標(biāo)題: Titlebook: Reliability Physics and Engineering; Time-To-Failure Mode J. W. McPherson Textbook 2019Latest edition Springer Nature Switzerland AG 2019 D [打印本頁(yè)] 作者: Inveigle 時(shí)間: 2025-3-21 17:30
書(shū)目名稱(chēng)Reliability Physics and Engineering影響因子(影響力)
書(shū)目名稱(chēng)Reliability Physics and Engineering影響因子(影響力)學(xué)科排名
書(shū)目名稱(chēng)Reliability Physics and Engineering網(wǎng)絡(luò)公開(kāi)度
書(shū)目名稱(chēng)Reliability Physics and Engineering網(wǎng)絡(luò)公開(kāi)度學(xué)科排名
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書(shū)目名稱(chēng)Reliability Physics and Engineering讀者反饋
書(shū)目名稱(chēng)Reliability Physics and Engineering讀者反饋學(xué)科排名
作者: 柳樹(shù)；枯黃 時(shí)間: 2025-3-21 20:42
J. W. McPhersonarkable scientist.Includes supplementary material: In this Brief, Joe Jeffers uncovers the life and works of two-time Nobel Laureate Frederick Sanger. Following Sanger’s early life to retirement, Jeffers describes how this celebrated British biochemist became the first person to determine the amino 作者: badinage 時(shí)間: 2025-3-22 00:57 作者: ADORN 時(shí)間: 2025-3-22 08:13
J. W. McPhersonrom uranium minerals of the new element radium by M. and Mme. Curie have brought many changes of outlook upon science. Isolated questions of the most extraordinary diversity have been profitably reconsidered. It is only necessary to cite at random a few of the special problems in individual sciences作者: Canary 時(shí)間: 2025-3-22 08:54
J. W. McPhersonnfirmation as a classification system appeared from several directions by a replacement of the concept of atomic weight by that of atomic number, a modification to which Soddy contributed greatly. In the second part of his book ., subtitled . 1914), he published a three–dimensional helical represent作者: ARCHE 時(shí)間: 2025-3-22 15:52 作者: 比喻好 時(shí)間: 2025-3-22 20:39
J. W. McPhersond. In explaining such phenomena as electrical and magnetic actions, optical properties of matter and the behaviour of light, and the nature of chemical matter, connexions between all these were sought. It is pertinent to enquire whether the nineteenth-century unifying ideals relating matter, ether, 作者: pantomime 時(shí)間: 2025-3-22 21:24
J. W. McPhersonrom uranium minerals of the new element radium by M. and Mme. Curie have brought many changes of outlook upon science. Isolated questions of the most extraordinary diversity have been profitably reconsidered. It is only necessary to cite at random a few of the special problems in individual sciences作者: Presbyopia 時(shí)間: 2025-3-23 01:59 作者: Lymphocyte 時(shí)間: 2025-3-23 07:48
J. W. McPherson she bored him and he could bear anything better than ennui. She, on the other hand, kept a warm place for him in her heart, and her letters to her brother Prince Ferdinand of Brunswick, the distinguished soldier, are full of allusions to “our dear king.” That of July 12, 1757, on the death of the q作者: ATRIA 時(shí)間: 2025-3-23 12:32 作者: 龍卷風(fēng) 時(shí)間: 2025-3-23 15:45
J. W. McPherson a patrol, which often happens at night, or that it had to do with deserters, who are not uncommon in camps that lie close to the enemy. But since our regiment was stationed next to the guards, that is to say in the center of the camp, and like the guards was especially alert and accurate in matters作者: deceive 時(shí)間: 2025-3-23 20:06
J. W. McPherson she bored him and he could bear anything better than ennui. She, on the other hand, kept a warm place for him in her heart, and her letters to her brother Prince Ferdinand of Brunswick, the distinguished soldier, are full of allusions to “our dear king.” That of July 12, 1757, on the death of the q作者: craving 時(shí)間: 2025-3-24 01:43 作者: apropos 時(shí)間: 2025-3-24 03:20
J. W. McPherson she bored him and he could bear anything better than ennui. She, on the other hand, kept a warm place for him in her heart, and her letters to her brother Prince Ferdinand of Brunswick, the distinguished soldier, are full of allusions to “our dear king.” That of July 12, 1757, on the death of the q作者: decode 時(shí)間: 2025-3-24 06:55
J. W. McPhersone this life, yet that also accounts for the fascination of such an attempt. This life, even less than others, cannot be reduced to a simple formula; behind Frederick’s every act and utterance, there is the whole complex and mercurial personality we have come to know. At every turn, various aspects c作者: crumble 時(shí)間: 2025-3-24 13:17 作者: 討人喜歡 時(shí)間: 2025-3-24 15:04
J. W. McPherson Sanger’s colleagues and family members. This brief provides a rigorous yet concise view of Sanger on a personal and scientific level and is suitable for biochemists, historians or the interested layperson.978-3-319-54707-7978-3-319-54709-1Series ISSN 2191-5407 Series E-ISSN 2191-5415 作者: jet-lag 時(shí)間: 2025-3-24 22:39 作者: 阻礙 時(shí)間: 2025-3-24 23:10
J. W. McPhersonnnel and the electrification of the atmosphere in the neighbourhood of mountain tops. The explanation of all the various manifestations of energy associated with radioactivity has been found in the discovery of naturally occurring processes of transmutation progressing continuously and invariably wi作者: PLE 時(shí)間: 2025-3-25 04:24 作者: 妨礙 時(shí)間: 2025-3-25 09:30
J. W. McPhersonortance but their influence upon the early workers on radioactivity, such as Marie Curie and Ernest Rutherford, is detectable. The case of Frederick Soddy is more debatable; one views with interest his contemporary claim that the transmutation theory of radioactivity was entirely independent of elec作者: 揉雜 時(shí)間: 2025-3-25 13:22 作者: PAEAN 時(shí)間: 2025-3-25 17:50 作者: 玷污 時(shí)間: 2025-3-25 23:19 作者: 浸軟 時(shí)間: 2025-3-26 01:34
J. W. McPhersonall if God preserves him and arranges everything for the best, and if the king renders me a little more justice, this dear prince whom I love and adore as I shall to the end. What a satisfaction it used to be when I was with the dear departed and talked with her about this dear king and wished him e作者: 妨礙 時(shí)間: 2025-3-26 05:07 作者: 兇殘 時(shí)間: 2025-3-26 11:32
J. W. McPhersonous musket volleys, and even saw the powder flashes through the darkness. It was about three-thirty in the morning. We officers immediately shouted: “Fall in! Under arms!” In less than two minutes we had our men in rank and file. The firing increased in intensity, and a few guns from the village of 作者: 直覺(jué)好 時(shí)間: 2025-3-26 15:04 作者: palpitate 時(shí)間: 2025-3-26 19:06 作者: 挑剔為人 時(shí)間: 2025-3-26 23:54 作者: 嬰兒 時(shí)間: 2025-3-27 03:49
J. W. McPhersonth literary figures on a footing of equality, and the imperious self-assurance in the solitary heights of genius and absolute power; yielding to momentary impulses to the point of abandon, and heroic courage in the face of adversity which has parallels and examples only in the classic days of Rome. 作者: Ambulatory 時(shí)間: 2025-3-27 06:58
the emphasis of this book is clearly on the physics of failure and developing the reliability engineering tools required for product improvements during device-design and device-fabrication phases..978-3-319-93683-3作者: Hearten 時(shí)間: 2025-3-27 11:47 作者: CLAIM 時(shí)間: 2025-3-27 16:35
Time-to-Failure Models for Selected Failure Mechanisms in Integrated Circuits, addition, the use of dissimilar materials in a chip and in the assembly process produces a number of thermal expansion mismatches which can drive large thermomechanical stresses. These thermomechanical stresses can result in failure mechanisms such as stress migration (SM), creep, fatigue, cracking作者: MAPLE 時(shí)間: 2025-3-27 18:40
http://image.papertrans.cn/r/image/826361.jpg作者: VEST 時(shí)間: 2025-3-28 00:48
https://doi.org/10.1007/978-3-319-93683-3Device Reliability; Failure Modeling and statistics; Failure Rate Reduction; Maintenance and Reliabilit作者: cinder 時(shí)間: 2025-3-28 03:10 作者: Conjuction 時(shí)間: 2025-3-28 08:18
J. W. McPhersonProvides a comprehensive textbook on reliability physics of semiconductors, from fundamentals to applications;.Explains the fundamentals of reliability physics and engineering tools for building bette作者: 倫理學(xué) 時(shí)間: 2025-3-28 12:51
Springer Nature Switzerland AG 2019作者: Veneer 時(shí)間: 2025-3-28 16:04
From Material/Device Degradation to Time-to-Failure,esented in Chap. . which can be used for modeling the time-dependence of degradation. The question that we would like to address in this chapter is—.-.-.-.? The time-to-failure (TF) equations are critically important, for device failure mechanisms, and will be the focus of the remaining chapters in this book.作者: ornithology 時(shí)間: 2025-3-28 19:19
Gaussian Statistics: An Overview,g the time-zero values of a parameter (resistor values, mechanical tolerances, children heights, class grades on a test, etc.) can result in a distribution of values which can be described by a normal distribution.作者: 臭了生氣 時(shí)間: 2025-3-29 01:57 作者: instulate 時(shí)間: 2025-3-29 06:56 作者: 潛伏期 時(shí)間: 2025-3-29 09:30 作者: 農(nóng)學(xué) 時(shí)間: 2025-3-29 11:53
Time-Dependence of Materials and Device Degradation,th precision semiconductor devices (threshold voltages, drive currents, interconnect resistances, capacitor leakage, etc.) will degrade with time. In order to understand the useful lifetime of the device, it is important to be able to model how critically important materials/device-parameters degrade with time.作者: synovial-joint 時(shí)間: 2025-3-29 15:42
Time-to-Failure Statistics,re. Once the distribution of times-to-failure is established, then one can construct a probability density function .(.) which will permit one to calculate the probability of observing a failure in any arbitrary time interval between t and . + d., as illustrated in Fig. 7.1.作者: Grievance 時(shí)間: 2025-3-29 21:42 作者: 退潮 時(shí)間: 2025-3-30 02:37
Screening,adation to the good/ strong devices? The use of a short-duration stress to eliminate weak devices is generally referred to as .. We will find that screening can sometimes be very effective, but not always. Screening effectiveness depends on the exact details of the . for the devices plus the magnitude and duration of the screening stress.作者: Angiogenesis 時(shí)間: 2025-3-30 07:15 作者: 沙發(fā) 時(shí)間: 2025-3-30 09:41 作者: 善辯 時(shí)間: 2025-3-30 14:38 作者: Jejune 時(shí)間: 2025-3-30 17:52 作者: Frequency 時(shí)間: 2025-3-30 23:14
reliability physics and engineering tools for building bette.This third edition textbook provides the basics of reliability physics and engineering that are needed by electrical engineers, mechanical engineers, civil engineers, biomedical engineers, materials scientists, and applied physicists to he作者: 抗體 時(shí)間: 2025-3-31 01:25
Time-to-Failure Modeling,) will tend to degrade with time and eventually fail. The rate of degradation and eventual time-to-failure (TF) will depend on the electrical, thermal, mechanical, and chemical environments to which the device is exposed.作者: 碎石頭 時(shí)間: 2025-3-31 08:30
Accelerated Degradation,ate the degradation rate; also, our intuition might suggest that the degradation rate for a material is temperature dependent. This chapter will develop the needed equations that show that this is indeed the case.作者: Harridan 時(shí)間: 2025-3-31 13:03
Acceleration Factor Modeling,r a given set of . Since experimental determination of the AF could actually take many years, the AF must be modeled using the TF models introduced in Chap. .. Since the AF must be modeled, it brings up another important question—作者: harmony 時(shí)間: 2025-3-31 14:11 作者: 突襲 時(shí)間: 2025-3-31 18:04
Introduction, automobile tires) are fabricated from materials that will tend to degrade with time. The . will continue until some critical device parameter can no longer meet the required specification for proper device functionality. At this point, one usually says—the device has failed. The failure could be du作者: Cougar 時(shí)間: 2025-3-31 22:44
Physics of Degradation,only apparently stable and susceptible to change/degradation. The driving force for materials degradation is a lower .. When we apply a generalized stress . to a material, it tends to increase (not lower) the Gibbs Potential. Therefore, a stressed material is even more unstable and even more suscept作者: gain631 時(shí)間: 2025-4-1 04:00 作者: 展覽 時(shí)間: 2025-4-1 08:45
