標題: Titlebook: Dielectric Breakdown in Gigascale Electronics; Time Dependent Failu Juan Pablo Borja,Toh-Ming Lu,Joel Plawsky Book 2016 The Author(s) 2016 [打印本頁] 作者: 搖尾乞憐 時間: 2025-3-21 18:16
書目名稱Dielectric Breakdown in Gigascale Electronics影響因子(影響力)
書目名稱Dielectric Breakdown in Gigascale Electronics影響因子(影響力)學科排名
書目名稱Dielectric Breakdown in Gigascale Electronics網絡公開度
書目名稱Dielectric Breakdown in Gigascale Electronics網絡公開度學科排名
書目名稱Dielectric Breakdown in Gigascale Electronics被引頻次
書目名稱Dielectric Breakdown in Gigascale Electronics被引頻次學科排名
書目名稱Dielectric Breakdown in Gigascale Electronics年度引用
書目名稱Dielectric Breakdown in Gigascale Electronics年度引用學科排名
書目名稱Dielectric Breakdown in Gigascale Electronics讀者反饋
書目名稱Dielectric Breakdown in Gigascale Electronics讀者反饋學科排名
作者: 聯(lián)合 時間: 2025-3-22 00:06
Book 2016from accelerated lab test conditions. Numerous graphs, tables, and illustrations are included to facilitate understanding of the topics.? Readers will be able to understand dielectric breakdown in thin films along with the main failure modes and characterization techniques. In addition, they will ga作者: NUL 時間: 2025-3-22 02:39 作者: Synovial-Fluid 時間: 2025-3-22 08:36 作者: 嘲弄 時間: 2025-3-22 12:40
Dielectric Breakdown in Gigascale Electronics978-3-319-43220-5Series ISSN 2192-1091 Series E-ISSN 2192-1105 作者: recede 時間: 2025-3-22 13:57
https://doi.org/10.1007/978-3-662-09547-8tes when the dielectric is subjected to electrical stress beyond a critical point. In general, dielectric breakdown mechanisms in amorphous films can be categorized as either intrinsic or extrinsic in nature (He and Sun, ., 2012, p.166). Intrinsic failure corresponds to damage caused by the transpor作者: recede 時間: 2025-3-22 18:05
https://doi.org/10.1007/978-3-662-09547-8The fundamental concepts for each theory are presented as initially proposed by the authors. Some of the models explained in this section include the ., 1/., ., power-law, and the metal-catalyzed failure model. Commentary on the limitations for each model is provided. In the latter part of this chap作者: 存在主義 時間: 2025-3-22 23:58
Diagnostik, Nosologie, Klassifikatione range of instruments includes both bench-top and large throughput systems. Bench-top systems are conventionally used to gather information about fundamental material and device properties, while large throughput systems provide significant advantages for gathering statistically meaningful data on 作者: 枯萎將要 時間: 2025-3-23 01:27
Affektive Psychosen: Melancholie und Manielained along with potential limitations. The chapter is divided into three parts: breakdown assessment, material characterization, and interfacial/bulk composition analysis. Tests presented in this section for breakdown will include constant bias, constant current, ramped voltage, ramped current, an作者: FEAT 時間: 2025-3-23 07:56
Das Problem der Involutionspsychosen. Techniques such as ramped voltage sweeps and bipolar applied field tests are utilized to characterize fundamental aspects of breakdown in thin low-. films. We studied intrinsic breakdown using inert (Au) and self-limiting electrodes (Al). Metal-catalyzed failure was investigated by employing react作者: inflame 時間: 2025-3-23 12:04
Cyclothymien: Melancholie und Manie order to gain insight into the interplay between the various charged species contributing to dielectric failure (i.e., electrons, traps, and ions). A novel detection method for identifying ion drift in interconnect devices is presented. This technique is based on the change in charge fluence as a r作者: 無關緊要 時間: 2025-3-23 15:01
Disziplinen der Nervenheilkunde presented to describe mechanisms that can result in failure. In addition, it was discussed how such mechanisms can be affected by material properties, fabrication steps, and type of stress. Complex concepts have been reduced to empirical expression and fitting parameters. These methodologies have b作者: 共同時代 時間: 2025-3-23 20:04
Disziplinen der Nervenheilkundetric breakdown as caused by the transport of charge carriers and the formation of traps. In this chapter, the role of Cu and ionic species on catalyzing dielectric failure is explored and integrated into the theory. Experimental evidence demonstrating the presence and transport of ions is discussed.作者: Evolve 時間: 2025-3-24 00:49
Cyclothymien: Melancholie und Manieactive feature of the model developed in Chap. . rests on its ability to make predictions on dielectric breakdown at low fields from data collected at high fields without needing to use empirical field acceleration formulas. In this chapter, we discuss estimates from the model and compare these with作者: Axon895 時間: 2025-3-24 03:54 作者: defibrillator 時間: 2025-3-24 07:31 作者: Celiac-Plexus 時間: 2025-3-24 11:27 作者: 缺陷 時間: 2025-3-24 16:14
Book 2016cs. Coverage includes the most important failure mechanisms for thin low-k films, new and established experimental techniques, recent advances in the area of dielectric failure, and advanced simulations/models to resolve and predict dielectric breakdown, all of which are of considerable importance f作者: Additive 時間: 2025-3-24 19:55
https://doi.org/10.1007/978-3-662-09547-8h faster timescale than intrinsic breakdown. Some of the most common causes of extrinsic failure are metal atoms, ions, and moisture. These foreign species are the result of manufacturing process steps and instabilities in metal/dielectric interfaces (He and Lu, ., 2012, p.127).作者: 流動才波動 時間: 2025-3-25 00:39
Introduction,h faster timescale than intrinsic breakdown. Some of the most common causes of extrinsic failure are metal atoms, ions, and moisture. These foreign species are the result of manufacturing process steps and instabilities in metal/dielectric interfaces (He and Lu, ., 2012, p.127).作者: 粗鄙的人 時間: 2025-3-25 05:30
Affektive Psychosen: Melancholie und Maniel include capacitance–voltage spectroscopy and triangular voltage spectroscopy. These tests can help to identify important charged species inside the dielectric and their impact on failure mechanisms. Secondary ion mass spectrometry and its application to resolving interfacial/bulk dielectric properties will also be explained.作者: facetious 時間: 2025-3-25 09:59
Das Problem der Involutionspsychosen is correlated with field form, polarity, and magnitude. This chapter concludes with a brief discussion of the impact of plasma treatments and moisture on dielectric breakdown and its fundamental failure mechanisms.作者: Notorious 時間: 2025-3-25 14:51
Cyclothymien: Melancholie und Manie and ions). A model is proposed for describing the kinetics of charge trapping at very early stages of field and temperature stress. This section concludes with a mathematical representation of electron trapping that will serve as the premise for the theory of dielectric breakdown in nano-porous films.作者: minion 時間: 2025-3-25 17:42
Experimental Techniques,l include capacitance–voltage spectroscopy and triangular voltage spectroscopy. These tests can help to identify important charged species inside the dielectric and their impact on failure mechanisms. Secondary ion mass spectrometry and its application to resolving interfacial/bulk dielectric properties will also be explained.作者: Ophthalmoscope 時間: 2025-3-25 23:30
Breakdown Experiments, is correlated with field form, polarity, and magnitude. This chapter concludes with a brief discussion of the impact of plasma treatments and moisture on dielectric breakdown and its fundamental failure mechanisms.作者: ABHOR 時間: 2025-3-26 03:50 作者: FADE 時間: 2025-3-26 04:47
Dielectric Breakdown in Copper Interconnects,ng dielectric failure is explored and integrated into the theory. Experimental evidence demonstrating the presence and transport of ions is discussed. Ultimately, a complete depiction of dielectric breakdown as caused by the complex interplay between charged species is presented.作者: Palate 時間: 2025-3-26 10:30 作者: Heretical 時間: 2025-3-26 13:03 作者: Ordnance 時間: 2025-3-26 17:45 作者: 無可非議 時間: 2025-3-26 21:17
General Theories,ter, we will discuss the most recent models for describing reliability trends in contemporary interconnect structures that employ low-. nano-porous films. A general comparison between model predictions at low field is presented.作者: 胰島素 時間: 2025-3-27 03:16 作者: debouch 時間: 2025-3-27 09:17 作者: 變態(tài) 時間: 2025-3-27 10:16 作者: 以煙熏消毒 時間: 2025-3-27 16:43 作者: 哄騙 時間: 2025-3-27 18:21
Introduction,tes when the dielectric is subjected to electrical stress beyond a critical point. In general, dielectric breakdown mechanisms in amorphous films can be categorized as either intrinsic or extrinsic in nature (He and Sun, ., 2012, p.166). Intrinsic failure corresponds to damage caused by the transpor作者: bleach 時間: 2025-3-27 23:34
General Theories,The fundamental concepts for each theory are presented as initially proposed by the authors. Some of the models explained in this section include the ., 1/., ., power-law, and the metal-catalyzed failure model. Commentary on the limitations for each model is provided. In the latter part of this chap作者: Myofibrils 時間: 2025-3-28 04:53 作者: GROSS 時間: 2025-3-28 10:01 作者: Ordnance 時間: 2025-3-28 11:44
Breakdown Experiments,. Techniques such as ramped voltage sweeps and bipolar applied field tests are utilized to characterize fundamental aspects of breakdown in thin low-. films. We studied intrinsic breakdown using inert (Au) and self-limiting electrodes (Al). Metal-catalyzed failure was investigated by employing react作者: homocysteine 時間: 2025-3-28 17:47 作者: 阻塞 時間: 2025-3-28 22:09
Theory of Dielectric Breakdown in Nano-Porous Thin Films, presented to describe mechanisms that can result in failure. In addition, it was discussed how such mechanisms can be affected by material properties, fabrication steps, and type of stress. Complex concepts have been reduced to empirical expression and fitting parameters. These methodologies have b作者: 充足 時間: 2025-3-29 01:12 作者: atrophy 時間: 2025-3-29 05:02
Reconsidering Conventional Field Acceleration Models,active feature of the model developed in Chap. . rests on its ability to make predictions on dielectric breakdown at low fields from data collected at high fields without needing to use empirical field acceleration formulas. In this chapter, we discuss estimates from the model and compare these with作者: 侵略者 時間: 2025-3-29 09:34
