標(biāo)題: Titlebook: Electromagnetic Compatibility of Integrated Circuits; Techniques for low e Sonia Ben Dhia,Mohamed Ramdani,Etienne Sicard Book 2006 Springer [打印本頁] 作者: 貪污 時(shí)間: 2025-3-21 19:28
書目名稱Electromagnetic Compatibility of Integrated Circuits影響因子(影響力)
書目名稱Electromagnetic Compatibility of Integrated Circuits影響因子(影響力)學(xué)科排名
書目名稱Electromagnetic Compatibility of Integrated Circuits網(wǎng)絡(luò)公開度
書目名稱Electromagnetic Compatibility of Integrated Circuits網(wǎng)絡(luò)公開度學(xué)科排名
書目名稱Electromagnetic Compatibility of Integrated Circuits被引頻次
書目名稱Electromagnetic Compatibility of Integrated Circuits被引頻次學(xué)科排名
書目名稱Electromagnetic Compatibility of Integrated Circuits年度引用
書目名稱Electromagnetic Compatibility of Integrated Circuits年度引用學(xué)科排名
書目名稱Electromagnetic Compatibility of Integrated Circuits讀者反饋
書目名稱Electromagnetic Compatibility of Integrated Circuits讀者反饋學(xué)科排名
作者: venous-leak 時(shí)間: 2025-3-21 23:45 作者: barium-study 時(shí)間: 2025-3-22 02:11
Measurement Methods, Concerning susceptibility, we detail the Bulk Current Injection and Direct Power Injection methods from the IEC standard 62132. Furthermore, impulse immunity methods are also described, as well as on-chip measurement approaches for noise characterization.作者: CHAR 時(shí)間: 2025-3-22 07:21
,Die Rutenzugwebstühle für Plüschteppiche,third section deals with transmission lines theory, while the fourth section handles the modeling of RLC passive elements and interconnect in high frequency, the fifth section deals with S-parameter definitions.作者: BET 時(shí)間: 2025-3-22 09:01 作者: cauda-equina 時(shí)間: 2025-3-22 16:02 作者: cauda-equina 時(shí)間: 2025-3-22 19:02 作者: Habituate 時(shí)間: 2025-3-22 21:30
ons between measurements and simulations. Specific guidelines for achieving low emission and susceptibility derived from the experience of EMC experts are presented. .978-1-4614-9831-5978-0-387-26601-5作者: notion 時(shí)間: 2025-3-23 02:37 作者: 不連貫 時(shí)間: 2025-3-23 09:05
Electromagnetic Compatibility of Integrated Circuits978-0-387-26601-5作者: Aura231 時(shí)間: 2025-3-23 13:09 作者: fatuity 時(shí)間: 2025-3-23 16:07 作者: DIS 時(shí)間: 2025-3-23 21:10 作者: 期滿 時(shí)間: 2025-3-24 01:13
Measurement Methods,ard methods promoted by IEC 61967 for emission, namely the TEM/GTEM, the near-field scan, the Workbench Faraday Cage and the 1/150Ω conducted methods. Concerning susceptibility, we detail the Bulk Current Injection and Direct Power Injection methods from the IEC standard 62132. Furthermore, impulse 作者: fulcrum 時(shí)間: 2025-3-24 04:55
Case Studies,icrocontrollers from several IC manufacturers are measured using standard methods and predicted using a macro-modeling approach. Specific test chips dedicated to the characterization of internal switching noise and to the validation of low emission design techniques are also described.作者: Arboreal 時(shí)間: 2025-3-24 08:39
Guidelines,d circuits. Both layout level and package-related guidelines are presented. Concerning immunity, a set of defensive software techniques applicable to microcontrollers is also described. These guidelines have been applied successfully to several commercial products as well as specific test circuits.作者: Pepsin 時(shí)間: 2025-3-24 13:20 作者: 大量 時(shí)間: 2025-3-24 18:55 作者: 帶來 時(shí)間: 2025-3-24 19:35 作者: glacial 時(shí)間: 2025-3-25 01:03
https://doi.org/10.1007/978-3-7091-9790-5and provides an outline of IC modeling for EMC prediction. A brief description of electric and magnetic field coupling, conducted and radiated mode emissions, as well as susceptibility, are also given in this chapter.作者: handle 時(shí)間: 2025-3-25 03:35
María Victoria Juárez,Xiomara Navas wealth of research results has appeared in the last couple of years, and this review aims at describing how new techniques, tools and methods have emerged. Roadmaps for integrated circuits and package, as well as EMC issues are also given in this chapter.作者: Forehead-Lift 時(shí)間: 2025-3-25 11:19
,Die Rutenzugwebstühle für Plüschteppiche,le and useful theory in the EMC field. The first section deals with the basic theory of electromagnetic emission (electrical dipole, magnetic loop, near field and far field approximations), the second section then brings the concept of the Fourier transform and useful units in frequency domain. The 作者: 吹氣 時(shí)間: 2025-3-25 12:01
https://doi.org/10.1007/978-3-663-13179-3ard methods promoted by IEC 61967 for emission, namely the TEM/GTEM, the near-field scan, the Workbench Faraday Cage and the 1/150Ω conducted methods. Concerning susceptibility, we detail the Bulk Current Injection and Direct Power Injection methods from the IEC standard 62132. Furthermore, impulse 作者: chemical-peel 時(shí)間: 2025-3-25 18:49
https://doi.org/10.1007/978-3-662-49210-9icrocontrollers from several IC manufacturers are measured using standard methods and predicted using a macro-modeling approach. Specific test chips dedicated to the characterization of internal switching noise and to the validation of low emission design techniques are also described.作者: Vldl379 時(shí)間: 2025-3-25 23:23
Die Chirurgie der Weichteile des Mundes,d circuits. Both layout level and package-related guidelines are presented. Concerning immunity, a set of defensive software techniques applicable to microcontrollers is also described. These guidelines have been applied successfully to several commercial products as well as specific test circuits.作者: CHOKE 時(shí)間: 2025-3-26 03:57
https://doi.org/10.1007/978-3-7091-9790-5and provides an outline of IC modeling for EMC prediction. A brief description of electric and magnetic field coupling, conducted and radiated mode emissions, as well as susceptibility, are also given in this chapter.作者: SYN 時(shí)間: 2025-3-26 08:15 作者: flex336 時(shí)間: 2025-3-26 10:49
https://doi.org/10.1007/978-3-662-49210-9icrocontrollers from several IC manufacturers are measured using standard methods and predicted using a macro-modeling approach. Specific test chips dedicated to the characterization of internal switching noise and to the validation of low emission design techniques are also described.作者: indifferent 時(shí)間: 2025-3-26 13:22 作者: creatine-kinase 時(shí)間: 2025-3-26 17:10
Basic Concepts in EMC for ICs,and provides an outline of IC modeling for EMC prediction. A brief description of electric and magnetic field coupling, conducted and radiated mode emissions, as well as susceptibility, are also given in this chapter.作者: 不出名 時(shí)間: 2025-3-27 00:29 作者: magnate 時(shí)間: 2025-3-27 02:53
Case Studies,icrocontrollers from several IC manufacturers are measured using standard methods and predicted using a macro-modeling approach. Specific test chips dedicated to the characterization of internal switching noise and to the validation of low emission design techniques are also described.作者: 發(fā)現(xiàn) 時(shí)間: 2025-3-27 06:04 作者: 蕁麻 時(shí)間: 2025-3-27 10:16 作者: 嘮叨 時(shí)間: 2025-3-27 14:26
Personen und Institutionen der Werbung,This chapter deals with the modeling of parasitic effects and EMC phenomena in integrated circuits. Phenomena such as electrostatic discharge and internal current activity are described first. PCB and package models are provided. An overview of models dealing with emissions (such as ICEM, IBIS, IMIC and LECCS) and with immunity is presented.作者: GUILT 時(shí)間: 2025-3-27 18:48
EMC Modeling,This chapter deals with the modeling of parasitic effects and EMC phenomena in integrated circuits. Phenomena such as electrostatic discharge and internal current activity are described first. PCB and package models are provided. An overview of models dealing with emissions (such as ICEM, IBIS, IMIC and LECCS) and with immunity is presented.作者: 苦笑 時(shí)間: 2025-3-28 00:39
Meaning and Measurement of Adjustment to Aging in Old Age,ent to aging, namely, design considerations, measurement errors, validity and reliability issues, and early and current perspectives regarding the measurement of adjustment to aging are included in this chapter. Furthermore, this chapter debates the urgent need for good-quality psychometric data, su作者: MODE 時(shí)間: 2025-3-28 03:09 作者: 織物 時(shí)間: 2025-3-28 08:37
https://doi.org/10.1007/978-3-540-79539-1ung’s methods, assumptions and conclusions are worthy of sustained and respectful, if critical, attention. The critique of . that follows is therefore able to open on to a wider critique of the kind of ‘cultural criticism’ that has so dominated the thinking of humanist intellectuals in the present c
