標(biāo)題: Titlebook: Lock-in Thermography; Basics and Use for E Otwin Breitenstein,Martin Langenkamp Book 20031st edition Springer-Verlag Berlin Heidelberg 2003 [打印本頁] 作者: FETID 時(shí)間: 2025-3-21 19:11
書目名稱Lock-in Thermography影響因子(影響力)
書目名稱Lock-in Thermography影響因子(影響力)學(xué)科排名
書目名稱Lock-in Thermography網(wǎng)絡(luò)公開度
書目名稱Lock-in Thermography網(wǎng)絡(luò)公開度學(xué)科排名
書目名稱Lock-in Thermography被引頻次
書目名稱Lock-in Thermography被引頻次學(xué)科排名
書目名稱Lock-in Thermography年度引用
書目名稱Lock-in Thermography年度引用學(xué)科排名
書目名稱Lock-in Thermography讀者反饋
書目名稱Lock-in Thermography讀者反饋學(xué)科排名
作者: myalgia 時(shí)間: 2025-3-21 23:04 作者: fodlder 時(shí)間: 2025-3-22 03:02 作者: Incisor 時(shí)間: 2025-3-22 05:38
Book 20031st editionthe 1990s in connection with the nondestructive testing of materials (NDT, espe- cially photothermal and thermoelastic investigations). In the early 1990s our group at the Max Planck Institute of Microstructure Physics in Halle had the task to image small leakage currents in silicon solar cells. We 作者: 罐里有戒指 時(shí)間: 2025-3-22 09:14
Otwin Breitenstein,Martin LangenkampFirst book on lock-in thermography, an analytical method applied to the diagnosis of microelectronic devices.Includes supplementary material: 作者: 類人猿 時(shí)間: 2025-3-22 13:07 作者: foliage 時(shí)間: 2025-3-22 17:39 作者: GRATE 時(shí)間: 2025-3-22 23:56 作者: 阻塞 時(shí)間: 2025-3-23 05:25 作者: 不可救藥 時(shí)間: 2025-3-23 05:50
Physical and Technical Basics,r describing the figure of merit of different lock-in thermography systems. Section 2.6 deals with the problem of an easy and reliable calibration of lock-in thermography measurement systems by using a resistively heated test structure. The special technique of synchronous undersampling, which allow作者: Control-Group 時(shí)間: 2025-3-23 10:36 作者: 英寸 時(shí)間: 2025-3-23 16:34 作者: 碌碌之人 時(shí)間: 2025-3-23 21:48 作者: PATRI 時(shí)間: 2025-3-23 23:39 作者: 嘴唇可修剪 時(shí)間: 2025-3-24 02:24
Book 20031st edition impractica- ble for general use, since it worked in a mechanical contacting mode, and its measurement time was necessarily many hours. With the availability of highly sensitive focal plane array thermocameras at the end of the 1990s, the way was opened to construct highly sensitive IR-based lock-in作者: 賞錢 時(shí)間: 2025-3-24 08:15 作者: 王得到 時(shí)間: 2025-3-24 12:21 作者: Assemble 時(shí)間: 2025-3-24 18:28
Physical and Technical Basics,graphy. In Sect. 2.2, the principles of the lock-in technique itself and of its digital realization are described. In Sect. 2.3, the two principal variants of lock-in thermography, which are serially measuring systems and camera-based systems, are introduced and compared. Section 2.4 discusses the i作者: frenzy 時(shí)間: 2025-3-24 20:21
Experimental Technique,dy-state, showing the large variety of thermography measurement possibilities. Many of these systems are not called thermography but rather thermo-AFM, or photothermal or thermo-elastic investigations. But, in principle, they are all designed to measure lateral surface temperature distributions, and作者: 歌劇等 時(shí)間: 2025-3-25 02:41 作者: 全國性 時(shí)間: 2025-3-25 06:48
Measurement Strategies,d and illustrated by measurement examples of a typical, thermally thin sample (solar cell) and a thermally thick one (integrated circuit). All these discussions are based on the theoretical findings presented in Chap. 4. Section 5.1 discusses the question which of the images available from a lock-in作者: Silent-Ischemia 時(shí)間: 2025-3-25 09:51 作者: Nonporous 時(shí)間: 2025-3-25 15:13 作者: 我怕被刺穿 時(shí)間: 2025-3-25 18:34
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