作者: foppish 時(shí)間: 2025-3-21 23:49
James Turner,Rodney Conlon August durch ausserordentliche Hitze auszeichnete und bis Mitte Oktober anhielt, worauf pl?tzlich eine sehr starke Abkühlung und Frostwetter eintrat. Zu dem Frostwetter im Frühjahr und der Hitze im Herbst kamen noch die zu geringen Niederschl?ge in jener Zeit, so dass in Folge der Dürre im Herbst d作者: 險(xiǎn)代理人 時(shí)間: 2025-3-22 04:20 作者: 按時(shí)間順序 時(shí)間: 2025-3-22 08:07 作者: ENACT 時(shí)間: 2025-3-22 09:39
Finn Jensen August durch ausserordentliche Hitze auszeichnete und bis Mitte Oktober anhielt, worauf pl?tzlich eine sehr starke Abkühlung und Frostwetter eintrat. Zu dem Frostwetter im Frühjahr und der Hitze im Herbst kamen noch die zu geringen Niederschl?ge in jener Zeit, so dass in Folge der Dürre im Herbst d作者: 制定法律 時(shí)間: 2025-3-22 14:06 作者: 信任 時(shí)間: 2025-3-22 19:51
Book 1990 two panel sessions were held, with audience participation, where the particularly controversial topics of bum-in and reliability modeling and prediction methods were dis- cussed. A brief review of these sessions is presented in this book.作者: 惰性氣體 時(shí)間: 2025-3-22 21:26 作者: 粗鄙的人 時(shí)間: 2025-3-23 04:29 作者: Flu表流動(dòng) 時(shí)間: 2025-3-23 08:34 作者: subacute 時(shí)間: 2025-3-23 11:26 作者: minion 時(shí)間: 2025-3-23 16:19
Considerations on the Degradation of DFB Lasers surge of DFB and FP lasers and of lasing wavelengths of 1.3 μm and 1.55 μm. These results show that DFB lasers could operate at laser output powers of 10 mW even in practical optical transmission systems.作者: 沒(méi)花的是打擾 時(shí)間: 2025-3-23 20:30 作者: 結(jié)束 時(shí)間: 2025-3-24 01:55
Statistical Models for Device Reliability; An Overviewo definitions of a device and compares and discusses several statistical models to be applied. These models encompass single as well as multiple failure mechanism cases. The models are illustrated by examples.作者: 凝視 時(shí)間: 2025-3-24 04:53
InP-Based 4 × 4 Optical Switch Package Qualification and Reliabilityan 0.2 dB for all four single-mode fibers aligned with an OSA chip. To ensure mechanical stability of the tapered fibers aligned with the through-holes, mechanical strength test and temperature agings are performed, with promising results. Fundamental characteristics for a complete module are also presented.作者: 起草 時(shí)間: 2025-3-24 08:05 作者: tenuous 時(shí)間: 2025-3-24 12:04 作者: 替代品 時(shí)間: 2025-3-24 14:52 作者: 得罪人 時(shí)間: 2025-3-24 22:23
Screening and burn-in: application to optoelectronic device selection for high-reliability S 280 optive components, and a overview of the consolidated reliability data obtained on these components, the emphasis will be put on the resulting selection procedures that have been chosen after an optimisation and validation phase. The practical application of these procedures in supplies for the EMOS li作者: 無(wú)能性 時(shí)間: 2025-3-25 02:48 作者: 憤世嫉俗者 時(shí)間: 2025-3-25 06:01
Component Burn-In: The Changing Attitudeent manufacturers now no longer request burn-in of semiconductor components due to the overall improved quality and reliability of components available from most vendors. Also, many have become aware of the inherent dangers of inducing damage in otherwise healthy components in the burn-in area. On t作者: 嬉耍 時(shí)間: 2025-3-25 11:17
Statistical Models for Device Reliability; An Overviewhazard rate model, which has proven in many cases to he too simple. A decreasing hazard rate is often observed and this may be modelled in several ways. Furthermore as the submicron technology is emerging wearout phenomena may be observed. The situation is further complicated when more than one fail作者: 北極熊 時(shí)間: 2025-3-25 13:06 作者: neutralize 時(shí)間: 2025-3-25 16:08 作者: 使激動(dòng) 時(shí)間: 2025-3-25 22:05
Failure Analysis: The Challengexpedient remedial action is essential (in certain applications, for example military or aerospace, failure cannot be tolerated). Consequently with the advances in these technologies, together with the wide variety of packaging formats used, innovative tools and techniques for failure analysis need d作者: 形狀 時(shí)間: 2025-3-26 03:03 作者: CLASH 時(shí)間: 2025-3-26 05:57 作者: 妨礙 時(shí)間: 2025-3-26 11:03
Failure Mechanisms of GaAs MESFETs and Low-Noise HEMTsdevices manufactured by different technologies. Main failure mechanisms identified are related to gate metallization and Schottky contacts (metal/GaAs interdiffusion, gate electromigration), ohmic contact degradation (increase of contact resistance, drain/source electromigration), surface effects an作者: GROSS 時(shí)間: 2025-3-26 14:34
Metal Contact Degradation on III–V Compound Semiconductorstal contact technology, low parasitic resistance and a high degree of reliability and reproducibility. Self-aligned gate FETs in digital GaAs integrated circuits require gates which must withstand a high temperature anneal treatment. For long term high temperature applications, stable Ohmic contacts作者: Vulnerable 時(shí)間: 2025-3-26 19:53
Nuclear Methods in the Characterization of Semiconductor Reliabilityp and in many cases the results are not well understood. A survey of applications of nuclear techniques for the characterization of the structural and electronic environment of impurity atoms in semiconductors in an atomic scale will be given. The potentialities, sensitivity and limitations of the n作者: escalate 時(shí)間: 2025-3-26 23:42
A Review of the Reliability of III–V Opto-electronic Componentsphotodiodes for use in optical fibre transmission systems. Results are presented which show that these components are capable of the high reliability needed for telecommunications use, but that they are still vulnerable to a number of failure mechanisms. Reliability assessment, failure analysis and 作者: 啪心兒跳動(dòng) 時(shí)間: 2025-3-27 04:31
Considerations on the Degradation of DFB Lasersodes. The change in spectral characteristics during operation and the electric surge endurance level is also presented..The failure modes are similar to those of FP lasers. The degradation speed mainly depends on the injected current density and is affected by BH interface degradation. The median li作者: Circumscribe 時(shí)間: 2025-3-27 06:26 作者: 平項(xiàng)山 時(shí)間: 2025-3-27 12:53
Modelling the Effects of Degradation on the Spectral Stability of Distributed Feedback Lasersare presented of the effects on uniform grating and λ/4 phase shift DFB lasers of changes made in localised injected current density and in lifetime of carriers for linear non-radiative recombination. The aim of the work is to evaluate modelling as a technique for comparing the susceptibility of dif作者: Acetaminophen 時(shí)間: 2025-3-27 15:20
Gate Metallisation Systems for High Reliability GaAs MESFET Transistors and WSi.. The work carried out in this area will be reviewed and appraised. The basic interface has been characterised by the use of RBS and SIMS studies. More recent studies have been concerned with the use of these results in the fabrication and evaluation of transistor structures.作者: 是剝皮 時(shí)間: 2025-3-27 21:05 作者: 削減 時(shí)間: 2025-3-28 00:24 作者: Freeze 時(shí)間: 2025-3-28 02:49
The Influence of Temperature and Use Conditions on the Degradation of Led Parametersce of technology and manufacturer is presented. The quality and reliability of devices based on failure analysis are often more related to external causes than due to intrinsic reliability of the semiconductor.作者: 邊緣 時(shí)間: 2025-3-28 07:17 作者: 混合,攙雜 時(shí)間: 2025-3-28 13:57 作者: Anthropoid 時(shí)間: 2025-3-28 15:19
Reliability Assessment of Cmos Asic DesignsMOS ASICs to be established. The programme results are then used to simulate the effects of CMOS failures at the circuit-level and evaluate test patterns. The final step uses this knowledge to provide guidelines for test pattern generation and fault coverage comparisons.作者: 裝飾 時(shí)間: 2025-3-28 21:03 作者: 帶來(lái)墨水 時(shí)間: 2025-3-29 00:49 作者: disciplined 時(shí)間: 2025-3-29 06:16 作者: 拱墻 時(shí)間: 2025-3-29 09:41
James Turner,Rodney Conlonum Oktober 1892 charakterisirt sich durch in raschen Sprüngen wechselnde Temperaturextreme und grosse Trockenheit, in Folge deren die Blüten vielfach erfroren, oder die schon gebildeten Fruchtans?tze vertrockneten. War der Sp?t-herbst 1891 auch ungew?hnlich sch?n und der Winter trotz Wechsels zwisch作者: Innocence 時(shí)間: 2025-3-29 13:30
M. Gueguen,J. L. Boussois,J. L. Goudard,D. Sauvageum Oktober 1892 charakterisirt sich durch in raschen Sprüngen wechselnde Temperaturextreme und grosse Trockenheit, in Folge deren die Blüten vielfach erfroren, oder die schon gebildeten Fruchtans?tze vertrockneten. War der Sp?t-herbst 1891 auch ungew?hnlich sch?n und der Winter trotz Wechsels zwisch作者: 燈泡 時(shí)間: 2025-3-29 17:32 作者: 冥界三河 時(shí)間: 2025-3-29 20:43
Finn Jensenum Oktober 1892 charakterisirt sich durch in raschen Sprüngen wechselnde Temperaturextreme und grosse Trockenheit, in Folge deren die Blüten vielfach erfroren, oder die schon gebildeten Fruchtans?tze vertrockneten. War der Sp?t-herbst 1891 auch ungew?hnlich sch?n und der Winter trotz Wechsels zwisch作者: ADOPT 時(shí)間: 2025-3-30 01:29 作者: 食道 時(shí)間: 2025-3-30 06:32
978-94-010-7620-3Kluwer Academic Publishers 1990作者: 供過(guò)于求 時(shí)間: 2025-3-30 10:15 作者: 歌劇等 時(shí)間: 2025-3-30 13:11
NATO Science Series E:http://image.papertrans.cn/s/image/864838.jpg作者: Accord 時(shí)間: 2025-3-30 19:55
https://doi.org/10.1007/978-94-009-2482-6ASIC; CMOS; LED; Laser; Standard; Transistor; VLSI; integrated circuit; quality control, reliability, safety作者: 條街道往前推 時(shí)間: 2025-3-31 00:05
An Historical Perspective of GaAs Mesfet Reliability Work at PlesseyThis paper charts the progress of MESFET life tests at Plessey Research Caswell Limited and shows how by adopting new fabrication techniques the MTTF of the device has been improved by four orders of magnitude.作者: chalice 時(shí)間: 2025-3-31 01:19 作者: Heretical 時(shí)間: 2025-3-31 08:52 作者: lymphoma 時(shí)間: 2025-3-31 12:16
Determination of cardiac output by invasive methodsculation per unit time, and is expressed in the units liters/minute. To account for differences in patients’ body height and weight, the cardiac output is related to the body surface area and termed the cardiac index; it is expressed in the units liters/minute/m..作者: 包裹 時(shí)間: 2025-3-31 14:56
Scenes of Life in the Warrior Court Society in Edod on the warrior court society from the Tokugawa period (1603–1868) because this period is called the ‘a(chǎn)ge of peace and prosperity’, which has produced significant shifts in the habitus of the military aristocracy from warriors to courtiers.作者: MUTE 時(shí)間: 2025-3-31 18:50 作者: GRACE 時(shí)間: 2025-3-31 23:20
Stefan Schmalzigh efficiency and labour savings of the Japanese steel industry, particularly after the oil crisis in 1973. By 1981, the CC had already spread to 70.7 per cent of Japanese steel production, as compared to only 21.1 per cent in the USA and 45.1 per cent in the EC.. In Japan, this percentage has rise作者: 話 時(shí)間: 2025-4-1 03:04
d to the estimate of precipitation efficiency. The book can be used as a text book for graduate students and will be beneficial to researchers and forecasters for precipitation process studies and operational forecasts.978-94-017-8188-6978-94-007-2381-8Series ISSN 2194-5217 Series E-ISSN 2194-5225 作者: Brochure 時(shí)間: 2025-4-1 05:59 作者: 語(yǔ)言學(xué) 時(shí)間: 2025-4-1 13:57 作者: 單調(diào)性 時(shí)間: 2025-4-1 15:50 作者: 冷漠 時(shí)間: 2025-4-1 20:10 作者: Overthrow 時(shí)間: 2025-4-2 00:13
