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標(biāo)題: Titlebook: Verification by Error Modeling; Using Testing Techni Katarzyna Radecka,Zeljko Zilic Book 2003 Springer Science+Business Media Dordrecht 200 [打印本頁(yè)]

作者: Coarctation    時(shí)間: 2025-3-21 17:11
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作者: Ondines-curse    時(shí)間: 2025-3-21 20:57
Boolean Function Representations,h as truth tables and Boolean equations. Then, through Shannon expansions we present decision diagrams, including word-level decision diagrams (WLDDs). We conclude the chapter with spectral methods, which play a fundamental role in our verification method. Among others, we introduce Arithmetic Trans
作者: Popcorn    時(shí)間: 2025-3-22 03:28
,Don’t Cares and Their Calculation,onditions, together with the exact and approximate ways of their identification. The material discussed here bears a particular importance, as the presented methods for recognizing don’t cares will be applied in a key step of identifying redundant design errors.
作者: 萬(wàn)神殿    時(shí)間: 2025-3-22 08:01
Testing,lated areas. This is certainly a case when it comes to synthesis, testing and verification. In chapters to follow, we will show how don’t care calculations are successfully used in creating fault list for simulation-based netlist verification. In this chapter, however, we will introduce basics of te
作者: Iniquitous    時(shí)間: 2025-3-22 11:56

作者: nitric-oxide    時(shí)間: 2025-3-22 16:42
Design Verification by At,mprehensive explicit model of design errors, we propose an implicit fault model, which is based on the Arithmetic Transform (AT) spectral representation of faults. The verification of circuits under the assumption of small errors in spectral domain is then performed by the Universal Test Set (UTS) a
作者: 光滑    時(shí)間: 2025-3-22 17:41
Identifying Redundant Gate and Wire Replacements, everpresent redundant faults. This chapter considers redundant gate and wire replacement faults identification in verification of gate-level designs. Removing redundant faults from a fault list is critical to the quality and speed of verification schemes. We present the exact identification of redu
作者: cloture    時(shí)間: 2025-3-23 00:02
Book 2003mplicated pipelined structures, etc., are now in high demand. For example, Intel Itanium II processor contains more than 200 million transistors, including a 3 MB third level cache. A billion transistor IC was said to be “imminently doable” by Intel fellow J. Crawford at Microprocessor Forum in Octo
作者: 傲慢人    時(shí)間: 2025-3-23 03:21

作者: 混合物    時(shí)間: 2025-3-23 06:03
Identifying Redundant Gate and Wire Replacements,tical to the latter is the novel application of don’t care approximations that identify many redundant faults and quickly point out those that can be detected by methods for stuck-at value faults. A test generation scheme that uses the errorcorrecting properties of AT, discussed in Chapter 6 is incorporated into the overall verification procedure.
作者: 阻塞    時(shí)間: 2025-3-23 13:31
Testing,es), or to Automated Test Pattern Generation, i.e., ATPG (deterministic solulations), as these solutions found an immediate application to netlist verification. Other topics covered include diagnosis and design error detection.
作者: 傳染    時(shí)間: 2025-3-23 17:24
ts biological consequences, and a psychological problem, because of its social/personal consequences. Thus, professionals from many health fields have been involved in efforts to understand the causes of obesity and to work toward more effective ways to treat it or at least minimize its negative con
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作者: 雜役    時(shí)間: 2025-3-24 00:27
to produce differential levels of pain perception and verbal and nonverbal manifestation (Varni, 1983). In marked contrast to the rather extensive clinical research literature on adult chronic pain assessment and management, the systematic investigation of pediatric pain from a cognitive—biobehavio
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作者: 半導(dǎo)體    時(shí)間: 2025-3-25 02:51
978-1-4419-5402-2Springer Science+Business Media Dordrecht 2003
作者: inchoate    時(shí)間: 2025-3-25 06:40
Verification by Error Modeling978-0-306-48739-2Series ISSN 0929-1296
作者: 要求比…更好    時(shí)間: 2025-3-25 07:43

作者: languid    時(shí)間: 2025-3-25 15:03
https://doi.org/10.1007/b105974Hardware; Simulation; circuit design; formal verification; integrated circuit; model; modeling
作者: thrombosis    時(shí)間: 2025-3-25 19:28

作者: 機(jī)制    時(shí)間: 2025-3-25 23:15

作者: 環(huán)形    時(shí)間: 2025-3-26 00:45
Design Verification by At,asibility of the verification approach using this UTS method is presented, together with the relations between the Arithmetic and Walsh-Hadamard spectra. This will provide us with bounds the AT error spectrum, and show that a class of small error circuits has small error spectrum. The proposed appro
作者: bronchodilator    時(shí)間: 2025-3-26 06:08
Book 2003practices, which they follow closely for in-house design processes. In general, however, a typical product cycle includes few milestones. An idea for a new product starts usually from an - depth market analysis of customer needs. Once a window of opportunity is found, product requirements are carefu
作者: 暴發(fā)戶    時(shí)間: 2025-3-26 09:20

作者: EVEN    時(shí)間: 2025-3-26 15:05
pected to reach 5.2 million (Brody & Foley, 1985). There is no doubt that this group of physically frail elderly, has psychological problems that demand our attention, problems that present significant economic, social, and ethical dilemmas for families, caregivers, and professionals involved in the
作者: 虛弱    時(shí)間: 2025-3-26 18:09
c pain assessment and treatment must develop a separate, if not parallel, data base from the adult pain field that is sensitive to the unique characteristics of children. During the past several years, a growing number of investigators have begun generating a substantial data base from which the cli
作者: OVER    時(shí)間: 2025-3-27 00:10
etical advances in clinical neuropsychology stem from intense and insightful observation of brain-damaged individuals by such astute observers as Ward Halstead, A. R. Luria, Hans Teuber, Karl Pribram, Roger Sperry, and others. These superstars of clinical neuropsychology were state-of-the-art resear
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作者: 肥料    時(shí)間: 2025-3-27 16:52

作者: incisive    時(shí)間: 2025-3-27 20:18
0929-1296 idea for a new product starts usually from an - depth market analysis of customer needs. Once a window of opportunity is found, product requirements are carefu978-1-4419-5402-2978-0-306-48739-2Series ISSN 0929-1296
作者: 等級(jí)的上升    時(shí)間: 2025-3-28 01:56

作者: nitric-oxide    時(shí)間: 2025-3-28 03:20
Book 2024r Finanzen ab. In der heutigen Wirtschaft ist ein reibungsloser Ablauf vom Auftrags- bis zum Zahlungseingang entscheidend für den Erfolg eines Unternehmens. Hoher Wettbewerbsdruck, neue Gesch?ftsmodelle, künstliche Intelligenz, Inflation, Preissteigerungen und Energiesparma?nahmen stellen Firmen und




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