標(biāo)題: Titlebook: Design of Systems on a Chip: Design and Test; Ricardo Reis,Marcelo Lubaszewski,Jochen A.G. Jess Book 2007 Springer-Verlag US 2007 FPGA.Fie [打印本頁(yè)] 作者: 怕跛行他有限 時(shí)間: 2025-3-21 16:10
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書目名稱Design of Systems on a Chip: Design and Test讀者反饋學(xué)科排名
作者: 涂掉 時(shí)間: 2025-3-21 23:28 作者: MONY 時(shí)間: 2025-3-22 00:32
Ricardo Reis,Marcelo Lubaszewski,Jochen A.G. JessA practical and academic overview of Systems-on-Chip.Design and test aspects are high lighted作者: 寄生蟲 時(shí)間: 2025-3-22 05:59
http://image.papertrans.cn/d/image/268775.jpg作者: 擁護(hù) 時(shí)間: 2025-3-22 10:30
Glen Hyman,Frédéric Landy,Louise Bruno-Lézy a chip. Technology, productivity and quality are the main aspects under consideration to establish the major requirements for the design and test of upcoming systems on a chip. The contents of the book are shortly presented in the sequel, comprising contributions on three different, but complementa作者: 遺產(chǎn) 時(shí)間: 2025-3-22 14:08
Computer Supported Cooperative Work, mechanical or other properties on a single chip or multi-chip hybrid. They provide increased functionality, improved performance and reduced system cost to a large number of products. This tutorial will provide an overview of the evolution, types, fabrication and application of modern microsystems作者: 遺產(chǎn) 時(shí)間: 2025-3-22 18:13 作者: Ophthalmologist 時(shí)間: 2025-3-22 22:23 作者: 制定法律 時(shí)間: 2025-3-23 04:16 作者: chassis 時(shí)間: 2025-3-23 07:15 作者: instill 時(shí)間: 2025-3-23 11:09 作者: periodontitis 時(shí)間: 2025-3-23 17:56 作者: Flustered 時(shí)間: 2025-3-23 19:51
The End of Collective Security,ring their designs using hardware description languages such as VHDL and Verilog. The designs are then most often synthesized into programmable logic components such as field-programmable gate arrays (FPGAs) offered by Xilinx, Altera, Actel and others. This approach places the emphasis on high-level作者: 種子 時(shí)間: 2025-3-24 00:23
https://doi.org/10.1007/978-0-387-33757-9hallenge for testing these devices. Although many concepts can be applied which have already been developed for testing boards and ICs, also new aspects like sensor/actuator testing have to be considered. The choice which of the many approaches is most adequate turns out to be very application depen作者: 笨拙處理 時(shí)間: 2025-3-24 06:12
https://doi.org/10.1007/978-0-387-33757-9d cores enables the design of high-complexity systems-on-chip with densities as high as millions of gates on a single die. The increase in the use of pre-designed IP cores in system-chips adds to the complexity of test. To test system-chips adequately, test solutions need to be incorporated into ind作者: 案發(fā)地點(diǎn) 時(shí)間: 2025-3-24 08:09
Microsystems Technology and Applications, including examples of technological strategies suitable for direct utilisation by small and medium size high-tech companies. The tutorial is divided into the following sections: Fabrication, Packaging Technology, Design and Test, Applications for Microsystems, Factors Limiting Exploitation, Business Strategies for Microsystems Companies作者: 財(cái)政 時(shí)間: 2025-3-24 13:17
Book 2007nductor technology. The various chapters are the compilations of tutorials presented at workshops in the recent years by prominent authors from all over the world. Technology, productivity and quality are the main aspects under consideration to establish the major requirements for the design and tes作者: AXIOM 時(shí)間: 2025-3-24 17:30
Abbas Rahimi,Luca Benini,Rajesh K. Guptaet of placement and routing algorithms is needed. This work addresses convergence issues of the methodology as well, including some key strategies that help the development of efficient CAD tools that can find better layout solutions than those from traditional standard cell and fixed-die methodologies作者: 有惡臭 時(shí)間: 2025-3-24 19:21
Abbas Rahimi,Luca Benini,Rajesh K. Guptar, focusing on design-for-testability, built-in self-test and self-checking techniques suitable for digital and analog integrated circuits. Moreover, the application of these design-for-test techniques to integrated systems, implemented as multi-chip modules, microsystems or core-based integrated circuits, is also discussed作者: Maximize 時(shí)間: 2025-3-25 02:55 作者: 證實(shí) 時(shí)間: 2025-3-25 03:39 作者: 萬(wàn)花筒 時(shí)間: 2025-3-25 08:06
Abbas Rahimi,Luca Benini,Rajesh K. Guptaends on the kind of input language (synchronous/asynchronous, single thread/multi-thread) and the target architecture (mono-processor/multi-processor). The main co-design concepts are also detailed through the presentation of a co-design tool called COSMOS作者: ANN 時(shí)間: 2025-3-25 13:36 作者: Petechiae 時(shí)間: 2025-3-25 18:52
Hardware/Software co-design,ends on the kind of input language (synchronous/asynchronous, single thread/multi-thread) and the target architecture (mono-processor/multi-processor). The main co-design concepts are also detailed through the presentation of a co-design tool called COSMOS作者: 綠州 時(shí)間: 2025-3-25 20:55
Embedded Core-based System-on-Chip Test Strategies,usage of cores from multiple and diverse sources, it is essential to create standard mechanisms to make core test plug-and-play possible. This chapter presents in general the challenges of testing core-based system-chips and describes their corresponding test solutions. It concentrates on the common test requirements and strategies作者: 諷刺滑稽戲劇 時(shí)間: 2025-3-26 00:45
he second of two volumes addressing the design challenges associated with new generations of the semiconductor technology. The various chapters are the compilations of tutorials presented at workshops in the recent years by prominent authors from all over the world. Technology, productivity and qual作者: oxidant 時(shí)間: 2025-3-26 05:34 作者: Employee 時(shí)間: 2025-3-26 12:10
Abbas Rahimi,Luca Benini,Rajesh K. Guptaoverview of the main algorithms and issues related to behavioral synthesis and analyzes the pros and cons of each technique. It also discusses the place for behavioral synthesis in the overall digital design methodology and the main advantages and drawbacks of its use作者: molest 時(shí)間: 2025-3-26 16:15 作者: Onerous 時(shí)間: 2025-3-26 17:21
Design of Systems on a Chip,upcoming systems on a chip. The contents of the book are shortly presented in the sequel, comprising contributions on three different, but complementary axes: core design, computer-aided design tools and test methods作者: CORD 時(shí)間: 2025-3-27 00:30 作者: Radiation 時(shí)間: 2025-3-27 03:29 作者: 鳴叫 時(shí)間: 2025-3-27 08:10
Computer Supported Cooperative Work including examples of technological strategies suitable for direct utilisation by small and medium size high-tech companies. The tutorial is divided into the following sections: Fabrication, Packaging Technology, Design and Test, Applications for Microsystems, Factors Limiting Exploitation, Business Strategies for Microsystems Companies作者: pulmonary 時(shí)間: 2025-3-27 11:45 作者: Rct393 時(shí)間: 2025-3-27 13:45
Microsystems Technology and Applications,, mechanical or other properties on a single chip or multi-chip hybrid. They provide increased functionality, improved performance and reduced system cost to a large number of products. This tutorial will provide an overview of the evolution, types, fabrication and application of modern microsystems作者: Congestion 時(shí)間: 2025-3-27 18:51 作者: 諷刺 時(shí)間: 2025-3-28 00:44 作者: 脫離 時(shí)間: 2025-3-28 03:08 作者: Herd-Immunity 時(shí)間: 2025-3-28 09:24 作者: 辭職 時(shí)間: 2025-3-28 12:04 作者: 昏暗 時(shí)間: 2025-3-28 15:06 作者: convert 時(shí)間: 2025-3-28 22:08
Synthesis of FPGAs and Testable ASICs,ring their designs using hardware description languages such as VHDL and Verilog. The designs are then most often synthesized into programmable logic components such as field-programmable gate arrays (FPGAs) offered by Xilinx, Altera, Actel and others. This approach places the emphasis on high-level作者: palette 時(shí)間: 2025-3-29 01:18
Testable Design and Testing of Microsystems,hallenge for testing these devices. Although many concepts can be applied which have already been developed for testing boards and ICs, also new aspects like sensor/actuator testing have to be considered. The choice which of the many approaches is most adequate turns out to be very application depen作者: 偏見(jiàn) 時(shí)間: 2025-3-29 04:59
Embedded Core-based System-on-Chip Test Strategies,d cores enables the design of high-complexity systems-on-chip with densities as high as millions of gates on a single die. The increase in the use of pre-designed IP cores in system-chips adds to the complexity of test. To test system-chips adequately, test solutions need to be incorporated into ind作者: spinal-stenosis 時(shí)間: 2025-3-29 08:15 作者: AGATE 時(shí)間: 2025-3-29 14:48 作者: Fretful 時(shí)間: 2025-3-29 16:57 作者: Agility 時(shí)間: 2025-3-29 21:43 作者: 擦試不掉 時(shí)間: 2025-3-30 00:38
Core Architectures for Digital Media and the Associated Compilation Techniques,alance between flexibility and speed performance of the various hardware-platforms. The competition is between standard processors like the new generations of the Pentium (as ‘‘superscalar’’ representatives), possibly enhanced with add-ons like MMX, or, alternatively, the TRIMEDIA, (a VLIW represent作者: DAMN 時(shí)間: 2025-3-30 05:37
Past, Present and Future of Microprocessors,ssors are overtaking all kinds of computers. Minicomputer lines started using microprocessors during 1980s; mainframe and Unix lines during the 1990s and super-computers during this decade. In this extraordinary evolution, these devices have used all technical innovations that had been conceived for作者: 迫擊炮 時(shí)間: 2025-3-30 10:13
Synthesis of FPGAs and Testable ASICs,can logic must be inserted, test vectors generated and fault grading performed to ensure a high level of testability. These efforts complicate and delay the conversion of FPGA designs to ASICs but must be considered by designers of microelectronic systems. Topics covered include: design flow; system作者: 共棲 時(shí)間: 2025-3-30 16:27
Book 2007bstraction, from system level to physical design. The third part deals with test methods. The topic is addressed from different viewpoints: in terms of chip complexity, test is discussed from the core and system prospective; in terms of signal heterogeneity, the digital, mixed-signal and microsystem
