標(biāo)題: Titlebook: Design for Manufacturability and Statistical Design; A Constructive Appro Michael Orshansky,Sani R. Nassif,Duane Boning Book 2008 Springer- [打印本頁] 作者: dabble 時間: 2025-3-21 16:53
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書目名稱Design for Manufacturability and Statistical Design網(wǎng)絡(luò)公開度學(xué)科排名
書目名稱Design for Manufacturability and Statistical Design被引頻次
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書目名稱Design for Manufacturability and Statistical Design讀者反饋
書目名稱Design for Manufacturability and Statistical Design讀者反饋學(xué)科排名
作者: 親密 時間: 2025-3-21 22:25 作者: 帶來的感覺 時間: 2025-3-22 03:24 作者: 有偏見 時間: 2025-3-22 06:10
Front End Variabilityance of integrated circuits [6]. Several taxonomies can be used to describe the different variability mechanisms, according to their causes, spatial scales, the particular IC layer they impact, and whether their ability can be described using non-stochastic models. Here we briefly discuss these taxonomies.作者: Nefarious 時間: 2025-3-22 10:33
Statistical Foundations Of Data Analysis And Modelinges required are often different from those that are familiar to most circuit designers. In this chapter, we discuss some specific statistical concepts useful for statistical design. Along the way we will attempt to develop a more refined view of what variability is, and how to describe it in useful, formal, and unambiguous terms.作者: 擺動 時間: 2025-3-22 14:55
https://doi.org/10.1007/978-0-387-69011-7Computer-Aided Design (CAD); Simulation; circuit design; data analysis; integrated circuit; modeling; opti作者: 擺動 時間: 2025-3-22 17:57 作者: 華而不實 時間: 2025-3-22 23:35 作者: 令人苦惱 時間: 2025-3-23 01:44 作者: GNAT 時間: 2025-3-23 06:05
Interviewer- bzw. Befragtenhinweise,uch as integrated inductors or capacitors formed within the interconnect process layers. Because the back end process shares many technologies and tools with the front end, many of the variations affecting the front end are also operative here, particularly those related to lithography and etch. In 作者: 大約冬季 時間: 2025-3-23 13:47
Zur Dramaturgie des Fragebogens,dividual integrated circuit components. This physical variability is predominantly a function of the fabrication process, with random and systematic components. But the very meaning of the word . implies that an IC is composed of many individual circuits manufactured simultaneously and working concu作者: 搜尋 時間: 2025-3-23 14:10 作者: 有幫助 時間: 2025-3-23 20:33 作者: maintenance 時間: 2025-3-23 22:58
Ethische Prinzipien in der Psychologiefunctional dependencies. In front-end processes, the use of subwavelength photolithography has led to severe difficulties in performing predictable pattern transfer. An important manifestation is the variation of the polysilicon gate critical dimension as a function of the 2-D layout neighborhood. S作者: 羽毛長成 時間: 2025-3-24 04:11 作者: 得罪人 時間: 2025-3-24 08:17
https://doi.org/10.1007/978-3-7091-3690-4nd circuit analysis, which uses circuit simulation as a core and necessary component. The confusion arises from the complex nature of the variability analysis task, and because of a lack of separation between analysis algorithms and simulation algorithms -for example, many modern versions of SPICE i作者: 亞當(dāng)心理陰影 時間: 2025-3-24 12:21
Fragen der Ethik in der Psychotherapieems using statistical techniques. At system level, timing analysis is concerned with ensuring that all sampled memory elements of a circuit have the proper logical value at the end of each clock cycle. Verifying this property first requires that under no circumstances does the computation of the cor作者: 詩集 時間: 2025-3-24 17:34 作者: 通知 時間: 2025-3-24 19:14
Ethische Fragen des Erstgespr?chsic yield. We also discussed techniques to compensate for the impact of systematic sources of variation. In this chapter we discuss optimization strategies for minimizing the impact of random variability on parametric yield. Specifically, we explore the emerging methods for full-chip statistical opti作者: SOW 時間: 2025-3-25 02:15
Ilse Kryspin-Exner,Bibiana Schuchistical design. The central premise of the book is that the variability must be rigorously described as either random or systematic before meaningful measures can be taken to mitigate its impact on design procedures. This requires the understanding of the physical causes of variability in advanced s作者: muffler 時間: 2025-3-25 05:22 作者: PANIC 時間: 2025-3-25 08:12 作者: Perceive 時間: 2025-3-25 13:24
,Hinweise zum Ausfüllen des Fragebogens,ircuit - often composed of as few as tens of devices. With the success of semiconductor scaling, predicted and - to a certain extent even driven - by Moore’s law, and the vastly increased complexity of modern nano-meter scale processes and the billion-device circuits they allow, there came a necessary separation between the various disciplines.作者: 使激動 時間: 2025-3-25 17:00 作者: helper-T-cells 時間: 2025-3-25 20:06 作者: Traumatic-Grief 時間: 2025-3-26 01:54
Fragen der Ethik in der Psychotherapierect logical value require longer than the clock cycle of a device. Secondly it requires that the latching of the correct logical value be not pre-empted by any rapid propagation of the results of the previous clock cycle.作者: 有毒 時間: 2025-3-26 07:43 作者: maudtin 時間: 2025-3-26 12:28 作者: 有權(quán) 時間: 2025-3-26 14:00
Introductionircuit - often composed of as few as tens of devices. With the success of semiconductor scaling, predicted and - to a certain extent even driven - by Moore’s law, and the vastly increased complexity of modern nano-meter scale processes and the billion-device circuits they allow, there came a necessary separation between the various disciplines.作者: Fibroid 時間: 2025-3-26 20:52
Test Structures For Variabilityms increase the importance of methods for their empirical characterization. In this chapter, we study the measurement techniques for characterization of variability. This is followed by the discussion of statistical analysis and modeling methods crucial for properly interpreting the results of the measurements.作者: 使苦惱 時間: 2025-3-27 00:44
Statistical Circuit Analysismplement Monte-Carlo . as an integral part of the simulator. In this chapter we review circuit simulation, explain the procedures through which the basic parameters defining the circuit are derived from observed data, and present two strategies for statistical circuit ..作者: TEN 時間: 2025-3-27 02:11
Statistical Static Timing Analysisrect logical value require longer than the clock cycle of a device. Secondly it requires that the latching of the correct logical value be not pre-empted by any rapid propagation of the results of the previous clock cycle.作者: 凹槽 時間: 2025-3-27 07:21
Leakage Variability And Joint Parametric Yieldd power variability. Both timing and power variation need to be accounted for in estimating the overall parametric yield. This chapter introduces a quantitative yield model that can accurately handle the correlation between timing and power variability.作者: 開始從未 時間: 2025-3-27 11:03
Zur Dramaturgie des Fragebogens, an excellent thermal conductor. (2) The package in which the integrated circuit is sealed in order to protect it, and the connections between the packaged circuit and the external environment, through which the circuit is supplied with power as well as input and output signals.作者: callous 時間: 2025-3-27 14:14 作者: TRAWL 時間: 2025-3-27 21:07
Environmental Variability an excellent thermal conductor. (2) The package in which the integrated circuit is sealed in order to protect it, and the connections between the packaged circuit and the external environment, through which the circuit is supplied with power as well as input and output signals.作者: Silent-Ischemia 時間: 2025-3-28 00:14
Parametric Yield Optimizationbility using robust and chance-constrained optimization formulations. These techniques permit efficient statistical circuit tuning using gate and transistor sizing and the use of multiple threshold voltages.作者: CON 時間: 2025-3-28 04:21
Book 2008 statistical data characterization, and techniques for modeling, analysis, and optimization of integrated circuits to improve yield. The objective of the constructive approach developed in this book is to formulate a consistent set of methods and principles necessary for rigorous statistical design 作者: aesthetician 時間: 2025-3-28 06:23
Interviewer- bzw. Befragtenhinweise,nerate additional types and sources of variation. The key impacts we are concerned with here are variations in the final interconnect or backend components of the chip, including variations in the . of the structures formed, and in the . of these structures.作者: 太空 時間: 2025-3-28 13:45
Back End Variabilitynerate additional types and sources of variation. The key impacts we are concerned with here are variations in the final interconnect or backend components of the chip, including variations in the . of the structures formed, and in the . of these structures.作者: bifurcate 時間: 2025-3-28 15:50
Ethische Prinzipien in der Psychologiehe idealized layout that they produce gets distorted by the advanced lithography and what can be done about that. We review the palette of reticle enhancement and design for manufacturability techniques that are currently required for ensuring the quality of the pattern transfer.作者: ESO 時間: 2025-3-28 19:19
Ethische Fragen des Erstgespr?chsgularity. Figure 8.1 shows a schematic illustration of three dummy fill options in the case of copper interconnect..In this chapter, we discuss dummy fill from three perspectives. We begin with an overview of dummy fill strategies and issues for copper interconnect. The goal from a process physics p作者: DAUNT 時間: 2025-3-28 22:56 作者: Ganglion-Cyst 時間: 2025-3-29 06:36
Lithography Enhancement Techniqueshe idealized layout that they produce gets distorted by the advanced lithography and what can be done about that. We review the palette of reticle enhancement and design for manufacturability techniques that are currently required for ensuring the quality of the pattern transfer.作者: jagged 時間: 2025-3-29 09:13
Ensuring Interconnect Planaritygularity. Figure 8.1 shows a schematic illustration of three dummy fill options in the case of copper interconnect..In this chapter, we discuss dummy fill from three perspectives. We begin with an overview of dummy fill strategies and issues for copper interconnect. The goal from a process physics p作者: 打包 時間: 2025-3-29 12:16 作者: 可耕種 時間: 2025-3-29 17:42
Book 2008echniques for improving parametric yield....Design for Manufacturability and Statistical Design: A Constructive Approach. presents an overview of the methods that need to be mastered?for state-of-the-art design for manufacturability and statistical design methodologies.? It is an?important reference作者: 運(yùn)動吧 時間: 2025-3-29 20:09
