派博傳思國(guó)際中心

標(biāo)題: Titlebook: Reliability of Electronic Components; A Practical Guide to Titu I. B?jenescu,Marius I. Bazu Book 1999 Springer-Verlag Berlin Heidelberg 199 [打印本頁(yè)]

作者: aggression    時(shí)間: 2025-3-21 17:59
書(shū)目名稱(chēng)Reliability of Electronic Components影響因子(影響力)




書(shū)目名稱(chēng)Reliability of Electronic Components影響因子(影響力)學(xué)科排名




書(shū)目名稱(chēng)Reliability of Electronic Components網(wǎng)絡(luò)公開(kāi)度




書(shū)目名稱(chēng)Reliability of Electronic Components網(wǎng)絡(luò)公開(kāi)度學(xué)科排名




書(shū)目名稱(chēng)Reliability of Electronic Components被引頻次




書(shū)目名稱(chēng)Reliability of Electronic Components被引頻次學(xué)科排名




書(shū)目名稱(chēng)Reliability of Electronic Components年度引用




書(shū)目名稱(chēng)Reliability of Electronic Components年度引用學(xué)科排名




書(shū)目名稱(chēng)Reliability of Electronic Components讀者反饋




書(shū)目名稱(chēng)Reliability of Electronic Components讀者反饋學(xué)科排名





作者: intuition    時(shí)間: 2025-3-21 23:25
Reliability of diodes, diodes. Among the important characteristics that can’t be exceeded, the reverse voltage, the forward current and the maximum junction temperature (including data concerning the thermal resistance at high temperature) may be mentioned.
作者: grandiose    時(shí)間: 2025-3-22 03:16
Reliability of optoelectronic components,ed; however the main emphasis of this chapter will be the understanding of degradation processes in LEDs and optocouplers. In Fig.10.1 a classification of optoelectronic semiconductor components is given.
作者: Dorsal-Kyphosis    時(shí)間: 2025-3-22 08:06

作者: Crayon    時(shí)間: 2025-3-22 12:30

作者: Hyperplasia    時(shí)間: 2025-3-22 14:53

作者: incarcerate    時(shí)間: 2025-3-22 19:13

作者: Engaging    時(shí)間: 2025-3-23 01:08

作者: Intersect    時(shí)間: 2025-3-23 05:05
Reliability of passive electronic parts,are used. Such failure analyses help in identifying device failure modes, mechanisms, and stress factors that influence degradation [3.1]. The . (infant mortality, or failure during the burn-in or debugging period) occur at high initial failure rate λ- which is the number of failures of a part per u
作者: 頑固    時(shí)間: 2025-3-23 07:52
Reliability of diodes,applied voltage [4.1]…[4.13]. The silicon is used almost exclusively as semiconductor material. The main constructive forms are planar diodes and MESA diodes. Among the important characteristics that can’t be exceeded, the reverse voltage, the forward current and the maximum junction temperature (in
作者: addict    時(shí)間: 2025-3-23 10:28
Reliability of thyristors,y of semiconductor components, including the triac, bi-directional diode switch, the silicon controlled switch (SCS), the silicon unilateral and bilateral switches (SUS, SBS) and light activated devices like the LASCR. Most recent members of the thyristor family are the complementary SCR, the progra
作者: Radiculopathy    時(shí)間: 2025-3-23 15:42

作者: grudging    時(shí)間: 2025-3-23 19:48
Reliability of hybrid integrated circuits, In this way conductors, resistors and — until a certain degree — small capacitors and inductors are produced, integrated on a substrate. The passive elements (such as great value capacitors and, if necessary, inductors) are incorporated in the integrated circuits [8.1].
作者: 拱形面包    時(shí)間: 2025-3-23 23:10

作者: 遺傳    時(shí)間: 2025-3-24 02:23
Reliability of optoelectronic components,olithic form — are among the competitors for the lucrative visible alphanumeric display market. Reliability of such LEDs is now almost taken for granted; however the main emphasis of this chapter will be the understanding of degradation processes in LEDs and optocouplers. In Fig.10.1 a classificatio
作者: 小木槌    時(shí)間: 2025-3-24 06:35

作者: TSH582    時(shí)間: 2025-3-24 12:28

作者: 不知疲倦    時(shí)間: 2025-3-24 17:06
Failure analysis, on the solid physics, but on the adequate design of electronic systems or on their manufacturing on an industrial scale. The scanning electron microscope, for instance, will be mentioned only incidentally, while the habitual analysis means (such as: electrical measuring, optical microscopy and chem
作者: Incommensurate    時(shí)間: 2025-3-24 19:21

作者: 擦掉    時(shí)間: 2025-3-25 00:31

作者: 證實(shí)    時(shí)間: 2025-3-25 04:55

作者: 緩和    時(shí)間: 2025-3-25 10:32
Titu I. B?jenescu M.Sc.,Marius I. B?zun 3059 im Jahre 1908. Die Menge der Kurpfuscher, welche sich berufsm??ig mit der Behandlung kranker Menschen befassen, ist also erheblich gestiegen. Die Zahlen der Regierungsvorlage über die Kurpfuscher im Deutschen Reich sind seitens der Kurpfuscherorganisation (Zentralverband für Parit?t der Heilm
作者: averse    時(shí)間: 2025-3-25 14:34

作者: 窗簾等    時(shí)間: 2025-3-25 18:22

作者: 感情脆弱    時(shí)間: 2025-3-25 20:22

作者: STANT    時(shí)間: 2025-3-26 00:13
ble design could be prescribed simply as "picking good parts and using them right". Nowadays the complexity of systems, particularly electronic systems, and the demand for ultrahigh reliability in many applicat978-3-642-63625-7978-3-642-58505-0
作者: 規(guī)范就好    時(shí)間: 2025-3-26 04:22

作者: 任意    時(shí)間: 2025-3-26 11:53
Reliability of thyristors, explosive and corrosive environments. All components — including power semiconductors — have the potential of failing or degrading in ways that could impair the proper operation of such systems. Well-known circuit techniques (including fusing and self-checking) are available to protect against the
作者: Paleontology    時(shí)間: 2025-3-26 16:33
Reliability of memories and microprocessors, of progress to a factor of two every 1.5 years, Moore’s law continues to hold well today. The second law is the ., a somewhat tongue-in cheek statement that memory chips, in a given generation, sell for about π dollars when they reach their peak shipping volume, and eventually reach a selling price
作者: CAB    時(shí)間: 2025-3-26 19:14
Book 1999bility of performance than on quality in the industrial sense. There was a time when reliable design could be prescribed simply as "picking good parts and using them right". Nowadays the complexity of systems, particularly electronic systems, and the demand for ultrahigh reliability in many applicat
作者: intimate    時(shí)間: 2025-3-26 21:53

作者: BARGE    時(shí)間: 2025-3-27 04:32
Titu I. B?jenescu M.Sc.,Marius I. Bazuolitik, in den Medien und Religionen. Die Geschichte der Erziehung zeigt jedoch, dass Erziehung Misserfolge und Fehlentwicklungen produzieren kann: statt Selbstbestimmung erzeugt sie Gehorsam, statt Mündigkeit Unterdrü-ckung, statt Zuwendung und Empathie k?rperliche und seelische Gewaltt?tigkeiten,
作者: 不可侵犯    時(shí)間: 2025-3-27 05:35
Titu I. B?jenescu M.Sc.,Marius I. B?zuzeipr?sidiums ist die Zahl der gewerbsm??igen Kurpfuscher Berlins vom Jahre 1879–1903 um 3518% gestiegen, indes die Einwohnerzahl in der gleichen Zeit um 120% zunahm; im Jahre 1878 gab es 28, im Jahre 1903 aber 1013 Kurpfuscher. Eine Z?hlung in Preu?en im Jahre 1897 ergab 2404 Kurpfuscher; im Jahre
作者: Vldl379    時(shí)間: 2025-3-27 11:16
Titu I. B?jenescu M.Sc.,Marius I. Bazueriellen Mitteln versehen. Mit diesen wiederum schuf man sich neuen Einflu? auf die Presse, auf abh?ngige Kreise, man schuf vor allem auch eine ausgedehnte Organisation, die früher für das ?ehrlose“ Gewerbe unm?glich gewesen w?re. Die Organisation wirkte dann wiederum machtsteigernd, und ihre auf Ma
作者: 通情達(dá)理    時(shí)間: 2025-3-27 14:26
t. Auch bei der Untersuchung der dielektrischen Funktionen freier Ladungstr?ger in einem polarisierbaren Wirtsgitter haben wir eine frequenzunabh?ngige Untergrundpolarisation ε. angenommen. Das bedeutet, da? wir uns in Frequenzbereichen aufhielten, die genügend unter- oder oberhalb der Resonanzfrequ
作者: 顯微鏡    時(shí)間: 2025-3-27 18:34

作者: deriver    時(shí)間: 2025-3-27 22:17
Reliability of silicon power transistors,The explosive development of the semiconductor technology imposes greater demands on the quality and reliability of the components. The problem of the failure rate during the life of a device or system is more and more important and the failure analysis helps to the improvement of the product quality.
作者: HIKE    時(shí)間: 2025-3-28 02:30
Noise and reliability,Much work has been carried out in the past to study the various types of (low-frequency excess) noise sources as they commonly occur in silicon planar transistors used in monolithic integrated circuits. Some examples of such noise sources are presented in the following.
作者: intricacy    時(shí)間: 2025-3-28 07:14
Titu I. B?jenescu,Marius I. BazuApplication-oriented professional book.It provides engineers and students with enough background to design and analyse reliaility procedures.It also covers all the manufacturing aspects of electronic
作者: Negotiate    時(shí)間: 2025-3-28 13:23

作者: ciliary-body    時(shí)間: 2025-3-28 17:51

作者: compassion    時(shí)間: 2025-3-28 21:33

作者: 昆蟲(chóng)    時(shí)間: 2025-3-29 01:36
Test and testability of logic ICs,ncreased importance to the components control. To make this, it is absolutely necessary to have computer-assisted equipment. For the acquisition of such very modern computerised equipment, high investments are needed, not only for the machines, but also for personnel instruction, drawing up of software control and managing programmes.
作者: 文藝    時(shí)間: 2025-3-29 03:29

作者: MANIA    時(shí)間: 2025-3-29 09:36
Spelen,len is niet zomaar een tijdverdrijf, het is een bezigheid die heel belangrijk is voor de ontwikkeling van het kind. Al spelend leert het kind van alles over zijn eigen lichaam, zijn directe omgeving en de wereld waarin hij leeft. Door te spelen zal hij hiermee leren omgaan.
作者: GULF    時(shí)間: 2025-3-29 11:23

作者: Friction    時(shí)間: 2025-3-29 15:57
Qualitativer Entwicklungssprung — Von der Raupe zum Schmetterlingnsten kundenorientierter Wertsch?pfungsketten und einer entsprechenden Proze?orientierung. Hierbei kann nicht halbe Sache gemacht werden, der Erfolg liegt in der Konsequenz. Unternehmen, die sich solchen Radikalkuren unterziehen, verfügen danach über ein v?llig neues Aussehen.
作者: Schlemms-Canal    時(shí)間: 2025-3-29 20:15
Selbstaufhebung des Liberalismushe ashes and bones the following three tiny gold objects were discovered: 1) a small gold cabochon concave at the bottom and perhaps originally used to contain an amulet (weight: 0,86g); 2) a simple, rolled-up cylinder of gold-foil (approx. 2.0 cm. long), evidently used as a capsule but too oxydized
作者: atopic    時(shí)間: 2025-3-30 03:01

作者: Axon895    時(shí)間: 2025-3-30 07:46

作者: 離開(kāi)真充足    時(shí)間: 2025-3-30 12:11
rough the anatomy and the ethnic aspects of the aesthetics of the gluteal region. The book features special chapters on gluteal fat augmentation and a wide variety of techniques to improve the gluteal contour. 978-3-030-58945-5
作者: 慢慢啃    時(shí)間: 2025-3-30 13:01
The Palgrave Lacan Serieshttp://image.papertrans.cn/i/image/475446.jpg
作者: 鍵琴    時(shí)間: 2025-3-30 20:08

作者: 法官    時(shí)間: 2025-3-30 22:02
The development of nanotechnology carbon nanotubes (see p. 24f.). Of course, at such times one was not aware of the presence of nanoparticles; one simply exploited the change in material properties without knowing where they came from.




歡迎光臨 派博傳思國(guó)際中心 (http://www.pjsxioz.cn/) Powered by Discuz! X3.5
大化| 岑巩县| 星座| 遂溪县| 绥宁县| 静安区| 浦江县| 房产| 文成县| 莱州市| 扎囊县| 新河县| 当阳市| 博白县| 达孜县| 新源县| 仁怀市| 安多县| 子长县| 聂荣县| 大庆市| 静乐县| 昌黎县| 白朗县| 红原县| 鱼台县| 东宁县| 会泽县| 山东省| 库尔勒市| 河源市| 临江市| 贵州省| 伊春市| 璧山县| 江都市| 巴南区| 华亭县| 婺源县| 梧州市| 桑日县|