標(biāo)題: Titlebook: Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits; Michael L. Bushnell,Vishwani D. Agrawal Textbook 2002 [打印本頁] 作者: Denial 時間: 2025-3-21 19:26
書目名稱Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits影響因子(影響力)
書目名稱Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits影響因子(影響力)學(xué)科排名
書目名稱Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits網(wǎng)絡(luò)公開度
書目名稱Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits網(wǎng)絡(luò)公開度學(xué)科排名
書目名稱Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits被引頻次
書目名稱Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits被引頻次學(xué)科排名
書目名稱Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits年度引用
書目名稱Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits年度引用學(xué)科排名
書目名稱Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits讀者反饋
書目名稱Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits讀者反饋學(xué)科排名
作者: 協(xié)定 時間: 2025-3-21 20:43
Fault Modelingg. Chapters 5 through 8 develop algorithms based on these. In addition,one must gain working knowledge of models used in testing of memory (Chapter 9) and analog circuits (Chapters 10 and 11.) Fault models most likely to gain significance in the near future are the delay fault models discussed in Chapter 12.作者: 嬰兒 時間: 2025-3-22 00:51 作者: 遭遇 時間: 2025-3-22 08:32
DSP-Based Analog and Mixed-Signal Testr most of the analog tests. It is important to understand that analog circuit testing is non-deterministic, and therefore the testing process is statistical and must also deal with electrical noise. As a proportion of total testing costs, the percentage due to analog testing is generally increasing.作者: 民間傳說 時間: 2025-3-22 12:48 作者: Senescent 時間: 2025-3-22 16:41 作者: Senescent 時間: 2025-3-22 20:50 作者: 附錄 時間: 2025-3-22 21:23 作者: diabetes 時間: 2025-3-23 03:51
Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits作者: 武器 時間: 2025-3-23 08:49 作者: 斜坡 時間: 2025-3-23 12:50
Textbook 2002which include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate “foundations” course on electronic testing. Obviously, it is too voluminous for a one-semester co作者: 性滿足 時間: 2025-3-23 16:00
Frontiers in Electronic Testinghttp://image.papertrans.cn/e/image/315632.jpg作者: 漸強(qiáng) 時間: 2025-3-23 18:06 作者: 諷刺滑稽戲劇 時間: 2025-3-24 01:57
Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits978-0-306-47040-0Series ISSN 0929-1296 作者: theta-waves 時間: 2025-3-24 03:29
https://doi.org/10.1007/b117406Standard; VLSI; boundary scan; digital signal processor; drift transistor; integrated circuit; logic; model作者: 串通 時間: 2025-3-24 08:11 作者: 武器 時間: 2025-3-24 13:57 作者: 全神貫注于 時間: 2025-3-24 18:22 作者: 針葉 時間: 2025-3-24 19:11
Philippe Henry,Philippe Nabonnandster. It is not possible to test MCMs at all without the boundary scan standard. The standard supports external testing with an ATE, and boundary scan chain reconfiguration as a pattern generator and response compressor for . (BIST.) The standard is beginning to get widespread usage.作者: 典型 時間: 2025-3-25 02:25 作者: MAIM 時間: 2025-3-25 05:02
Boundary Scan Standardster. It is not possible to test MCMs at all without the boundary scan standard. The standard supports external testing with an ATE, and boundary scan chain reconfiguration as a pattern generator and response compressor for . (BIST.) The standard is beginning to get widespread usage.作者: trigger 時間: 2025-3-25 08:43
VLSI Testing Process and Test Equipment, and low and high current specifications. Functional tests determine whether the internal digital logic and analog sub-systems in the chip behave as intended. The major cost in testing is digital and analog functional tests.Parametric test is a tiny part of the cost,because it is very short,and tes作者: AVANT 時間: 2025-3-25 13:12 作者: 衰老 時間: 2025-3-25 16:16 作者: 淘氣 時間: 2025-3-25 21:54
Boundary Scan Standardster. It is not possible to test MCMs at all without the boundary scan standard. The standard supports external testing with an ATE, and boundary scan chain reconfiguration as a pattern generator and response compressor for . (BIST.) The standard is beginning to get widespread usage.作者: Dna262 時間: 2025-3-26 01:15
Epilogue,e still difficulties, and we have to ask: Is it in serious danger of being replaced? Most cosmologists feel that there is little chance of this happening in the near future. They are convinced that its foundations are as strong as ever, if not stronger. The much publicized structure problem, they sa作者: 抱怨 時間: 2025-3-26 06:55
0302-9743 rnational Conference on Active Media Technology, AMT 2011, held in Lanzhou, China, in September 2011. The 30 revised full papers and 6 keynote talks were carefully reviewed and selected for inclusion in the book. They are grouped in topcial sections on data mining and pattern analysis in active medi作者: bile648 時間: 2025-3-26 10:23
https://doi.org/10.1007/978-3-322-88617-0He continues applying problem-solving and technical skills from his PhD. Ben experienced grief initially leaving academia, but sees it as the best path forward. He advises being realistic about limited academic positions and recognising industry interest in expertise. Ben encourages viewing non-academic careers positively, not as failure.作者: hair-bulb 時間: 2025-3-26 13:22 作者: Obstreperous 時間: 2025-3-26 20:20 作者: 陪審團(tuán)每個人 時間: 2025-3-27 00:48
Jun Deng,Changyou Gaoicients of the differential system depend on time (in this case we say that the system is .) then the representative point will have to contain the time (we then often speak of an .). If some of the coefficients are regarded as adjustable then they also have to be included as coordinates for the rep作者: Capitulate 時間: 2025-3-27 03:17 作者: Inexorable 時間: 2025-3-27 09:12 作者: 注視 時間: 2025-3-27 09:39 作者: instate 時間: 2025-3-27 13:55
,Stabilit?tskriterien,n untersucht. Die dort behandelten Systeme waren so ausgesucht, dass der geschlossene Kreis h?chstens von 2. Ordnung war. Mit Hilfe der Führungs-bzw. St?rübertragungsfunktion und der D?mpfung . wurde gezeigt, dass für . 0 stets Stabilit?t vorliegt, d. h., dass die Regelgr??e nur Schwingungen mit abk作者: 失望昨天 時間: 2025-3-27 19:03
https://doi.org/10.1007/978-3-0348-6724-5teristics of a people who share a common and distinctive culture, religion, and/or language. For purposes of this introduction, the word “culture” refers to the shared knowledge and values of a society, and “ethnicity” refers to that which is derived from a culture, race, or religion, as well as lin
