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標題: Titlebook: On-line Error Detection and Fast Recover Techniques for Dependable Embedded Processors; Matthias Pflanz Book 2002 Springer-Verlag Berlin H [打印本頁]

作者: Sediment    時間: 2025-3-21 19:32
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作者: HAUNT    時間: 2025-3-21 23:20

作者: gain631    時間: 2025-3-22 02:14
0302-9743 Overview: Includes supplementary material: 978-3-540-43318-7978-3-540-45858-6Series ISSN 0302-9743 Series E-ISSN 1611-3349
作者: crockery    時間: 2025-3-22 07:23
Matthias PflanzIncludes supplementary material:
作者: Emg827    時間: 2025-3-22 09:53

作者: 明智的人    時間: 2025-3-22 16:54

作者: 復(fù)習(xí)    時間: 2025-3-22 18:28
es of pumps by designing more ef cient pumps and by using the latest technologies available in terms of design software, new developed materials, and state of the art manufacturing tools. Today, computational u978-3-642-06421-0978-3-540-68214-1
作者: Lethargic    時間: 2025-3-22 21:13
Matthias Pflanzes of pumps by designing more ef cient pumps and by using the latest technologies available in terms of design software, new developed materials, and state of the art manufacturing tools. Today, computational u978-3-642-06421-0978-3-540-68214-1
作者: 焦慮    時間: 2025-3-23 01:40

作者: 流利圓滑    時間: 2025-3-23 08:27
es of pumps by designing more ef cient pumps and by using the latest technologies available in terms of design software, new developed materials, and state of the art manufacturing tools. Today, computational u978-3-642-06421-0978-3-540-68214-1
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作者: 引水渠    時間: 2025-3-23 20:14
Matthias Pflanznufacturing companies and design engineers are constantly trying to improve the performances of pumps by designing more ef cient pumps and by using the latest technologies available in terms of design software, new developed materials, and state of the art manufacturing tools. Today, computational u
作者: ABYSS    時間: 2025-3-24 00:51

作者: 朋黨派系    時間: 2025-3-24 04:19

作者: Introduction    時間: 2025-3-24 09:50
2. Fault Models and Fault-Behavior of Processor Structures,nductor) transistor circuits, the silicon oxide is used as an insulation material and as the gate oxide. Therefore, . are a common reason for transistor failures. If the gate oxide is too thin, for instance, the transistor is susceptible to permanent gate damage by voltage peaks. Also, material poll
作者: 極為憤怒    時間: 2025-3-24 14:32

作者: accomplishment    時間: 2025-3-24 17:13
On-line Error Detection and Fast Recover Techniques for Dependable Embedded Processors
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作者: Critical    時間: 2025-3-25 07:24

作者: effrontery    時間: 2025-3-25 08:33
s and peripheral systems.The complete reference book for TurPumps are one of the mechanical devices that are widely used in many industries throughout the world. Turbopumps which are common types of pumps are used mainly for transporting water in agricultural units, industrial processes, cooling and
作者: 星球的光亮度    時間: 2025-3-25 14:43

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作者: 廢墟    時間: 2025-3-25 23:09

作者: Trigger-Point    時間: 2025-3-26 02:25
Matthias Pflanzs and peripheral systems.The complete reference book for TurPumps are one of the mechanical devices that are widely used in many industries throughout the world. Turbopumps which are common types of pumps are used mainly for transporting water in agricultural units, industrial processes, cooling and
作者: 側(cè)面左右    時間: 2025-3-26 06:30

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作者: Expostulate    時間: 2025-3-26 17:23
1. Introduction,ter designs is moving towards single-chip solutions. So called systems-on-chip (SOCs) include various reusable functional blocks such as microprocessors, DSPs, accelerators, memories, and interfaces (embedded cores). The complexity of such systems causes a lot of new problems for developers and user
作者: 地牢    時間: 2025-3-26 22:17

作者: Irascible    時間: 2025-3-27 04:07
3. On-line Check Technology for Processor Components,ient effects or changed system parameters are not detectable in advance by production test techniques..The time diagram outlined in Fig. 16 explains the stages from an effective fault to a system failure. This diagram is based on a figure from Clark and Pradhan in [50]. It shows that an early fault
作者: Intruder    時間: 2025-3-27 06:38
4. On-line Check Technology for Processor Control Signals,less if the wrong function is observed. Controller faults are to be seen in connection with an error latency. It leads often to exceptions, whereby the time of fault occurrence is rarely identifiable. Therefore, a large number of strategies was proposed for control flow check in processors. Mostly u
作者: Ondines-curse    時間: 2025-3-27 10:23
5. Fast Processor Recover Techniques with Micro Rollback, clock cycle. According to Fig. 16, this is a precaution to carry out a fast error handling procedure in order to avoid a functional error. In this thesis, the focus on a fast error detection and recovery is directed at embedded processor- or micro-controller-based applications with a highly safety-
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作者: frozen-shoulder    時間: 2025-3-27 21:36
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