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標題: Titlebook: Electron Microbeam Analysis; Abraham Boekestein (Head Department Instrumental A Conference proceedings 1992 Springer-Verlag Wien 1992 cera [打印本頁]

作者: TOUT    時間: 2025-3-21 19:20
書目名稱Electron Microbeam Analysis影響因子(影響力)




書目名稱Electron Microbeam Analysis影響因子(影響力)學科排名




書目名稱Electron Microbeam Analysis網(wǎng)絡(luò)公開度




書目名稱Electron Microbeam Analysis網(wǎng)絡(luò)公開度學科排名




書目名稱Electron Microbeam Analysis被引頻次




書目名稱Electron Microbeam Analysis被引頻次學科排名




書目名稱Electron Microbeam Analysis年度引用




書目名稱Electron Microbeam Analysis年度引用學科排名




書目名稱Electron Microbeam Analysis讀者反饋




書目名稱Electron Microbeam Analysis讀者反饋學科排名





作者: 賠償    時間: 2025-3-21 23:40
Conference proceedings 1992tive analysis of biological samples and standard-less electron-beam microanalysis. Seven introductory lectures and almost seventy poster presentations were given by speakers from twelve European and two non-European (U.S.A. and Argentina) countries were made. One cannot assume that all fields of res
作者: 食道    時間: 2025-3-22 03:44

作者: confederacy    時間: 2025-3-22 07:15

作者: 積云    時間: 2025-3-22 12:14
Maggie Andrews,N. C. Fleming,Marcus Morrisentified by HREM. Defects at or close to the interface were analyzed and a model of the atomistic arrangements of the interface in the relaxed, “perfect” regions is described with a discussion of the results.
作者: Coronation    時間: 2025-3-22 15:53

作者: Coronation    時間: 2025-3-22 18:44
Quantitative X-Ray Microanalysis of Ultra-Thin Resin-Embedded Biological Samples,itivity restrictions usually indicate microanalysis of thin section (≤ 1 μm) by energy dispersive detectors. Amongst briefly reviewed options for production of thin sections, the merits of low temperature freeze-drying, vacuum resin embedding and dry sectioning are presented, particularly for the lo
作者: 種屬關(guān)系    時間: 2025-3-22 22:18

作者: 閑蕩    時間: 2025-3-23 02:00

作者: expository    時間: 2025-3-23 07:45

作者: Dictation    時間: 2025-3-23 15:04
https://doi.org/10.1057/978-1-137-51832-3ger microscopy,. are analyzed in detail by referring, at each step, to the corresponding parameters of electron probe microanalysis (EPMA). Special attention is paid to the surface sensitivity of the two techniques, to the EPMA analysis of a thin coating and to the quantification problems associated
作者: 泥土謙卑    時間: 2025-3-23 18:02

作者: tenuous    時間: 2025-3-24 02:00

作者: Brittle    時間: 2025-3-24 05:53

作者: 情感脆弱    時間: 2025-3-24 06:44
https://doi.org/10.1007/978-3-531-90113-8uccessful models for Φ(ρz): Packwood and Brown’s Gaussian model including Bastin et al.’s and Riveros et al.’s versions, the quadrilateral model proposed by Sewell et al. and Pouchou and Pichoir’s model. In general, all the tested models showed similar performances. Finally the advantages of the mod
作者: padding    時間: 2025-3-24 13:29
https://doi.org/10.1007/978-3-662-39996-5ledge of the Φ(ρz)-distribution with mass depth (ρz) of primary X-rays generated in the target. The Φ(ρz)-expression is evaluated using experimental measurements based on tracer layers and a theoretical approach involving the Monte Carlo method.
作者: Habituate    時間: 2025-3-24 16:59

作者: Gossamer    時間: 2025-3-24 21:37

作者: PAD416    時間: 2025-3-25 01:13

作者: 放縱    時間: 2025-3-25 03:43
https://doi.org/10.1007/978-3-662-32900-9functions for characteristic and continuous radiation. It is shown that both the total generated intensities of characteristic radiation and the distributions in depth are predicted accurately. The deviations in these values with regard to the quantification of the intensities are generally less tha
作者: Sinus-Node    時間: 2025-3-25 11:12
Zur Kritik der musiksoziologischen Vernunfthich the theory is briefly outlined. If the thickness of the Au-contact layer is assumed to be known, the thicknesses of the Si-dead layer and of the Be-window have been determined from a least-squares fit to the experimental data, which were obtained at different X-ray energies. A mathematical simu
作者: 獨特性    時間: 2025-3-25 14:18

作者: 談判    時間: 2025-3-25 16:55
Sinndimensionen: Raum, Zeit, Selbst,model. It is shown that the SRIP-method applied to a non-linear model, converges steadily, if the model is properly chosen and thus, it can be used as a measure of the correctness of the model. This is accomplished by assuming the existence of at least one peak-described by a Gaussian formula-while
作者: neutrophils    時間: 2025-3-25 21:21
https://doi.org/10.1007/978-3-642-94513-7 in the electrostatic field of the cathode lens and in the magnetic field of the single pole-piece lens) is proposed to achieve a higher resolution and the optical properties of the lens are calculated. Preliminary results with the cathode lens in a classical SEM are presented and the new configurat
作者: ELUC    時間: 2025-3-26 03:12
Historische Versuche der Physik For various combinations of metals and thin film materials, data concerning contrasts of the strips in Auger emission are presented. For different configurations the Auger image contrast varies in the magnitude and even contrast reversal is observed in the dependence on the primary energy. It even
作者: Ceremony    時間: 2025-3-26 06:10
https://doi.org/10.1007/978-3-663-10307-3limitations. In particular, cyclotron-based accelerator mass spectrometry (AMS) is discussed with an emphasis on the performances of superconducting minicyclotrons, designed for use as AMS instruments. If ionic and laser microexcitation are used in the ion source, the system would have a considerabl
作者: Camouflage    時間: 2025-3-26 12:02

作者: Tempor    時間: 2025-3-26 16:25

作者: 一條卷發(fā)    時間: 2025-3-26 17:22

作者: aspersion    時間: 2025-3-26 23:41

作者: Ingredient    時間: 2025-3-27 02:00

作者: 顧客    時間: 2025-3-27 06:04

作者: 生來    時間: 2025-3-27 12:22
Background Anomalies in Electron Probe Microanalysis Caused by Total Reflection,istic X-rays cause this effect. The critical angles of total reflection are determined for a set of X-ray lines. It is shown, that total reflection may occur with all analyzing crystals which are used in electron probe microanalysis.
作者: Palpate    時間: 2025-3-27 16:46
978-3-211-82359-0Springer-Verlag Wien 1992
作者: Asparagus    時間: 2025-3-27 17:47

作者: Tonometry    時間: 2025-3-27 23:11
https://doi.org/10.1007/978-3-7091-6679-6ceramics; materials science; metals; spectroscopy; structure
作者: 使習慣于    時間: 2025-3-28 05:42

作者: 包租車船    時間: 2025-3-28 09:54
Auger Microscopy and Electron Probe Microanalysis, with the determination of the Auger backscattering factor or the Φ(0) function in EPMA..Some commonly admitted opinions are reconsidered. The main result is that, in spite of some differences, each technique may benefit from the progress established in the other technique, instead of ignoring each other.
作者: sorbitol    時間: 2025-3-28 14:06

作者: Cardiac    時間: 2025-3-28 16:10
Calculation of Depth Distribution Functions for Characteristic and for Continuous Radiation,n 5% when compared with those given by the model of Pouchou and Pichoir. The calculation of depth distribution curves for continuous radiation reveals that the differences between characteristic and continuous curves are larger than commonly expected. These differences depend on the overvoltage and on the atomic number.
作者: indecipherable    時間: 2025-3-28 22:27
Automatic Analysis of Soft X-Ray Emission Spectra Obtained by EPMA,the SRIP-method is applied in the iterative procedure until convergence is attained. While observing the residuals, the next peak is added to the previous model and the procedure continues. The results are illustrated by examples of oxygen soft X-ray emission spectra deconvolution for periclase, korund, and quartz.
作者: Vasodilation    時間: 2025-3-29 00:26

作者: 前面    時間: 2025-3-29 03:54
https://doi.org/10.1007/978-1-4939-2471-4eaks in order to deal with the strong alterations in the peak shapes that sometimes occur. It is demonstrated that when these effects are properly accounted for and a good matrix correction program in conjunction with consistent mass absorption coefficients is used good quantitative results can be obtained.
作者: Inflated    時間: 2025-3-29 10:59
https://doi.org/10.1007/978-3-531-90113-8sed by Sewell et al. and Pouchou and Pichoir’s model. In general, all the tested models showed similar performances. Finally the advantages of the models related to basic principles over the mathematically optimized ones are considered.
作者: Libido    時間: 2025-3-29 13:44
https://doi.org/10.1007/978-3-642-94443-7ctrons. In the present paper first simulations are discussed with the aim of comparing backscattered electron and secondary electron profiles of wall and trench structures. Special attention is given to the influence of the shape of the target surface topography on the electron backscattering and secondary emission.
作者: CLAP    時間: 2025-3-29 16:04

作者: 停止償付    時間: 2025-3-29 19:43
https://doi.org/10.1007/978-3-642-94513-7d the optical properties of the lens are calculated. Preliminary results with the cathode lens in a classical SEM are presented and the new configuration in an ultra-high- vacuum (UHV) SEM is described.
作者: 飲料    時間: 2025-3-30 02:36
Historische Versuche der Physiknfigurations the Auger image contrast varies in the magnitude and even contrast reversal is observed in the dependence on the primary energy. It even varies for the different constituents of the surface films.
作者: 延期    時間: 2025-3-30 04:38
https://doi.org/10.1007/978-3-663-10307-3inicyclotrons, designed for use as AMS instruments. If ionic and laser microexcitation are used in the ion source, the system would have a considerably better analytical sensitivity and isotope resolution compared to standard SIMS and LMMS techniques.
作者: 遷移    時間: 2025-3-30 11:27

作者: Fester    時間: 2025-3-30 12:24
Quantitative EPMA of the Ultra-Light Elements Boron Through Oxygen,eaks in order to deal with the strong alterations in the peak shapes that sometimes occur. It is demonstrated that when these effects are properly accounted for and a good matrix correction program in conjunction with consistent mass absorption coefficients is used good quantitative results can be obtained.
作者: 注意到    時間: 2025-3-30 19:57
,Comparison of Φ (ρz) Curve Models in EPMA,sed by Sewell et al. and Pouchou and Pichoir’s model. In general, all the tested models showed similar performances. Finally the advantages of the models related to basic principles over the mathematically optimized ones are considered.
作者: 漫步    時間: 2025-3-30 23:58
Monte Carlo Simulation of Backscattered and Secondary Electron Profiles,ctrons. In the present paper first simulations are discussed with the aim of comparing backscattered electron and secondary electron profiles of wall and trench structures. Special attention is given to the influence of the shape of the target surface topography on the electron backscattering and secondary emission.
作者: JAMB    時間: 2025-3-31 02:21

作者: 不易燃    時間: 2025-3-31 07:20

作者: 縱火    時間: 2025-3-31 09:15

作者: ANNUL    時間: 2025-3-31 16:15

作者: ELUDE    時間: 2025-3-31 20:56

作者: Enervate    時間: 2025-3-31 22:18

作者: GULP    時間: 2025-4-1 05:50
https://doi.org/10.1007/978-3-662-32900-9n 5% when compared with those given by the model of Pouchou and Pichoir. The calculation of depth distribution curves for continuous radiation reveals that the differences between characteristic and continuous curves are larger than commonly expected. These differences depend on the overvoltage and on the atomic number.
作者: 戲法    時間: 2025-4-1 09:30
Sinndimensionen: Raum, Zeit, Selbst,the SRIP-method is applied in the iterative procedure until convergence is attained. While observing the residuals, the next peak is added to the previous model and the procedure continues. The results are illustrated by examples of oxygen soft X-ray emission spectra deconvolution for periclase, korund, and quartz.
作者: 剛毅    時間: 2025-4-1 10:20
https://doi.org/10.1007/978-3-030-80087-1alysis is based on combining experiments performed at different electron energies. The operation modes are described with respect to experimental procedures, data reduction models, precision, accuracy and the range of practical applications. . is also related to other techniques of thin film and surface analysis.
作者: 埋伏    時間: 2025-4-1 16:19
,EPMA—A Versatile Technique for the Characterization of Thin Films and Layered Structures,alysis is based on combining experiments performed at different electron energies. The operation modes are described with respect to experimental procedures, data reduction models, precision, accuracy and the range of practical applications. . is also related to other techniques of thin film and surface analysis.
作者: 負擔    時間: 2025-4-1 21:54

作者: 解凍    時間: 2025-4-2 01:14
A Modular Universal Correction Procedure for Quantitative EPMA, less than 5%. The computer program incorporating this method consists of modules allowing microanalysts to tailor input and output to suit their own requirements. The correction program has been written to run on standard IBM-PC compatible machines in a compiled version of BASIC.
作者: 來這真柔軟    時間: 2025-4-2 04:18





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