| 書目名稱 | X-Ray Microscopy II | | 副標(biāo)題 | Proceedings of the I | | 編輯 | David Sayre,Janos Kirz,Harvey Rarback | | 視頻video | http://file.papertrans.cn/1061/1060039/1060039.mp4 | | 叢書名稱 | Springer Series in Optical Sciences | | 圖書封面 |  | | 描述 | This volume is based on papers presented at the International Symposium on X-Ray Microscopy held at Brookhaven National Laboratory, Upton NY, August 31-September 4, 1987. Previous recent symposia on the sub- ject were held in New York in 1979, Gottingen in 1983 and Taipei in 1986. Developments in x-ray microscopy continue at a rapid pace, with im- portant advances in all major areas: x-ray sources, optics and components, and microscopes and imaging systems. Taken as a whole, the work pre- sented here emphasizes three major directions: (a) improvements in the capability and image-quality of x-ray microscopy, expressed principally in systems attached to large, high-brightness x-ray sources; (b) greater access to x-ray microscopy, expressed chiefly in systems employing small, often pulsed, x-ray sources; and (c) increased rate of exploration of applications of x-ray microscopy. The number of papers presented at the symposium has roughly dou- bled compared with that of its predecessors. While we are delighted at this growth as a manifestation of vitality and rapid growth of the field, we did have to ask the authors to limit the length of their papers and to submit them in camera-ready | | 出版日期 | Conference proceedings 1988 | | 關(guān)鍵詞 | Absorption; X-ray; coherence; development; diffraction; growth; holography; image processing; laser; microsco | | 版次 | 1 | | doi | https://doi.org/10.1007/978-3-540-39246-0 | | isbn_softcover | 978-3-662-14490-9 | | isbn_ebook | 978-3-540-39246-0Series ISSN 0342-4111 Series E-ISSN 1556-1534 | | issn_series | 0342-4111 | | copyright | Springer-Verlag Berlin Heidelberg 1988 |
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