標(biāo)題: Titlebook: Electron Backscatter Diffraction in Materials Science; Adam J. Schwartz,Mukul Kumar,Brent L. Adams Book 20001st edition Springer Science+B [打印本頁] 作者: 衰退 時(shí)間: 2025-3-21 18:40
書目名稱Electron Backscatter Diffraction in Materials Science影響因子(影響力)
書目名稱Electron Backscatter Diffraction in Materials Science影響因子(影響力)學(xué)科排名
書目名稱Electron Backscatter Diffraction in Materials Science網(wǎng)絡(luò)公開度
書目名稱Electron Backscatter Diffraction in Materials Science網(wǎng)絡(luò)公開度學(xué)科排名
書目名稱Electron Backscatter Diffraction in Materials Science被引頻次
書目名稱Electron Backscatter Diffraction in Materials Science被引頻次學(xué)科排名
書目名稱Electron Backscatter Diffraction in Materials Science年度引用
書目名稱Electron Backscatter Diffraction in Materials Science年度引用學(xué)科排名
書目名稱Electron Backscatter Diffraction in Materials Science讀者反饋
書目名稱Electron Backscatter Diffraction in Materials Science讀者反饋學(xué)科排名
作者: Antimicrobial 時(shí)間: 2025-3-21 23:31
Theoretical Framework for Electron Backscatter Diffraction, exploring radiation must be smaller than the size of the microstructural units themselves. Electrons are ideal for such combined microstructural/crystallographic studies and indeed until the 1980s transmission electron microscopy (TEM) was the major technique used for such work, with some input fro作者: 通情達(dá)理 時(shí)間: 2025-3-22 02:09 作者: fructose 時(shí)間: 2025-3-22 05:09 作者: Occipital-Lobe 時(shí)間: 2025-3-22 09:44 作者: 規(guī)范就好 時(shí)間: 2025-3-22 16:24 作者: 規(guī)范就好 時(shí)間: 2025-3-22 18:23
Phase Identification Using Electron Backscatter Diffraction in the Scanning Electron Microscope,y to obtain crystallographic information about the unknown while observing the microstructure or morphology of the specimen. Electron backscatter diffraction (EBSD) is a technique that can provide identification of unknown crystalline phases while exploiting the excellent imaging capabilities of the作者: 受傷 時(shí)間: 2025-3-22 22:35 作者: flaunt 時(shí)間: 2025-3-23 04:04 作者: 物種起源 時(shí)間: 2025-3-23 08:23
EBSD: Buying a System,articles provide a snapshot of the state-of-the-art hardware and software capabilities at the beginning of the year 2000. However, things are changing very rapidly in this new and exciting field. EBSD is very important. It will revolutionize scanning electron microscopy for all applications that inv作者: EXCEL 時(shí)間: 2025-3-24 00:56 作者: 闡明 時(shí)間: 2025-3-24 05:19 作者: 違反 時(shí)間: 2025-3-24 09:29 作者: FAST 時(shí)間: 2025-3-24 13:35
Characterization of Deformed Microstructures,olycrystalline microstructures. As this tool was championed by the texture analysis community in the early stages of its application to materials research, characterization of deformed materials has been a significant fraction of the EBSD applications research published in the open literature. This 作者: 鞭打 時(shí)間: 2025-3-24 17:05
Anisotropic Plasticity Modeling Incorporating EBSD Characterization of Tantalum and Zirconium,r tantalum and zirconium is covered in this chapter. The focus will be on the role of microtextural investigations as an integral tool supporting the development and validation of material models that incorporate anisotropic constitutive behavior. Continuum mechanics codes require accurate descripti作者: macabre 時(shí)間: 2025-3-24 19:34 作者: Conflict 時(shí)間: 2025-3-25 02:12
obtaining such texture data has been though the use of x-ray or neutron diffraction for bulk texture measurements, or transmission electron microscopy or electron channeling for local crystallographic information. In recent years, we have seen the emergence of a new characterization technique for pr作者: CHARM 時(shí)間: 2025-3-25 04:22
Romina Posch,Christian Alexander Scherb the limitations with respect to accuracy. Experiments were carried out to measure orientation fields from a silicon single crystal. The orientation dispersion was 1°. Disorientation correlation maps revealed anisotropy in the spatial variation in measured orientation.作者: 令人心醉 時(shí)間: 2025-3-25 10:58
Alexander A. Ignatiev,Alexander V. Lyashenkoere, the EBSD technique has proven to be essential. An example of this is studies of recrystallization where approximately 33% of the papers published in the proceedings of the recent international conference (REX′99, 1999) contain EBSD data.作者: 表臉 時(shí)間: 2025-3-25 14:27
Psychosoziale Faktoren der HIV-Infektion,ed as a reference image, or better, that produced by a dedicated forward scattered electron detector. Examples of the use of the camera, image and EBSD data are given to illustrate the Oxford Instruments EBSD system capabilities.作者: floodgate 時(shí)間: 2025-3-25 18:17
Heuristik im Mathematikunterrichtarch, characterization of deformed materials has been a significant fraction of the EBSD applications research published in the open literature. This chapter focuses on the application of EBSD to the characterization of deformed materials.作者: Hemodialysis 時(shí)間: 2025-3-25 20:27
https://doi.org/10.1007/978-3-642-71010-0de information from submicrometer sized phases, but require the preparation of electron transparent samples that is very difficult and time intensive. Phase identification using EBSD is a complementary technique to TEM methods.作者: 失眠癥 時(shí)間: 2025-3-26 02:35
Phase Identification Using Electron Backscatter Diffraction in the Scanning Electron Microscope,de information from submicrometer sized phases, but require the preparation of electron transparent samples that is very difficult and time intensive. Phase identification using EBSD is a complementary technique to TEM methods.作者: 阻止 時(shí)間: 2025-3-26 05:32
Book 20001st editionsuch texture data has been though the use of x-ray or neutron diffraction for bulk texture measurements, or transmission electron microscopy or electron channeling for local crystallographic information. In recent years, we have seen the emergence of a new characterization technique for probing the 作者: Diaphragm 時(shí)間: 2025-3-26 11:26 作者: 他一致 時(shí)間: 2025-3-26 14:00
Three-Dimensional Orientation Imaging,ere, the EBSD technique has proven to be essential. An example of this is studies of recrystallization where approximately 33% of the papers published in the proceedings of the recent international conference (REX′99, 1999) contain EBSD data.作者: 前奏曲 時(shí)間: 2025-3-26 20:10
An Automated EBSD Acquisition and Processing System,ed as a reference image, or better, that produced by a dedicated forward scattered electron detector. Examples of the use of the camera, image and EBSD data are given to illustrate the Oxford Instruments EBSD system capabilities.作者: 談判 時(shí)間: 2025-3-27 00:50
Characterization of Deformed Microstructures,arch, characterization of deformed materials has been a significant fraction of the EBSD applications research published in the open literature. This chapter focuses on the application of EBSD to the characterization of deformed materials.作者: 縱火 時(shí)間: 2025-3-27 01:54
https://doi.org/10.1007/978-94-6300-935-5olve crystalline material. More than that, EBSD will have a major impact on other fields. Many characterization experiments that would have been done using other techniques will now be done, and done better, using EBSD on the scanning electron microscope (SEM).作者: crease 時(shí)間: 2025-3-27 08:27 作者: 打擊 時(shí)間: 2025-3-27 12:40
Risky Bodies? Lesbians and Breast Cancer use EBSD patterns, it has been found that both the hardware and software should be optimized for these different tasks. This chapter will discuss the optimizations deemed necessary for optimal EBSD performance.作者: Spangle 時(shí)間: 2025-3-27 17:10 作者: NAUT 時(shí)間: 2025-3-27 21:32 作者: 消瘦 時(shí)間: 2025-3-28 00:06
Structure-Properties Relations: EBSD-Based Material-Sensitive Design,except in the sense that upon examining a finite neighborhood about any selected point, lying sufficiently close to an interface, from . one can recover the five-parameter macroscopic description of the interface. (For simplicity, the discussion here will concern single-phase polycrystals where . is constant.)作者: 繁重 時(shí)間: 2025-3-28 03:26
The Development of Automated Diffraction in Scanning and Transmission Electron Microscopy,D. Full automation of EBSD in 1991 led to the mapping of crystal orientation over a sample surface and to a new metallography, termed “Orientation Imaging Microscopy” by Adams et al., (1993). It was this innovation that gave rise to the current rapid growth of the technique and to its full commercia作者: adj憂郁的 時(shí)間: 2025-3-28 06:18 作者: 鐵塔等 時(shí)間: 2025-3-28 14:09
Representations of Texture in Orientation Space, these projections of orientation information will be discussed, especially in the context of data representation as derived from EBSD type techniques. These representations form the foundation for most texture analysis studies and will be widely used in the variety of materials science applications作者: FRAX-tool 時(shí)間: 2025-3-28 18:28
Rodrigues-Frank Representations of Crystallographic Texture, too small (such as thin films and nanostructures) to even contain many grains. Yet, while the issues of local texture are still important to assess and interpret in these cases, and while EBSD may provide an experimental means of obtaining texture information, the predominant means of representing 作者: 減去 時(shí)間: 2025-3-28 20:06 作者: 細(xì)胞 時(shí)間: 2025-3-29 02:08
Automated Electron Backscatter Diffraction: Present State and Prospects, orientation contrast in secondary and backscatter electron images, element distributions are accessed by EDS or cathodoluminescence analysis, and the orientations of single grains and phases can now be determined, as a complement, by EBSD.作者: maintenance 時(shí)間: 2025-3-29 03:18 作者: 衰老 時(shí)間: 2025-3-29 08:03
Strategies for Analyzing EBSD Datasets,ll explore additional representations of the EBSD dataseis and data processing software that have been developed to address particular problems encountered during investigations. Specific examples include: “clean-up” of dataseis; mapping of lattice rotations in deformed single crystals; three-dimens作者: 極少 時(shí)間: 2025-3-29 14:15 作者: accessory 時(shí)間: 2025-3-29 17:41
Anisotropic Plasticity Modeling Incorporating EBSD Characterization of Tantalum and Zirconium,uctures. The ability to spatially resolve orientation differences on the order of 100 nm is achievable. All EBSD data collection and analysis was performed with TSL’s OIM? software, while the popLA code (Kallend et al., 1991) was used for x-ray texture analysis.作者: Priapism 時(shí)間: 2025-3-29 23:11
Heterogeneous Wireless Access NetworksD. Full automation of EBSD in 1991 led to the mapping of crystal orientation over a sample surface and to a new metallography, termed “Orientation Imaging Microscopy” by Adams et al., (1993). It was this innovation that gave rise to the current rapid growth of the technique and to its full commercia作者: 小平面 時(shí)間: 2025-3-30 01:28
https://doi.org/10.1007/978-3-531-94209-4n, backscatter Kikuchi diffraction, BKD, is an add-on package to an SEM. The most attractive feature of the technique is its unique capability to perform concurrently rapid, (usually) automatic diffraction analysis to give crystallographic data and imaging with a spatial resolution of less than 0.5 作者: 割讓 時(shí)間: 2025-3-30 07:52 作者: addict 時(shí)間: 2025-3-30 10:47 作者: 我悲傷 時(shí)間: 2025-3-30 12:40
https://doi.org/10.1007/978-3-531-92893-7iffraction bands with a focus on the Hough transform will be given; methods for determining orientation using diffraction bands will be detailed; issues concerning automated indexing uncertainties will be discussed; a description of the relevant structural data needed by the computer to index the pa作者: 共同確定為確 時(shí)間: 2025-3-30 16:57 作者: 命令變成大炮 時(shí)間: 2025-3-30 21:29
Franziska G?tz,Wolfgang Rohde,Günter D?rner (or TexSEM Laboratories) in 1994 to produce the first commercial automated EBSD system based on the system developed by the group at Yale University (Adams, Wright, and Kunze). TSL adopted the name OIM? for its automated EBSD products. Much of what was included in the original TSL system has become作者: exquisite 時(shí)間: 2025-3-31 01:33 作者: 鋼筆尖 時(shí)間: 2025-3-31 05:26 作者: Flavouring 時(shí)間: 2025-3-31 09:30 作者: Substitution 時(shí)間: 2025-3-31 15:19
Book 20001st editionstructures, etc. and is evidence that this technique can, in some cases, replace more time-consuming transmission electron microscope (TEM) or x-ray diffraction investigations. The benefits lie in the fact that the spatial resolution on new field emission scanning electron microscopes (SEM) can appr作者: 哀求 時(shí)間: 2025-3-31 20:04 作者: ligature 時(shí)間: 2025-4-1 01:26 作者: 綠州 時(shí)間: 2025-4-1 05:46 作者: Medicare 時(shí)間: 2025-4-1 06:41
Heterogeneous Wireless Access Networksnsmission electron microscopes. Though electron backscatter diffraction (EBSD) is the best known of these, the procedures have been extended recently to the transmission electron microscope and a review would not be complete without including this new work..From 1973 to 1983, there were only two gro作者: 固定某物 時(shí)間: 2025-4-1 13:05 作者: 單色 時(shí)間: 2025-4-1 14:30 作者: 枯萎將要 時(shí)間: 2025-4-1 22:07 作者: Irrepressible 時(shí)間: 2025-4-1 23:41
https://doi.org/10.1007/978-3-531-92893-7ms required an operator skilled in crystallography to manually identify features in a captured pattern in order to determine the corresponding orientation. The computer would then determine the orientation from the manually supplied data. Modern automated systems use image-processing techniques to i作者: BOOM 時(shí)間: 2025-4-2 02:56
Romina Posch,Christian Alexander Scherbctron backscatter diffraction patterns in a scanning electron microscope. In order to exploit the available information, it is important to understand the limitations with respect to accuracy. Experiments were carried out to measure orientation fields from a silicon single crystal. The orientation d作者: superfluous 時(shí)間: 2025-4-2 09:08 作者: Vaginismus 時(shí)間: 2025-4-2 13:40
