Titlebook: Zwei Nullen sind keine Acht; Falsche Zahlen in de Guardian Ketteler Book 1997 Springer Basel AG 1997 Statistik.Wirtschaft.grundlegende Math

Intermediary

書目名稱Zwei Nullen sind keine Acht影響因子(影響力)




書目名稱Zwei Nullen sind keine Acht影響因子(影響力)學(xué)科排名




書目名稱Zwei Nullen sind keine Acht網(wǎng)絡(luò)公開度




書目名稱Zwei Nullen sind keine Acht網(wǎng)絡(luò)公開度學(xué)科排名




書目名稱Zwei Nullen sind keine Acht被引頻次




書目名稱Zwei Nullen sind keine Acht被引頻次學(xué)科排名




書目名稱Zwei Nullen sind keine Acht年度引用




書目名稱Zwei Nullen sind keine Acht年度引用學(xué)科排名




書目名稱Zwei Nullen sind keine Acht讀者反饋




書目名稱Zwei Nullen sind keine Acht讀者反饋學(xué)科排名

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https://doi.org/10.1007/978-3-0348-6109-0Statistik; Wirtschaft; grundlegende Mathematik; Mathematik; Presse

COST

978-3-7643-5471-8Springer Basel AG 1997

Conserve

Overview: 978-3-7643-5471-8978-3-0348-6109-0

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Ginzan Onsen Hot Spring Bath House,ng verifiable and validated ones, that are useful in pulmonology, is challenging and constant. A special body specimen that has been characterized as a matrix of biomarkers, is the exhaled breath condensate (EBC). It is a fluid resulting from freezing the exhaled air. Water is its main constituent.

沐浴

Tracy Boggiano,Grant Fritchey for the number of households investing in human capital. Moreover, the willingness to invest in human capital depends on agents’ life expectancy which determines the length of the amortization period of human capital investments. Life expectancy is positively affected by public health care expendit

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谷物

Alexander Tikhomirov studies on ebXML and RosettaNet. While researchers will find new explanations for the development of interorganisational standards, managers and executives will benefit from the strategic implications this book discusses..978-3-7908-1653-2978-3-7908-1654-9Series ISSN 1431-1941 Series E-ISSN 2197-716X

緊張過(guò)度

Nanomechanical Properties of Nanostructures and Scale Effectse microscopy and nanoindenters can be used to evaluate the mechanical properties of micro/nanoscale structures. Commonly used materials in MEMS/NEMS are single-crystal silicon and silicon-based materials, e.g., SiO. and polysilicon films deposited by low-pressure chemical vapor deposition. Single-cr