標(biāo)題: Titlebook: Neural Models and Algorithms for Digital Testing; Srimat T. Chakradhar,Vishwani D. Agrawal,Michael L Book 1991 Springer Science+Business M [打印本頁] 作者: Hazardous 時(shí)間: 2025-3-21 19:56
書目名稱Neural Models and Algorithms for Digital Testing影響因子(影響力)
書目名稱Neural Models and Algorithms for Digital Testing影響因子(影響力)學(xué)科排名
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書目名稱Neural Models and Algorithms for Digital Testing網(wǎng)絡(luò)公開度學(xué)科排名
書目名稱Neural Models and Algorithms for Digital Testing被引頻次
書目名稱Neural Models and Algorithms for Digital Testing被引頻次學(xué)科排名
書目名稱Neural Models and Algorithms for Digital Testing年度引用
書目名稱Neural Models and Algorithms for Digital Testing年度引用學(xué)科排名
書目名稱Neural Models and Algorithms for Digital Testing讀者反饋
書目名稱Neural Models and Algorithms for Digital Testing讀者反饋學(xué)科排名
作者: 閑蕩 時(shí)間: 2025-3-21 23:53
Srimat T. Chakradhar,Vishwani D. Agrawal,Michael L. Bushneil作者: bioavailability 時(shí)間: 2025-3-22 00:30
Srimat T. Chakradhar,Vishwani D. Agrawal,Michael L. Bushneil作者: 古董 時(shí)間: 2025-3-22 04:49 作者: 條街道往前推 時(shí)間: 2025-3-22 10:05
Srimat T. Chakradhar,Vishwani D. Agrawal,Michael L. Bushneil作者: Amplify 時(shí)間: 2025-3-22 12:56 作者: Genistein 時(shí)間: 2025-3-22 19:12 作者: keloid 時(shí)間: 2025-3-22 22:33 作者: 發(fā)誓放棄 時(shí)間: 2025-3-23 01:41 作者: CREEK 時(shí)間: 2025-3-23 08:33
Srimat T. Chakradhar,Vishwani D. Agrawal,Michael L. Bushneil作者: 露天歷史劇 時(shí)間: 2025-3-23 13:03
Srimat T. Chakradhar,Vishwani D. Agrawal,Michael L. Bushneil作者: 預(yù)兆好 時(shí)間: 2025-3-23 15:02
Srimat T. Chakradhar,Vishwani D. Agrawal,Michael L. Bushneil作者: ODIUM 時(shí)間: 2025-3-23 19:27 作者: 敬禮 時(shí)間: 2025-3-23 23:29
Srimat T. Chakradhar,Vishwani D. Agrawal,Michael L. Bushneil作者: BOAST 時(shí)間: 2025-3-24 02:32
Srimat T. Chakradhar,Vishwani D. Agrawal,Michael L. Bushneil作者: TEM 時(shí)間: 2025-3-24 09:24
Srimat T. Chakradhar,Vishwani D. Agrawal,Michael L. Bushneil作者: 深淵 時(shí)間: 2025-3-24 11:52 作者: 難管 時(shí)間: 2025-3-24 16:24
Transitive Closure And Testing,in the circuit. Since the implication graph only includes pairwise (or binary) relations, it is a partial representation of the netlist. The transitive closure of the implication graph contains pairwise logical relationships among all signals. When signal relationships describing fault activation an作者: SSRIS 時(shí)間: 2025-3-24 19:56 作者: 搖擺 時(shí)間: 2025-3-24 23:46
Srimat T. Chakradhar,Vishwani D. Agrawal,Michael L作者: Deceit 時(shí)間: 2025-3-25 05:42 作者: tympanometry 時(shí)間: 2025-3-25 11:03 作者: Climate 時(shí)間: 2025-3-25 12:53
Parallel Processing Preliminaries,. One method uses an array of cooperating processors, suitably synchronized by a clocking mechanism, such that each develops a part of the solution that it shares with other neighbors. The other method uses . and is a radically different way of parallel processing. These networks are interconnection作者: Peristalsis 時(shí)間: 2025-3-25 18:42 作者: 冥想后 時(shí)間: 2025-3-25 20:37 作者: Canary 時(shí)間: 2025-3-26 01:45
Test Generation Reformulated,ulation captures three . and . conditions that any set of signal values must satisfy to be a test. First, the set of values must be consistent with each gate’s function in the circuit. Second, the signal in the fault-free and faulty circuits at the fault site must assume opposite values (e.g., 0 and作者: 鞭打 時(shí)間: 2025-3-26 05:49
Simulated Neural Networks,etworks [2, 5]. We describe algorithms for simulating the neural network on a serial computer and discuss possible implementations of these algorithms on parallel computers. Chapter 8 discusses test generation on a commercial hardware accelerator for neural network simulatioa作者: Gourmet 時(shí)間: 2025-3-26 08:32
Neural Computers,roblem for digital circuits. In later chapters, we will research several applications of the discrete models. However, the real neurons are analog elements and we must examine how well the present solution will work if actual neural network hardware was available. In this chapter, we present a solut作者: 替代品 時(shí)間: 2025-3-26 16:10 作者: Banquet 時(shí)間: 2025-3-26 19:47 作者: Amnesty 時(shí)間: 2025-3-26 22:48
Solving Graph Problems,ided design. Our solution is based on a novel transformation of the graph to a logic circuit. The vertices in the graph are encoded with Boolean variables whose relationships are represented in the logic circuit. The transformation is derived from the energy relation of the neural network model of t作者: 無表情 時(shí)間: 2025-3-27 02:53 作者: PET-scan 時(shí)間: 2025-3-27 07:24 作者: 語源學(xué) 時(shí)間: 2025-3-27 10:48 作者: 開頭 時(shí)間: 2025-3-27 15:01 作者: Engaged 時(shí)間: 2025-3-27 18:35
Test Generation Reformulated,ch gate’s function in the circuit. Second, the signal in the fault-free and faulty circuits at the fault site must assume opposite values (e.g., 0 and 1 respectively, for a s-a-1 fault). Third, for the same primary input vector, the fault-free and faulty circuits should produce different output values.作者: 腫塊 時(shí)間: 2025-3-28 01:23 作者: 上流社會 時(shí)間: 2025-3-28 03:59 作者: DOSE 時(shí)間: 2025-3-28 09:46 作者: Palatial 時(shí)間: 2025-3-28 11:31 作者: 浪蕩子 時(shí)間: 2025-3-28 15:38
Neural Computers,ion to the test generation problem using a neurocomputer that contains special hardware to perform energy minimization for analog neural networks [4]. We also wrote a computer program on a SUN 3/50 workstation to simulate the network. Both results are in agreement and demonstrate the feasibility of our approach.作者: stress-response 時(shí)間: 2025-3-28 20:21
Solving Graph Problems,he logic circuit. Each input vector provides one solution of the independent set problem. The independent set consists of only vertices with true encoding. This new methodology has the potential of solving the problem in real time if programmable logic is used [8].作者: Hla461 時(shí)間: 2025-3-29 02:34 作者: 強(qiáng)制性 時(shí)間: 2025-3-29 06:19
Quadratic 0-1 Programming,Once the test generation problem has been formulated as an optimization problem on a neural network, several methods can be used to find the minimum of the energy function.作者: Acumen 時(shí)間: 2025-3-29 07:17 作者: 憤怒事實(shí) 時(shí)間: 2025-3-29 14:42
Open Problems,The research reported in the proceeding chapters opens up a new line of thought relating test generation to general optimization problems. We hope the reader will be tempted to find solutions to other currently open problems including the ones listed below:作者: 遺傳 時(shí)間: 2025-3-29 17:40 作者: infatuation 時(shí)間: 2025-3-29 22:49 作者: 整潔 時(shí)間: 2025-3-30 03:05 作者: 法律的瑕疵 時(shí)間: 2025-3-30 04:14 作者: crescendo 時(shí)間: 2025-3-30 10:05
978-1-4613-6767-3Springer Science+Business Media New York 1991作者: monologue 時(shí)間: 2025-3-30 13:59 作者: HALL 時(shí)間: 2025-3-30 17:59
10樓作者: 蘆筍 時(shí)間: 2025-3-31 00:21
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