標(biāo)題: Titlebook: Ellipsometry at the Nanoscale; Maria Losurdo,Kurt Hingerl Book 2013 Springer-Verlag Berlin Heidelberg 2013 Correlation measurements.Kerr S [打印本頁] 作者: 轉(zhuǎn)變 時間: 2025-3-21 17:14
書目名稱Ellipsometry at the Nanoscale影響因子(影響力)
書目名稱Ellipsometry at the Nanoscale影響因子(影響力)學(xué)科排名
書目名稱Ellipsometry at the Nanoscale網(wǎng)絡(luò)公開度
書目名稱Ellipsometry at the Nanoscale網(wǎng)絡(luò)公開度學(xué)科排名
書目名稱Ellipsometry at the Nanoscale被引頻次
書目名稱Ellipsometry at the Nanoscale被引頻次學(xué)科排名
書目名稱Ellipsometry at the Nanoscale年度引用
書目名稱Ellipsometry at the Nanoscale年度引用學(xué)科排名
書目名稱Ellipsometry at the Nanoscale讀者反饋
書目名稱Ellipsometry at the Nanoscale讀者反饋學(xué)科排名
作者: Excitotoxin 時間: 2025-3-21 21:43
Maria Losurdo,Kurt HingerlProvides different aspects and opinion on a rapidly evolving field.Reviews recent applications of polarimetric techniques to nanomaterials.Written by renomed experts in the field.Includes supplementar作者: 坦白 時間: 2025-3-22 02:24
http://image.papertrans.cn/e/image/307761.jpg作者: 無法破譯 時間: 2025-3-22 05:01
J. C. Cox,S. A. Ross,M. Rubinsteintu and real-time characterization of surfaces, interfaces, thin films and nanostructured materials. This chapter identifies the crucial ideas from which the ellipsometry technique derives, provides the key relationships for ellipsometry and presents a brief introduction to the essential ellipsometry configurations and hardware.作者: 失望未來 時間: 2025-3-22 10:32 作者: circumvent 時間: 2025-3-22 13:29
A Brief History and State of the Art of Ellipsometry,tu and real-time characterization of surfaces, interfaces, thin films and nanostructured materials. This chapter identifies the crucial ideas from which the ellipsometry technique derives, provides the key relationships for ellipsometry and presents a brief introduction to the essential ellipsometry configurations and hardware.作者: circumvent 時間: 2025-3-22 19:33
Relationship Between Surface Morphology and Effective Medium Roughness,racted from ellipsometry measurements in an indirect way by modeling the optical response of the material. Since roughness is known to affect the scattering of light on an interface, how roughness is incorporated into these models can affect the outcome of the fitting procedure.作者: rectum 時間: 2025-3-22 23:57 作者: Gudgeon 時間: 2025-3-23 04:30
J. C. Cox,S. A. Ross,M. Rubinsteintu and real-time characterization of surfaces, interfaces, thin films and nanostructured materials. This chapter identifies the crucial ideas from which the ellipsometry technique derives, provides the key relationships for ellipsometry and presents a brief introduction to the essential ellipsometry作者: Melodrama 時間: 2025-3-23 08:15
Emanuela Rosazza Gianin,Carlo Sgarrad of optical characterization. We have chosen to call these instruments Mueller ellipsometers in order to highlight their close relation with instruments traditionally used in ellipsometry. We want to make clear to the reader the place that Mueller ellipsometry takes with respect to standard ellipso作者: 沙文主義 時間: 2025-3-23 12:35 作者: squander 時間: 2025-3-23 15:05 作者: ostensible 時間: 2025-3-23 19:34
Bernd Luderer,Volker Nollau,Klaus Vetterscales. Plasmons, plasmon polaritons, and dielectric responses at the effective-medium level all involve screening charge that develops at the boundaries between different media, and hence are all related. The purposes of this work are to develop, from a fundamental perspective, these connections; to作者: mendacity 時間: 2025-3-24 01:32 作者: 泥土謙卑 時間: 2025-3-24 04:17
,Letters on Molodenskiy’s Problem,years, also negative index materials. For the visible range a further miniaturization of the feature sizes of these metamaterials is necessary. Advanced fabrication facilities as well as investigation techniques are required by science and industry. This chapter deals with spectroscopic ellipsometry作者: Infusion 時間: 2025-3-24 09:53 作者: 天真 時間: 2025-3-24 13:22 作者: Hyaluronic-Acid 時間: 2025-3-24 16:31
https://doi.org/10.1007/978-3-662-62521-7pic dielectric properties of highly spatially coherent three-dimensionally nanostructured thin films in the spectral range from 400 to 1700?nm. The analysis of metal slanted columnar thin films fabricated by glancing angle deposition reveals their monoclinic optical properties and their optical resp作者: FUSC 時間: 2025-3-24 20:38 作者: 文件夾 時間: 2025-3-25 00:30
The Bent Pin Problem—IV: Limit Methods state researchers, both experimentalists and theoreticians. The understanding of cuprates at the microscopic level remains one of central problems of the present solid state physics [., .]. Among the key issues, the origin of the superconductivity and the unusual pseudogap phase are most intensely 作者: 針葉 時間: 2025-3-25 07:18 作者: 咆哮 時間: 2025-3-25 07:55 作者: 描述 時間: 2025-3-25 13:35 作者: 積習(xí)難改 時間: 2025-3-25 15:50
Overdetermined and Underdetermined Systemsics is the most prevalent nanotechnology. The continued decrease in device feature size has challenged spectroscopic ellipsometry (SE) with nano-films, nanowires, and nano-dots. There are many examples of the measurement of thin dielectric films [2, 3], and now there are examples of crystalline semi作者: nettle 時間: 2025-3-25 23:09 作者: Rustproof 時間: 2025-3-26 00:39 作者: CAJ 時間: 2025-3-26 07:55 作者: 保全 時間: 2025-3-26 12:11 作者: LUCY 時間: 2025-3-26 13:46
Spectroscopic Ellipsometry of Nanoscale Materials for Semiconductor Device Applications,, nanowires, and nano-dots. There are many examples of the measurement of thin dielectric films [2, 3], and now there are examples of crystalline semiconductor nanowires in the form of the Fin in the transistor known as a Fin-FET [4]. The semiconductor industry is also working on materials for “beyond CMOS” devices.作者: 導(dǎo)師 時間: 2025-3-26 19:05
Ellipsometry of Semiconductor Nanocrystals,ielectric function of single-crystalline semiconductors can be determined on high quality reference materials. The accuracy of the reference data depends mostly on the numerical or experimental elimination of the surface effects like oxides, nanoroughness, contamination, etc.作者: 火車車輪 時間: 2025-3-26 20:58
https://doi.org/10.1007/3-540-28506-7lity of the commonly used Maxwell Garnett approximation to model these films. The possibilities and limits of this approach is illustrated with several examples. A short outlook towards the ellipsometric analysis of metamaterials is given.作者: Regurgitation 時間: 2025-3-27 01:25 作者: adjacent 時間: 2025-3-27 07:21
Bernhard Steffen,Oliver Rüthing,Michael Huthd in the visible region originating from LSP of Au nanoparticles. The influence of . on the MO Kerr properties of the nanocomposite films and the physics underlying the anomalous Kerr rotation are discussed.作者: 自由職業(yè)者 時間: 2025-3-27 13:32 作者: MAUVE 時間: 2025-3-27 16:09 作者: CHOIR 時間: 2025-3-27 19:54 作者: 令人發(fā)膩 時間: 2025-3-28 00:06
ritten by renomed experts in the field.Includes supplementarThis book presents and introduces ellipsometry in nanoscience and nanotechnology making a bridge between the classical and nanoscale optical behaviour of materials. It delineates the role of the non-destructive and non-invasive optical diag作者: PET-scan 時間: 2025-3-28 04:35 作者: 要素 時間: 2025-3-28 09:47
Modelling of Experimental Infections,ielectric function of single-crystalline semiconductors can be determined on high quality reference materials. The accuracy of the reference data depends mostly on the numerical or experimental elimination of the surface effects like oxides, nanoroughness, contamination, etc.作者: MARS 時間: 2025-3-28 11:04
Number Systems and their Arithmetic,esults of its different versions (Sect.?.) and by calculating the differences from exact solutions (Sect.?.). Finally, Sect.?. is devoted to the discussion of possible resonant behaviour of EMA mixtures.作者: 發(fā)微光 時間: 2025-3-28 18:33 作者: Exonerate 時間: 2025-3-28 22:16 作者: FOVEA 時間: 2025-3-29 02:00
Data Analysis for Nanomaterials: Effective Medium Approximation, Its Limits and Implementations,esults of its different versions (Sect.?.) and by calculating the differences from exact solutions (Sect.?.). Finally, Sect.?. is devoted to the discussion of possible resonant behaviour of EMA mixtures.作者: 使閉塞 時間: 2025-3-29 06:35
Plasmonics and Effective-Medium Theory,n teach us about plasmonics; cast plasmonics in a form that can readily be taught to students; and provide introductory references to more extended treatments, for example recent reviews, the light-scattering literature describing grating anomalies, and approaches to metrology.作者: Jubilation 時間: 2025-3-29 10:43 作者: dendrites 時間: 2025-3-29 12:02 作者: Pepsin 時間: 2025-3-29 17:25 作者: 黃油沒有 時間: 2025-3-29 21:10 作者: COLIC 時間: 2025-3-30 02:06 作者: Conjuction 時間: 2025-3-30 07:09 作者: 沙文主義 時間: 2025-3-30 08:17 作者: 完全 時間: 2025-3-30 14:54
Plasmonics and Effective-Medium Theory,cales. Plasmons, plasmon polaritons, and dielectric responses at the effective-medium level all involve screening charge that develops at the boundaries between different media, and hence are all related. The purposes of this work are to develop, from a fundamental perspective, these connections; to作者: Alienated 時間: 2025-3-30 16:44 作者: 庇護(hù) 時間: 2025-3-30 20:58 作者: avulsion 時間: 2025-3-31 02:07
Ellipsometry at the Nanostructure,f a few tens of nanometers are common in the semiconductor industry. This chapter mention about the Stokes vector, the Mueller matrix, the Mueller matrix decomposition to evaluate the surface profiles of nanostructures. The profile of the structure is determined from the Mueller matrix, which expres作者: Permanent 時間: 2025-3-31 06:31
Spectroscopic Ellipsometry and Magneto-Optical Kerr Spectroscopy of Magnetic Garnet Thin Films Incocarried out. The polar MO Kerr spectra in wavelength between 400 and 800?nm show that, by incorporating the Au nanoparticles, Kerr rotation angles become negative values in the region where the localized surface plasmon (LSP) resonance of the Au nanoparticles is located. Spectroscopic ellipsometry w作者: –LOUS 時間: 2025-3-31 12:05
Generalized Ellipsometry Characterization of Sculptured Thin Films Made by Glancing Angle Depositiopic dielectric properties of highly spatially coherent three-dimensionally nanostructured thin films in the spectral range from 400 to 1700?nm. The analysis of metal slanted columnar thin films fabricated by glancing angle deposition reveals their monoclinic optical properties and their optical resp
