標題: Titlebook: Integrated Circuit Test Engineering; Modern Techniques Ian A. Grout Textbook 2006 Springer-Verlag London 2006 Hardware.SPICE.Transistor.Win [打印本頁] 作者: 分類 時間: 2025-3-21 16:25
書目名稱Integrated Circuit Test Engineering影響因子(影響力)
書目名稱Integrated Circuit Test Engineering影響因子(影響力)學科排名
書目名稱Integrated Circuit Test Engineering網(wǎng)絡公開度
書目名稱Integrated Circuit Test Engineering網(wǎng)絡公開度學科排名
書目名稱Integrated Circuit Test Engineering被引頻次
書目名稱Integrated Circuit Test Engineering被引頻次學科排名
書目名稱Integrated Circuit Test Engineering年度引用
書目名稱Integrated Circuit Test Engineering年度引用學科排名
書目名稱Integrated Circuit Test Engineering讀者反饋
書目名稱Integrated Circuit Test Engineering讀者反饋學科排名
作者: 巡回 時間: 2025-3-21 20:52 作者: 愚蠢人 時間: 2025-3-22 03:28
in this new edition. We trust it will continue to be a valuable reference for the food scientist, food processor, food product developer, nutritionist, extension specialist, and student. R S. Igoe Y. H. Hui vii Ingredients A Acacia See Arabic. Acesulfame-K A non-nutritive sweetener, also termed acesulfame pot978-1-4615-6838-4作者: Aerate 時間: 2025-3-22 08:28
in this new edition. We trust it will continue to be a valuable reference for the food scientist, food processor, food product developer, nutritionist, extension specialist, and student. R S. Igoe Y. H. Hui vii Ingredients A Acacia See Arabic. Acesulfame-K A non-nutritive sweetener, also termed acesulfame pot978-1-4615-6838-4作者: Estimable 時間: 2025-3-22 12:38
ns, the new and updated Third Edition provides clear and concise information on currently used additives, including natural ingredients, FDA-approved artificial ingredients, and compounds used in food processing. The dictionary entries, organized in alphabetical order, include information on ingredi作者: BOGUS 時間: 2025-3-22 16:14
ns, the new and updated Third Edition provides clear and concise information on currently used additives, including natural ingredients, FDA-approved artificial ingredients, and compounds used in food processing. The dictionary entries, organized in alphabetical order, include information on ingredi作者: 尊重 時間: 2025-3-22 18:11
Introduction to Integrated Circuit Test Engineering,ess is leading to the evolution of the role of test engineering and the skills set required by the test engineer within a product development team. This chapter will introduce the role of the test engineer and the need to consider the test issues throughout a design development process from design c作者: Expiration 時間: 2025-3-22 22:09
Fabrication Processes for Integrated Circuits,d within a suitable protective housing. The particular fabrication process to use will be dependent on a number of issues including cost, availability, experience in the use of, and circuit component capabilities.作者: 彈藥 時間: 2025-3-23 03:38 作者: 推遲 時間: 2025-3-23 07:35
Memory Test,generation Personal Digital Assistant (PDA), and embedded systems ranging from automotive electronics through to everyday household products. The memory is required to store data and program code that can be accessed and/or modified in a suitable manner.作者: lattice 時間: 2025-3-23 11:50 作者: defibrillator 時間: 2025-3-23 15:26 作者: Chauvinistic 時間: 2025-3-23 18:52 作者: V洗浴 時間: 2025-3-23 22:59
System on a Chip (SoC) Test, once manufactured as a discrete chip-set on a printed circuit board within the single IC itself. A system once composed of multiple ICs can now be realised within a single IC, providing for physical size reduction, and leading to increased operating speed and portability for mobile applications. Th作者: neutralize 時間: 2025-3-24 04:52
Test Pattern Generation and Fault Simulation,onal test. Structural tests are based on the development of test vectors to detect specific faults that are considered to exist in a circuit due to process defects. The generation of the necessary test vectors is undertaken using test pattern generation and fault simulation techniques and tools.作者: DRILL 時間: 2025-3-24 09:13
Automatic Test Equipment (ATE) and Production Test, defect levels. The tests undertaken in production must be suitably comprehensive, but at the lowest cost possible. The role of the physical test equipment is essential to achieving this. During production test, Automatic Test Equipment (ATE) is used to reduce the test times by automating as much of作者: 名次后綴 時間: 2025-3-24 10:48
Test Economics,to identify the cost to test, the different parts that go into the creation and operation of a production test program must be identified, and a value associated with that part. A test economics model can be created which will allow for these costs to be formally defined and analysed.作者: Obedient 時間: 2025-3-24 16:42
Textbook 2006. encapsulates the subject as it stands today. After introductory background from basic testing rules to trends in technology, the reader learns about: fabrication processes; a complete range of detailed tests and procedures; how to design for testability; fault simulation; automatic test equipment 作者: anachronistic 時間: 2025-3-24 20:48 作者: Parabola 時間: 2025-3-25 01:06 作者: 變異 時間: 2025-3-25 04:47
Mixed-Signal Test,ign and analysis of complex circuit and systems. This is achieved by modeling the signals as discrete-time, discrete level events. The interface between the analogue and digital, the mixed-signal interface, provides many challenges to test and the requirement to develop efficient, cost-effective and comprehensive test procedures.作者: 名字 時間: 2025-3-25 09:07
System on a Chip (SoC) Test,alised within a single IC, providing for physical size reduction, and leading to increased operating speed and portability for mobile applications. The system on a chip (SoC) is testament to the recent advances in design methods and fabrication processes. However, this leads to increased problems for test that need to be resolved.作者: Microaneurysm 時間: 2025-3-25 14:05 作者: 展覽 時間: 2025-3-25 16:01 作者: squander 時間: 2025-3-25 23:17 作者: 阻撓 時間: 2025-3-26 02:24 作者: 搖晃 時間: 2025-3-26 08:10
Input-Output Test,Within an Integrated Circuit, the main circuit functionality is performed within the core of the circuit die. However, there is the need to provide for signal I/O and power supply connections between the core of the die and the package. The cells within the periphery of the device provide for this operation.作者: 邊緣 時間: 2025-3-26 12:29 作者: RENAL 時間: 2025-3-26 15:14 作者: 官僚統(tǒng)治 時間: 2025-3-26 18:48 作者: 吸引力 時間: 2025-3-26 23:12
Analogue Test,in particular performing actions such as signal amplification and filtering. Despite the size of the analogue circuits being small in comparison to the digital electronic circuits and systems found today, the testing for analogue specifications is challenging and can be time consuming, and hence of high cost.作者: 低三下四之人 時間: 2025-3-27 04:23
Test Pattern Generation and Fault Simulation,onal test. Structural tests are based on the development of test vectors to detect specific faults that are considered to exist in a circuit due to process defects. The generation of the necessary test vectors is undertaken using test pattern generation and fault simulation techniques and tools.作者: 令人悲傷 時間: 2025-3-27 08:09
Automatic Test Equipment (ATE) and Production Test, defect levels. The tests undertaken in production must be suitably comprehensive, but at the lowest cost possible. The role of the physical test equipment is essential to achieving this. During production test, Automatic Test Equipment (ATE) is used to reduce the test times by automating as much of the test process as practical.作者: 無能性 時間: 2025-3-27 13:19 作者: 善辯 時間: 2025-3-27 14:22
https://doi.org/10.1007/1-84628-173-3Hardware; SPICE; Transistor; Windows; integrated circuit; micro-alloy transistor; organization; system on c作者: glomeruli 時間: 2025-3-27 20:56 作者: 極端的正確性 時間: 2025-3-27 23:51 作者: Campaign 時間: 2025-3-28 05:31 作者: 灌溉 時間: 2025-3-28 07:56
Adrian Curaj,Ligia Deca,Remus Pricopieen, and to deal with risks in an appropriate way. A high degree of resilience is related to a low degree of vulnerability. The attention the term receives may be“a response to a generalized contemporary sense of uncertainty and insecurity and a search for formulas for adaptation and survival” (Christopherson, Michie, & Tyler, 2010).作者: Panacea 時間: 2025-3-28 11:46
Design of Multiprocessor Architecture for Watermarking and Tracing Images Using QR Codeompact format, damaging resiliency and addressing problems of computational costs and time of the existing tracing codes during the accusation step. The whole scheme is adapted to be supported by an embedded architecture. The experimental assessments show that the proposed choice has responded to the different requirements of the application.作者: 藐視 時間: 2025-3-28 14:38
Fabrizia Vollenweider,Hamid Jahankhanin sowie zu Führungsstilen und Ver?nderungsf?higkeit. Ein sogenanntes . beschreibt ein spezielles Spielsystem beim Basketballsport, das vorab einstudiert und trainiert wurde. Diese Setplays werden in einem . aufgelistet, das die Spieler vor Beginn einer Saison von ihrem Coach erhalten. Da auf dem Spi作者: notification 時間: 2025-3-28 20:06
Libin Yang,Wanzhu Xie,Xuemei Qins are particular instances of this general concept. More than that, the generalized interior point regularity conditions stated in the past for the two mentioned situations turn out to be p- ticularizations of the ones given in this general setting. In our investigations, the perturbationapproachrep作者: Adenocarcinoma 時間: 2025-3-29 02:17 作者: Dawdle 時間: 2025-3-29 03:09
0937-7433 t?zahlreichen Aktualisierungen und erweiterten Materialien auf der Website zum Buch?(u.a. Vorlesungsfolien für Dozenten). – Das macht nicht nur Arbeit, sondern Spa?! – Für Psychologie-Studierende und Studierende der?Wirtschafts-, Ingenieurs- und Sozialwissenschaften.978-3-642-41130-4Series ISSN 0937-7433 Series E-ISSN 2512-5214 作者: Chivalrous 時間: 2025-3-29 10:22 作者: Unsaturated-Fat 時間: 2025-3-29 14:53 作者: Bricklayer 時間: 2025-3-29 15:55
utputs of those strategies. This book is a reference material in the field of tissueengineering, and it is very useful for bachelor, M.Sc., and Ph.D. students, researchers, academics, medical, industry, and healthcare professionals from diverse backgrounds.
