SCIE期刊IEEE ELECTRON DEVICE LETTERS 2024/2025影響因子:4.105 (IEEE ELECTR DEVICE L) (0741-3106). (ENGINEERING, ELECTRICAL & E

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SCIE(SCI)期刊IEEE ELECTRON DEVICE LETTERS(20 21 REV HIST)影響因子


SCIE(SCI)期刊IEEE ELECTRON DEVICE LETTERS(IEEE ELECTR DEVICE L)影響因子@(工程，電氣和電子)學(xué)科排名


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SCIE(SCI)期刊IEEE ELECTRON DEVICE LETTERS(IEEE ELECTR DEVICE L)總引論文@(工程，電氣和電子)學(xué)科排名


SCIE(SCI)期刊IEEE ELECTRON DEVICE LETTERS(20 21 REV HIST)影響因子


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SCIE(SCI)期刊IEEE ELECTRON DEVICE LETTERS(IEEE ELECTR DEVICE L)即時影響因子@(工程，電氣和電子)學(xué)科排名


SCIE(SCI)期刊IEEE ELECTRON DEVICE LETTERS(20 21 REV HIST)五年累積影響因子


SCIE(SCI)期刊IEEE ELECTRON DEVICE LETTERS(IEEE ELECTR DEVICE L)五年累積影響因子@(工程，電氣和電子)學(xué)科排名

繁榮地區(qū)

Judicious

表被動

Submitted on: 14 September 2007. Revised on: 10 November 2007. Accepted on: 16 December 2007. ___________________IEEE ELECTRON DEVICE LETTERS---IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

CRATE

harmony

Submitted on: 21 June 2003. Revised on: 12 August 2003. Accepted on: 31 August 2003. ___________________IEEE ELECTRON DEVICE LETTERS---IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

calamity

代理人

Submitted on: 24 October 2006. Revised on: 18 February 2007. Accepted on: 04 April 2007. ___________________IEEE ELECTRON DEVICE LETTERS---IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

reflection

Encumber