作者: 可轉(zhuǎn)變 時(shí)間: 2025-3-21 23:33 作者: 分散 時(shí)間: 2025-3-22 02:43
At-speed Test Challenges for Nanometer Technology Designs,wer scan design and pattern generation. Test data run over many dice and wafers can provide valuable diagnostic information that helps foundries and designers ramp up their yields. In this sense, DFT meets DFM and becomes a critical element in the attempt to mitigate process variability.作者: Foolproof 時(shí)間: 2025-3-22 04:59
Hybrid Scan-Based Transition Delay Test,, in industry, is often called LOS+LOC. It provides a fault coverage higher than that of LOS but the design effort still remains high since the scan enable to all scan chains must be timing closed because of using LOS method.作者: Mercurial 時(shí)間: 2025-3-22 09:38 作者: POLYP 時(shí)間: 2025-3-22 13:44
Avoiding Functionally Untestable Faults,t coverage by increasing the chance of detecting non-modeled faults or filled by compression tools to obtain the highest compression to reduce test data volume and test time. However, filling these don‘t-care bits without considering the functionally untestable faults can cause yield loss.作者: 凹室 時(shí)間: 2025-3-22 18:42 作者: 吃掉 時(shí)間: 2025-3-22 23:24
http://image.papertrans.cn/n/image/660848.jpg作者: Carcinoma 時(shí)間: 2025-3-23 03:35 作者: 黑豹 時(shí)間: 2025-3-23 09:28
Screening Small Delay Defects,ts. Resistive open and short are two such defects that cause timing or logic failures in the design. Such defects can cause gross or small delay defects depending on the size of their resistance. It is proven that the population of such defects increases as technology scales, thus increasing small delay defects.作者: 甜食 時(shí)間: 2025-3-23 11:50
Pattern Generation for Power Supply Noise Analysis,formation can benefit both the design and failure anaysis teams. The generated test patterns can also be used for targeting supply noise effects during fabrication test. The design team can use this information to further analyze the power/ground network for driving maximum current to the circuit without affecting the circuit performance.作者: mastoid-bone 時(shí)間: 2025-3-23 16:55 作者: syncope 時(shí)間: 2025-3-23 20:56
Mohammad Tehranipoor,Nisar AhmedIdentifies defects in traditional at-speed test methods.Proposes new techniques and methodologes to improve the overall quality of transition fault tests.Includes discussion of the effects of IR-drop.作者: 雪崩 時(shí)間: 2025-3-24 01:02
a deflated system allows to refine the solution fast and to high accuracy, since the Jacobian matrix is regular and all the usual machinery, e.g. Newton’s method or existence and unicity criteria may be applied. Standard verification methods, based e.g. on interval arithmetic and a fixed point theor作者: scrape 時(shí)間: 2025-3-24 05:04
pairs of surfaces: plane-quadric, plane-torus, circular cylinder-non developable quadric, circular cylinder-torus, cylinder-cylinder, cylinder-cone and cone-cone. These parametrizations are rational in most cases. In the remaining cases the parametrization involves one square root which is well-suit作者: NAVEN 時(shí)間: 2025-3-24 09:06
a deflated system allows to refine the solution fast and to high accuracy, since the Jacobian matrix is regular and all the usual machinery, e.g. Newton’s method or existence and unicity criteria may be applied. Standard verification methods, based e.g. on interval arithmetic and a fixed point theor作者: induct 時(shí)間: 2025-3-24 10:50
ntroduced. In this chapter we present an accessible discussion of several approaches to computing implicitisations numerically. This includes both exact methods for low degree curves, and approximate methods for higher degree surfaces and envelopes. We will also discuss applications of implicitisati作者: Confirm 時(shí)間: 2025-3-24 16:51 作者: 變色龍 時(shí)間: 2025-3-24 19:14
ions and key environmental signals, i.e. light intensity and quality, temperature, soil water availability and carbon dioxide levels. In doing so, we evaluated the concept that endogenous SA functions as an important signaling hormone in the plant’s growth response to a changing environment, even in作者: 預(yù)兆好 時(shí)間: 2025-3-24 23:13 作者: MEEK 時(shí)間: 2025-3-25 07:11
iness enterprises having a large number of subsidiaries around the world. The ERP software suppliers claim that all advances in hardware and software technologies are incorporated in their newer upgrades or versions. Quite a few phrases and terms have been used in this attempt at defining an ERP. Ex作者: syring 時(shí)間: 2025-3-25 10:26
ed interfaces), and then finally into the advanced topics (e.g., shared memory, persistent objects). You will know how to use best practices to make better programs via ABAP objects...What You’ll Learn.Know the latest advancements in ABAP objects with the new SAP Netweaver system.Understand object-o作者: 使長胖 時(shí)間: 2025-3-25 12:35
ation and application, and utilizing low-cost testers are among these challenges. This book discusses these challenges in detail and proposes new techniques and methodologies to improve the overall quality of the transition fault test..978-1-4419-4559-4978-0-387-75728-5作者: 為寵愛 時(shí)間: 2025-3-25 16:05
k provides a brief description and an overview of a specified feature/command, showing and discussing the corresponding code. At the reader‘s option, the user can utilize the accompanying e-resource, where a st978-1-4302-4803-3978-1-4302-4804-0作者: BROOK 時(shí)間: 2025-3-25 20:59
objects). You will know how to use best practices to make better programs via ABAP objects...What You’ll Learn.Know the latest advancements in ABAP objects with the new SAP Netweaver system.Understand object-o978-1-4842-4963-5978-1-4842-4964-2作者: lavish 時(shí)間: 2025-3-26 02:31 作者: 在駕駛 時(shí)間: 2025-3-26 04:37 作者: 耐寒 時(shí)間: 2025-3-26 08:32
Introduction,ects (random or systematic) during production test, and (b) parts that pass or escape the production test but may violate specifications during their operational life. These are referred to as reliability failures. Devices that fail during the early phase of their operational life are called as infa作者: 兒童 時(shí)間: 2025-3-26 14:19
Local At-Speed Scan Enable Generation Using Low-Cost Testers,nable signal to change state in the time period of one functional clock cycle, considerable engineering resources and design efforts are required to close the timing on the scan enable signal. Usually, due to high-speed pin limitation, low-cost testers may not be able to provide the at-speed scan en作者: insidious 時(shí)間: 2025-3-26 19:04
Faster-Than-At-Speed Test Considering IR-drop Effects,tester until a good chip starts to fail. However, considering the test time impact and analysis required for a large test pattern set makes such a solution impractical. Also, it is impossible to apply each test pattern at an individual frequency either due to hardware limitations of the automatic te作者: DEMN 時(shí)間: 2025-3-26 22:06 作者: Fester 時(shí)間: 2025-3-27 02:56 作者: 薄荷醇 時(shí)間: 2025-3-27 07:52
Introduction,edicted. This is achieved through product verification at each stage. ICs go through two main verification processes: 1) design verification and 2) manufacturing test. The goal of manufacturing test is to verify that the ICs were manufactured correctly, assuming that the design was correct. Due to t作者: 易于交談 時(shí)間: 2025-3-27 10:00
At-speed Test Challenges for Nanometer Technology Designs, forgotten. But ICs built at 90 nanometers and below pose new and com-plex challenges for design-for-testability (DFT) tools and techniques. At those geometries, small delay defects become a major contributor to chip failures, but they can‘t be detected by conventional automatic test pattern generat作者: Oafishness 時(shí)間: 2025-3-27 14:26
Local At-Speed Scan Enable Generation Using Low-Cost Testers,sed test methodology, it is common to use transition delay fault model for at-speed testing. The test procedure is to create a transition at a node using scan chains for controllability, capture the results after a time period equal to one system clock cycle, and observe the contents of the scan cha作者: conceal 時(shí)間: 2025-3-27 18:26 作者: 組成 時(shí)間: 2025-3-28 00:58 作者: 粉筆 時(shí)間: 2025-3-28 02:10 作者: integrated 時(shí)間: 2025-3-28 09:27
Screening Small Delay Defects,ts. Resistive open and short are two such defects that cause timing or logic failures in the design. Such defects can cause gross or small delay defects depending on the size of their resistance. It is proven that the population of such defects increases as technology scales, thus increasing small d作者: 殺人 時(shí)間: 2025-3-28 13:11 作者: 愉快么 時(shí)間: 2025-3-28 14:41
IR-drop Tolerant At-speed Test Pattern Generation,signs to supply voltage noise is increasing. The supply noise is much larger during at-speed delay test compared to normal circuit operation since large number of transitions occur within a short time frame. Existing commercial ATPG tools do not consider the excessive supply noise that might occur i作者: Explosive 時(shí)間: 2025-3-28 18:56
Pattern Generation for Power Supply Noise Analysis,formation can benefit both the design and failure anaysis teams. The generated test patterns can also be used for targeting supply noise effects during fabrication test. The design team can use this information to further analyze the power/ground network for driving maximum current to the circuit wi作者: 指數(shù) 時(shí)間: 2025-3-28 23:56 作者: 撤退 時(shí)間: 2025-3-29 05:51
Testing SoC Interconnects for Signal Integrity,uck-at fault model can detect bridge and open faults. But, transient, timing, and noise related faults cannot be detected using traditional stuck-at and delay test patterns. New design-for-test (DFT) methods and pattern generation algorithms are required to effectively consider such faults in high-s作者: agitate 時(shí)間: 2025-3-29 09:39
of the . of the system do not apply when the latter has a non-trivial kernel. Therefore they require special treatment. The algebraic information regarding an isolated singularity can be captured by a finite, local basis of differentials expressing the . of the point.In the present article, we revie作者: Militia 時(shí)間: 2025-3-29 12:14 作者: offense 時(shí)間: 2025-3-29 18:55
of the . of the system do not apply when the latter has a non-trivial kernel. Therefore they require special treatment. The algebraic information regarding an isolated singularity can be captured by a finite, local basis of differentials expressing the . of the point.In the present article, we revie作者: Galactogogue 時(shí)間: 2025-3-29 19:44
D/CAM software has long been plagued by problems of robustness when it comes to modelling the results of operations such as intersections. Such geometries can lack watertightness and correct topology, requiring costly repair procedures to be applied prior to analysis or manufacturing. One technique 作者: ARBOR 時(shí)間: 2025-3-30 03:09 作者: syring 時(shí)間: 2025-3-30 06:51 作者: 撤退 時(shí)間: 2025-3-30 08:41
ls - classical and object-oriented - and their relevant stat.SAP ABAP. (Advanced Business Application Programming) offers a detailed tutorial on the numerous features of the core programming platform, used for development for the entire SAP software suite. .SAP ABAP. uses hands on business oriented
