:43:30

只看該作者 · 發(fā)表于 2025-3-22 21:41:06

只看該作者 · 發(fā)表于 2025-3-23 02:09:27

Submitted on: 31 October 2005. Revised on: 28 November 2005. Accepted on: 09 January 2006. ___________________IEEE TRANSACTIONS ON RELIABILITY

只看該作者 · 發(fā)表于 2025-3-23 09:08:13

Submitted on: 13 June 2004. Revised on: 18 August 2004. Accepted on: 26 September 2004. ___________________IEEE TRANSACTIONS ON RELIABILITY

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