標(biāo)題: Titlebook: Reliability of Organic Compounds in Microelectronics and Optoelectronics; From Physics-of-Fail Willem Dirk van Driel,Maryam Yazdan Mehr Boo [打印本頁] 作者: solidity 時(shí)間: 2025-3-21 16:19
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作者: Ligneous 時(shí)間: 2025-3-21 21:04
T. M. Eggenhuisen,T. L. Hoeks, Dienstleistungen, Tech- nologie und Wissen -ausgedehnt Zugleich haben sich ihre Organisationsformen ver?n- dert: Aus national operierenden Gro?unternehmen, die untereinander in Wettbewerb traten, sind international und global agierende Einheiten geworden, die Beschaffungs- und Absatzm?rkte weltums作者: NAV 時(shí)間: 2025-3-22 02:18 作者: Yourself 時(shí)間: 2025-3-22 06:18
P. Gromala,A. Inamdar,A. Prisacaru,M. Dressler,A. Kabakchievren gelebt hat, namlich Kant. Kant, der sich des oben dargelegten Dilemmas zwischen Objektivitat und Vorurteil bewusst war, definierte an dieser Stelle sein beruhmtes .. Er sagt, dass im Bewusstsein eines jeden Menschen bereits kategorische Konzepte vorhanden sind, die vom Verstand im Prozess der si作者: 弄臟 時(shí)間: 2025-3-22 11:25 作者: BUOY 時(shí)間: 2025-3-22 12:53
W. D. van Driel,M. Yazdan Mehr,X. J. Fan,G. Q. Zhangd formuliert notwendige Rahmenbedingungen für die AufrechterDieses Buch gibt Antworten darauf, wie in Zeiten von Facebook und Fake News der verfassungsrechtliche Schutz des freien ?ffentlichen Diskurses gelingen kann. Es untersucht, wie die Verfassung auf einen nicht mehr nur durch Rundfunk und Pres作者: deriver 時(shí)間: 2025-3-22 17:17
t sich mit Fragen der Operationalisierung des Lebenschancen-Ansatzes von Ralf Dahrendorf in Bezug auf r?umliche Entwicklungen. Dabei wird untersucht, welche Raumentwicklungen zu einer Maximierung von Lebenschancen beitragen k?nnen und welche Raumentwicklungen mit dem Ziel der Maximierung von Lebensc作者: 短程旅游 時(shí)間: 2025-3-23 00:52 作者: 引起 時(shí)間: 2025-3-23 03:20
Molecular Modeling for Reliability Issues,ractions that can initiate a failure event in order to further improve and design more robust materials. This chapter will cover aspects of molecular modeling that have been found to be useful toward this perspective of material reliability.作者: Retrieval 時(shí)間: 2025-3-23 08:37 作者: 傲慢物 時(shí)間: 2025-3-23 10:26
Reliability and Failures in Solid State Lighting Systems,ctional design, they lack a systematic approach when used for reliability assessments. Besides this, lifetime predictions are still based on old standards assuming a constant failure rate behavior. In this chapter, we will present the reliability and failures found in solid-state lighting systems. I作者: PIZZA 時(shí)間: 2025-3-23 15:53 作者: 廚師 時(shí)間: 2025-3-23 20:58
Reliability and Degradation of Power Electronic Materials, the observed, but also the censored failure times. Another cause for distributions to blend, is the test of inhomogeneous test batches. For instance, some test objects may contain a production flaw, while other objects don’t. Such a mix of (sub) populations will also yield a total distribution cons作者: 我就不公正 時(shí)間: 2025-3-23 22:49 作者: Cirrhosis 時(shí)間: 2025-3-24 05:03 作者: Mawkish 時(shí)間: 2025-3-24 09:16 作者: Vasoconstrictor 時(shí)間: 2025-3-24 11:09 作者: 來自于 時(shí)間: 2025-3-24 14:52 作者: 吞下 時(shí)間: 2025-3-24 19:35
Reliability of Organic Compounds in Microelectronics and Optoelectronics978-3-030-81576-9作者: NIB 時(shí)間: 2025-3-25 02:26
Fran?ois de Buyl,Shin Yoshidaie zukünftige Entwicklung der Nordamerikanischen Freihandelszone (NAFT A) besitzt als ein an der Technischen Hochschule Darmstadt ausgebildeter Wirtschaftsingenieur sowohl betriebs- und gesamtwirtschaftliche als auch die technischen Grundlagen, die zur Analyse eines solch komplexen Integrationsverbu作者: Rodent 時(shí)間: 2025-3-25 03:31
T. M. Eggenhuisen,T. L. Hoeksie zukünftige Entwicklung der Nordamerikanischen Freihandelszone (NAFT A) besitzt als ein an der Technischen Hochschule Darmstadt ausgebildeter Wirtschaftsingenieur sowohl betriebs- und gesamtwirtschaftliche als auch die technischen Grundlagen, die zur Analyse eines solch komplexen Integrationsverbu作者: PANG 時(shí)間: 2025-3-25 08:13 作者: abysmal 時(shí)間: 2025-3-25 13:26
P. Gromala,A. Inamdar,A. Prisacaru,M. Dressler,A. Kabakchiev Folgen fur ein Verstandnis vom Menschen uberhaupt. Es bedeutet namlich nicht mehr und nicht weniger, als dass Kant dem individuellen Menschen keine eigene individuelle und subjektive Erkenntnisfahigkeit zugesteht, sondern der Mensch lediglich uber eine allgemeine, von der Transzendenz vorgegebene U作者: 猛然一拉 時(shí)間: 2025-3-25 15:56
T. Braun,O. H?lckht ausreichend Rechnung tragen. Der Einzelne muss heute nicht mehr nur vor, sondern auch in seiner Medienmacht geschützt werden. Ausgehend von kommunikationswissenschaftlichen Erkenntnissen wird ein verfassungsrechtliches Verst?ndnis entwickelt, das den Einzelnen wieder ins Zentrum eines freien massenmedialen Diskurses rückt..978-3-662-57687-8作者: 招待 時(shí)間: 2025-3-25 23:03 作者: 貪婪的人 時(shí)間: 2025-3-26 01:36 作者: 做作 時(shí)間: 2025-3-26 06:16
Degradation and Failures of Polymers Used in Light-Emitting Diodes,at describing the service conditions on the degradation mechanisms of different organic optical materials in LEDs which lead to the color shift of the light output. The contributions of different degradation mechanisms of optical and package materials in LED-based products to color shift are thoroughly explained.作者: 公理 時(shí)間: 2025-3-26 09:27
http://image.papertrans.cn/r/image/826412.jpg作者: 災(zāi)難 時(shí)間: 2025-3-26 13:18
https://doi.org/10.1007/978-3-030-81576-9Environmental Degradation of Materials; Thermal Degradation of Polymer Blends; Reliability and failure作者: LAP 時(shí)間: 2025-3-26 20:11 作者: ureter 時(shí)間: 2025-3-26 22:59 作者: Minuet 時(shí)間: 2025-3-27 01:14 作者: glans-penis 時(shí)間: 2025-3-27 05:51
EMC Oxidation Under High-Temperature Aging, layer, (2) the mechanical properties of oxidized EMC, (3) the effect of oxidized EMC on thermomechanical behavior of a molded package, and (4) the effect of EMC oxidation on solder joint reliability. This study utilizes various experimental characterization techniques as well as finite element simulation-based analysis.作者: 注意 時(shí)間: 2025-3-27 13:24 作者: Tortuous 時(shí)間: 2025-3-27 14:48 作者: 愛哭 時(shí)間: 2025-3-27 18:14
ilure, and degradation of different organic materials.Explai.This book aims to provide a comprehensive reference into the critical subject of failure and degradation in organic materials, used in optoelectronics and microelectronics systems and devices. Readers in different industrial sectors, inclu作者: fulcrum 時(shí)間: 2025-3-28 00:29
Degradation Mechanisms of Silicones,s-linking, or as elastomers, when fillers are incorporated in cross-linked polymers. This chapter deals with the key properties of silicones. It describes degradation behavior in terms of physical and chemical effects currently understood by detailed analysis of the aged material.?With their low moi作者: inflate 時(shí)間: 2025-3-28 04:24
Degradation Mechanisms of Aromatic Polycarbonate,o automobiles. It is well known for its transparency, meaning lighting optical applications are widely present in the market. Degradation of polycarbonate strongly depends on many factors like processing, temperature, and/or light. The main degradation mechanism is a photofries rearrangement followe作者: 使尷尬 時(shí)間: 2025-3-28 07:07 作者: 過份好問 時(shí)間: 2025-3-28 12:03
Peridynamic Modeling of Thermo-oxidative Degradation in Polymers,mo-oxidative degradation. Also, the coefficient of thermal expansion, glass transition temperature, and fracture properties experience change such as decrease in fracture strain. Such changes in the material properties cause residual stress in the oxidized layer resulting in damage in the form of cr作者: 使出神 時(shí)間: 2025-3-28 15:32 作者: 冒煙 時(shí)間: 2025-3-28 20:04
Health Monitoring, Machine Learning, and Digital Twin for LED Degradation Analysis,igher reliability, longer lifetime, and higher efficiency compared with other light sources. The demand for increased lifetime and higher reliability has attracted a significant number of research studies on the prognostics and lifetime estimation of LEDs, ranging from the traditional failure data a作者: 清醒 時(shí)間: 2025-3-29 02:09
Reliability and Failures in Solid State Lighting Systems,onfronted with ever-increasing design complexity, dramatically decreasing design margins, increasing chances for and consequences of failures, shortening of product development and qualification time, and increasing difficulties to meet quality, robustness, and reliability requirements. The scientif作者: notification 時(shí)間: 2025-3-29 03:09 作者: 減震 時(shí)間: 2025-3-29 08:27 作者: defibrillator 時(shí)間: 2025-3-29 12:03
Artificial Intelligence and LED Degradation, the improvements in computational power from the hardware. Meanwhile, there is easy access and availability of data from various platforms. AI technologies with data science can help solve many industrial problems like tracking Solid-state Lighting (SSL) system degradation, classifying LED failures作者: LAIR 時(shí)間: 2025-3-29 16:01
Degradation Analysis for Reliability of Optoelectronics,exhibit very long lifetimes. Therefore, degradation failures have become the dominant issues in reliability analysis of these devices nowadays. This chapter provides a couple of degradation analysis approaches, including the traditional exponential decay model for lumen depreciation, Gamma process-b作者: 抓住他投降 時(shí)間: 2025-3-29 22:15
Reliability and Failure of Microelectronic Materials,duct lifetime is highly desirable so that extended use is feasible. Inaddition to this, the reliability requirements for such components are also becoming more stringent, in steadily more extreme applications. For that purpose, we need to understand the degradation mechanisms in microelectronic devi作者: Interferons 時(shí)間: 2025-3-30 03:19
Degradation and Remaining Useful Life Prediction of Automotive Electronics, operation such as smart home application that can control temperature in our homes to highly sophisticated transportation systems that we have already on airports. Soon we will see them on our streets. Availability of these highly automated and autonomous solutions depends on electronic components 作者: COKE 時(shí)間: 2025-3-30 08:02
Reliability and Degradation of Power Electronic Materials,r electronics (PE) can be due to a manifold of mechanisms. Even in a single PE device multiple failure processes may compete. For instance, modules may contain various components that fail according to different processes. When testing a batch of devices with competing processes, the resulting failu作者: 多產(chǎn)魚 時(shí)間: 2025-3-30 10:43 作者: ear-canal 時(shí)間: 2025-3-30 14:58 作者: CLOWN 時(shí)間: 2025-3-30 17:12 作者: cruise 時(shí)間: 2025-3-31 00:32
which readers will find useful to assess and mitigate similar failure cases. More importantly, this book presents methodologies and useful approaches in analyzing a failure and in relating a failure to the reliability of materials and systems..978-3-030-81578-3978-3-030-81576-9作者: instulate 時(shí)間: 2025-3-31 03:38 作者: 形上升才刺激 時(shí)間: 2025-3-31 05:39 作者: 青春期 時(shí)間: 2025-3-31 11:40
