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標(biāo)題: Titlebook: Low-Frequency Noise in Advanced MOS Devices; Martin von Haartman,Mikael ?stling Book 2007 Springer Science+Business Media B.V. 2007 1/f no [打印本頁]

作者: CANTO    時(shí)間: 2025-3-21 18:33
書目名稱Low-Frequency Noise in Advanced MOS Devices影響因子(影響力)




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書目名稱Low-Frequency Noise in Advanced MOS Devices網(wǎng)絡(luò)公開度學(xué)科排名




書目名稱Low-Frequency Noise in Advanced MOS Devices被引頻次




書目名稱Low-Frequency Noise in Advanced MOS Devices被引頻次學(xué)科排名




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書目名稱Low-Frequency Noise in Advanced MOS Devices讀者反饋學(xué)科排名





作者: machination    時(shí)間: 2025-3-21 22:56
Low-Frequency Noise in Advanced MOS Devices978-1-4020-5910-0Series ISSN 1872-082X Series E-ISSN 2197-1854
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作者: 空氣    時(shí)間: 2025-3-22 13:36
1872-082X k ends with an introduction to noise in analog/RF circuits and describes how the low-frequency noise can affect these circuits. .978-90-481-7472-0978-1-4020-5910-0Series ISSN 1872-082X Series E-ISSN 2197-1854
作者: Decibel    時(shí)間: 2025-3-22 20:07
Martin von Haartman,Mikael ?stlingf this book provides the motivation for exploring the specific feature for LID task, and subsequently discuss the methods to extract those features and finally suggest appropriate models to capture the language978-3-319-17724-3978-3-319-17725-0Series ISSN 2191-737X Series E-ISSN 2191-7388
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作者: monopoly    時(shí)間: 2025-3-23 08:53
Book 2007ce presentations are included in order to give the very latest view on the topics. The book ends with an introduction to noise in analog/RF circuits and describes how the low-frequency noise can affect these circuits. .
作者: 并排上下    時(shí)間: 2025-3-23 12:43
Martin von Haartman,Mikael ?stlingion in speech.Proposes robust signal processing methods for This book discusses the contribution of excitation source information in discriminating language. The authors focus on the excitation source component of speech for enhancement of language identification (LID) performance. Language specific
作者: BUST    時(shí)間: 2025-3-23 15:31
Martin von Haartman,Mikael ?stling of speech for enhancement of language identification (LID) performance. Language specific features are extracted using two different modes: (i) Implicit processing of linear prediction (LP) residual and (ii) Explicit parameterization of linear prediction residual. The book discusses how in implicit
作者: 多嘴    時(shí)間: 2025-3-23 19:17
nd carry high degree of language discrimination information.This book discusses the impact of spectral features extracted from frame level, glottal closure regions, and pitch-synchronous analysis on the performance of language identification systems. In addition to spectral features, the authors exp
作者: 一夫一妻制    時(shí)間: 2025-3-24 01:25
1872-082X y.Low-frequency noise in CMOS devices is examined, discussed.Low-Frequency Noise in Advanced CMOS Devices. begins with an introduction to noise, describing the fundamental noise sources and basic circuit analysis. The characterization of low-frequency noise is discussed in detail and useful practica
作者: BRAND    時(shí)間: 2025-3-24 06:20

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