標(biāo)題: Titlebook: Radio Recombination Lines; Proceedings of a Wor P. A. Shaver Conference proceedings 1980 D. Reidel Publishing Company, Dordrecht, Holland 1 [打印本頁] 作者: raff淫雨霏霏 時(shí)間: 2025-3-21 17:15
書目名稱Radio Recombination Lines影響因子(影響力)
作者: 大炮 時(shí)間: 2025-3-21 20:51
Systematic Variation of the Helium Ionization in Galactic HII Regionse for larger radii. This behavior can be interpreted as reflecting a general decrease of the He abundance with the galactic radius (similar to that also found for planetary nebulae; Torres-Peimbert and Peimbert, 1977) plus a reduction of the ionization in the inner parts of the Galaxy. The crucial aspect is that the observations作者: 辮子帶來幫助 時(shí)間: 2025-3-22 04:13
Carbon Radio Recombination Line Emission from Dark Clouds source and as an extended source of far infrared thermal dust emission; the CII region coincides with a localized region of enhanced molecular line emission. We summarize the physical properties (temperature and density) of the CII regions as derived from the recombination line observations and comment on prospects for further research.作者: 輕信 時(shí)間: 2025-3-22 04:35 作者: promote 時(shí)間: 2025-3-22 09:02 作者: ARC 時(shí)間: 2025-3-22 13:15 作者: charisma 時(shí)間: 2025-3-22 18:02
Interpretation of HII Region Radio Recombination Linesno need for another review in the traditional sense. There does however seem to be a certain amount of confusion, at least among observers, as to whether or not theory and observations are consistent with one another. One problem is that simple models of the recombination line transfer do not appear作者: 宮殿般 時(shí)間: 2025-3-22 23:17 作者: reptile 時(shí)間: 2025-3-23 04:24
Radio Recombination Lines from Planetary Nebulaen (Terzian 1973, 1978). Only in recent years it has been possible to detect these lines with adequate signal-to-noise ratios. The largest radio telescopes have been used for such observations with long integration times. Successful results have been obtained for Hnα lines with n ≤ 110, and only uppe作者: Stricture 時(shí)間: 2025-3-23 07:35 作者: 疼死我了 時(shí)間: 2025-3-23 10:03 作者: VALID 時(shí)間: 2025-3-23 16:58 作者: Euthyroid 時(shí)間: 2025-3-23 18:15 作者: 藕床生厭倦 時(shí)間: 2025-3-23 22:24
Carbon Radio Recombination Line Emission from Dark CloudsSuch CII regions detectable by their radio recombination line radiation share several characteristics: they are all excited by.an early B-type star that is embedded within or closely associated with a dense (n k, 10. cm.) neutral cloud; the exciting star is identifiable both as a near infrared point作者: 繁榮地區(qū) 時(shí)間: 2025-3-24 05:20 作者: expeditious 時(shí)間: 2025-3-24 08:23 作者: 冰雹 時(shí)間: 2025-3-24 11:39 作者: neurologist 時(shí)間: 2025-3-24 18:36
The Galactic Center: Results of Radio Recombination Line Surveysned with a measurement of the continuum intensity, an estimate of the electron temperature of the source. In this chapter we will primarily be concerned with applying points (i) and (ii) to radio sources in the Galactic center.作者: 捏造 時(shí)間: 2025-3-24 21:01 作者: 割公牛膨脹 時(shí)間: 2025-3-24 23:24 作者: SOB 時(shí)間: 2025-3-25 04:24 作者: Inelasticity 時(shí)間: 2025-3-25 11:29 作者: ALIEN 時(shí)間: 2025-3-25 14:05 作者: intelligible 時(shí)間: 2025-3-25 18:45 作者: septicemia 時(shí)間: 2025-3-26 00:02
Astrophysics and Space Science Libraryhttp://image.papertrans.cn/r/image/820642.jpg作者: 吹氣 時(shí)間: 2025-3-26 01:09 作者: Enervate 時(shí)間: 2025-3-26 06:09
The Importance of Non-LTE Effects to the Interpretation of Radio Recombination LinesIn particular we focus on the effect that departures from b = 1 and τ. << 1 have on the determination of nebular temperatures, and we discuss the effect of impact broadening on the interpretation of radio recombination lines (hydrogen and helium) from inhomogeneous nebulae.作者: 音樂等 時(shí)間: 2025-3-26 12:00 作者: CRACY 時(shí)間: 2025-3-26 13:50
978-94-009-9026-5D. Reidel Publishing Company, Dordrecht, Holland 1980作者: 悠然 時(shí)間: 2025-3-26 18:54
Radio Recombination Lines978-94-009-9024-1Series ISSN 0067-0057 Series E-ISSN 2214-7985 作者: transplantation 時(shí)間: 2025-3-26 23:23 作者: micronutrients 時(shí)間: 2025-3-27 04:27 作者: 有毒 時(shí)間: 2025-3-27 06:45 作者: 不要嚴(yán)酷 時(shí)間: 2025-3-27 10:55 作者: 黃油沒有 時(shí)間: 2025-3-27 14:26 作者: Compatriot 時(shí)間: 2025-3-27 20:30
of Bangladesh is projected to increase from 123.9 million in 2001 to 193.7 million in 2031, an increase of 56.39 percent during the projected period. Male population will increase from 63.9 million in 2001 to 100.0 million in 2031, and female population will increase from 60.0 million in 2001 to 93.作者: CULP 時(shí)間: 2025-3-28 00:26
M. J. Seatonve housing unit method (D-HUM). The results suggest that spatial remediation does little to improve accuracy at the municipal level, and although both sets of component estimates represented significant improvements over the Census 2000 constant estimates, neither out-performed the (D-HUM) procedure作者: AWRY 時(shí)間: 2025-3-28 03:01
Daniel Kleppnerve housing unit method (D-HUM). The results suggest that spatial remediation does little to improve accuracy at the municipal level, and although both sets of component estimates represented significant improvements over the Census 2000 constant estimates, neither out-performed the (D-HUM) procedure作者: 坦白 時(shí)間: 2025-3-28 07:29 作者: 向外才掩飾 時(shí)間: 2025-3-28 14:30 作者: 浪費(fèi)時(shí)間 時(shí)間: 2025-3-28 16:07 作者: 確定無疑 時(shí)間: 2025-3-28 21:01 作者: Ordnance 時(shí)間: 2025-3-28 23:00 作者: 紅腫 時(shí)間: 2025-3-29 06:07
Yervant Terzianny disciplines. By considering several perspectives we arrive at a composite view that challenges the applicability and effectiveness of purely technological risk analysis (as distinct from organisational risk analysis). This chapter highlights different perspectives that contribute towards an inter作者: 嚙齒動(dòng)物 時(shí)間: 2025-3-29 10:07
P. G. Mezger the complex mechanisms that characterize the emergence of risk in technology innovation, .Emerging Technological Risk. bridges contributions from many disciplines in order to sustain a fruitful debate. .Emerging Technological Risk. is one of a series of books developed by the Dependability Interdis作者: ALT 時(shí)間: 2025-3-29 14:42
Diego A. Cesarsky the complex mechanisms that characterize the emergence of risk in technology innovation, .Emerging Technological Risk. bridges contributions from many disciplines in order to sustain a fruitful debate. .Emerging Technological Risk. is one of a series of books developed by the Dependability Interdis作者: Explosive 時(shí)間: 2025-3-29 19:10 作者: 諷刺 時(shí)間: 2025-3-29 20:21
Robert L. Brownevelopment by non-conventional antigens. We then propose several DL-based platforms to utilize for future applications regarding the latest publications and medical reports. Considering the evolving date on COVID-19 and its ever-changing nature, we believe this survey can give readers some useful id作者: FLASK 時(shí)間: 2025-3-30 00:57
Edith Falgaronemance by increasing F. or lower power by lowering V. during favorable operating conditions. Since most systems usually operate at nominal conditions where worst-case scenarios rarely occur, these infrequent dynamic variations severely limit the performance and energy efficiency of conventional micro作者: semiskilled 時(shí)間: 2025-3-30 06:58
M. R. Viner,V. A. Hughesmance by increasing F. or lower power by lowering V. during favorable operating conditions. Since most systems usually operate at nominal conditions where worst-case scenarios rarely occur, these infrequent dynamic variations severely limit the performance and energy efficiency of conventional micro作者: 一美元 時(shí)間: 2025-3-30 09:28
mance by increasing F. or lower power by lowering V. during favorable operating conditions. Since most systems usually operate at nominal conditions where worst-case scenarios rarely occur, these infrequent dynamic variations severely limit the performance and energy efficiency of conventional micro作者: 勾引 時(shí)間: 2025-3-30 15:54
T. Paulsl the damage, the plasma-induced defects in Si surface layer should be quantitatively estimated, and then, plasma designs should be optimized. Defect generation probability was proposed from an optical analysis as a measure of the damage [7], on one hand. With regard to plasma design, on the other, 作者: Mettle 時(shí)間: 2025-3-30 17:53
0067-0057 ld and discuss these questions of interpretation. A broad concensus has emerged: the subtleties of the line-formation process are understood, and the conditions978-94-009-9026-5978-94-009-9024-1Series ISSN 0067-0057 Series E-ISSN 2214-7985 作者: 不足的東西 時(shí)間: 2025-3-31 00:15
Nino Panagia.Emerging Technological Risk. bridges contributions from many disciplines in order to sustain a fruitful debate. .Emerging Technological Risk. is one of a series of books developed by the Dependability Interdis978-1-4471-5993-3978-1-4471-2143-5作者: Substance 時(shí)間: 2025-3-31 03:29 作者: 沉著 時(shí)間: 2025-3-31 05:12
