標題: Titlebook: Debug Automation from Pre-Silicon to Post-Silicon; Mehdi Dehbashi,G?rschwin Fey Book 2015 Springer International Publishing Switzerland 20 [打印本頁] 作者: 獨裁者 時間: 2025-3-21 17:04
書目名稱Debug Automation from Pre-Silicon to Post-Silicon影響因子(影響力)
書目名稱Debug Automation from Pre-Silicon to Post-Silicon影響因子(影響力)學科排名
書目名稱Debug Automation from Pre-Silicon to Post-Silicon網絡公開度
書目名稱Debug Automation from Pre-Silicon to Post-Silicon網絡公開度學科排名
書目名稱Debug Automation from Pre-Silicon to Post-Silicon被引頻次
書目名稱Debug Automation from Pre-Silicon to Post-Silicon被引頻次學科排名
書目名稱Debug Automation from Pre-Silicon to Post-Silicon年度引用
書目名稱Debug Automation from Pre-Silicon to Post-Silicon年度引用學科排名
書目名稱Debug Automation from Pre-Silicon to Post-Silicon讀者反饋
書目名稱Debug Automation from Pre-Silicon to Post-Silicon讀者反饋學科排名
作者: 蟄伏 時間: 2025-3-21 23:21
ware system at different levels of abstraction, i.e., chip, gate-level, RTL and transaction level;.Includes techniques for debug automation of design bugs and electrical faults, as well as an infrastructure to 978-3-319-35610-5978-3-319-09309-3作者: abysmal 時間: 2025-3-22 03:34 作者: 繁榮地區(qū) 時間: 2025-3-22 07:52 作者: embolus 時間: 2025-3-22 11:41 作者: 牽索 時間: 2025-3-22 15:38
Summary and Outlook to time-to-market constraints, 100?% verification coverage at the design level is an elusive task. Consequently, automated debugging approaches are required at both pre-silicon and post-silicon stages in order to reduce the development time of IC products.作者: 牽索 時間: 2025-3-22 20:56
https://doi.org/10.1007/978-3-531-91774-0rent applications in embedded systems such as medical electronics, automotive systems and avionics. A failure of a chip in non-critical applications may cause significant economical loss while in critical applications may also threaten the human life in the worst case. Consequently, the correct desi作者: 可能性 時間: 2025-3-22 21:19 作者: Femine 時間: 2025-3-23 03:02 作者: Multiple 時間: 2025-3-23 08:48 作者: 逗它小傻瓜 時間: 2025-3-23 11:54 作者: Brain-Imaging 時間: 2025-3-23 17:29 作者: 地牢 時間: 2025-3-23 18:14
Medienethnografische Forschung im Feldegrate large multiprocessor SoCs [BM02, PGI.05]. Having a large SoC with complex communication among its cores, the complete verification coverage at pre-silicon stage is almost impossible. Therefore in addition to electrical bugs, some design bugs may also appear in the final prototype of an SoC.作者: detach 時間: 2025-3-23 23:08
https://doi.org/10.1007/978-3-658-25220-5 to time-to-market constraints, 100?% verification coverage at the design level is an elusive task. Consequently, automated debugging approaches are required at both pre-silicon and post-silicon stages in order to reduce the development time of IC products.作者: growth-factor 時間: 2025-3-24 05:48 作者: Expostulate 時間: 2025-3-24 09:37
978-3-319-35610-5Springer International Publishing Switzerland 2015作者: 輕觸 時間: 2025-3-24 14:38
https://doi.org/10.1007/978-3-531-91774-0rent applications in embedded systems such as medical electronics, automotive systems and avionics. A failure of a chip in non-critical applications may cause significant economical loss while in critical applications may also threaten the human life in the worst case. Consequently, the correct design of VLSI circuits is crucial.作者: 無目標 時間: 2025-3-24 15:22
Das Mikroskop und seine Anwendungogic bugs [SVAV05, CMB07b, SFD10, SFB.09]. Algorithmic bugs often have a severe impact on the correctness of a design. Multiple major modifications are usually required to fix algorithmic bugs. Synchronization bugs are related to synchronization of data with respect to clock cycles in a design.作者: apropos 時間: 2025-3-24 20:34
Medienethnografische Forschung im Feldegrate large multiprocessor SoCs [BM02, PGI.05]. Having a large SoC with complex communication among its cores, the complete verification coverage at pre-silicon stage is almost impossible. Therefore in addition to electrical bugs, some design bugs may also appear in the final prototype of an SoC.作者: 遺留之物 時間: 2025-3-25 02:52 作者: dendrites 時間: 2025-3-25 06:40
Mehdi Dehbashi,G?rschwin FeyDescribes a unified framework for debug automation that is used at both pre-silicon and post-silicon stages.Provides approaches for debug automation of a hardware system at different levels of abstrac作者: 磨坊 時間: 2025-3-25 09:12
http://image.papertrans.cn/d/image/264087.jpg作者: 金哥占卜者 時間: 2025-3-25 12:35
https://doi.org/10.1007/978-3-662-36644-8This chapter deals with the automation of post-silicon debugging for speed-limiting paths, briefly called .. Debugging of speedpaths is a key challenge in development of VLSI circuits as timing variations induced by process and environmental effects are increasing.作者: Lymphocyte 時間: 2025-3-25 19:04 作者: 落葉劑 時間: 2025-3-25 21:37
Introduction,rent applications in embedded systems such as medical electronics, automotive systems and avionics. A failure of a chip in non-critical applications may cause significant economical loss while in critical applications may also threaten the human life in the worst case. Consequently, the correct desi作者: 牲畜欄 時間: 2025-3-26 03:51
Preliminaries,× ., the set of edges, corresponds to the gate input-output connections in the circuit [LRS89]. For gate-level benchmarks, we consider the nodes to be gates with symmetric functions. Each node in the circuit graph is associated with a symmetric function which represents the corresponding behavior of作者: Spangle 時間: 2025-3-26 06:16 作者: mydriatic 時間: 2025-3-26 08:44
Automated Debugging from Pre-Silicon to Post-Siliconimulation [VH99], BDD [CH97], and SAT [SVAV05]. In [SD10], SAT-based debugging is used to debug different abstraction levels of the system description. Post-silicon debugging requires a larger effort. The post-silicon validation process starts by applying test vectors to the IC or by running a test 作者: 畫布 時間: 2025-3-26 16:34
Automated Debugging for Synchronization Bugsogic bugs [SVAV05, CMB07b, SFD10, SFB.09]. Algorithmic bugs often have a severe impact on the correctness of a design. Multiple major modifications are usually required to fix algorithmic bugs. Synchronization bugs are related to synchronization of data with respect to clock cycles in a design.作者: 假裝是我 時間: 2025-3-26 19:15 作者: 使顯得不重要 時間: 2025-3-27 00:18 作者: 粗糙 時間: 2025-3-27 02:09 作者: grudging 時間: 2025-3-27 05:51
Preliminaries, gates with symmetric functions. Each node in the circuit graph is associated with a symmetric function which represents the corresponding behavior of that gate in the circuit. A symmetric function does not depend on the order of inputs but only on the sum of variables assigned to 0 or to 1, respectively.作者: Resistance 時間: 2025-3-27 09:44 作者: aneurysm 時間: 2025-3-27 13:54 作者: Accessible 時間: 2025-3-27 21:30 作者: 使聲音降低 時間: 2025-3-28 00:18
tomation of a hardware system at different levels of abstrac.This book describes automated debugging approaches for the bugs and the faults which appear in different abstraction levels of a hardware system. The authors employ a transaction-based debug approach to systems at the transaction-level, as作者: Gene408 時間: 2025-3-28 04:19 作者: Digitalis 時間: 2025-3-28 07:01
Das Mikroskop und seine Anwendungces of an observed error by using the available counterexamples utilizing the practical efficiency of SAT-based reasoning engines for NP-complete problems. Each potential source of the error is returned as a fault candidate which is a set of components of the circuit.作者: VERT 時間: 2025-3-28 12:53
Ankauf und Prüfung des Mikroskops. Post-silicon debugging requires a larger effort. The post-silicon validation process starts by applying test vectors to the IC or by running a test program, such as end-user applications or functional tests, on the IC until an error is detected [CMB07a, PHM09].作者: Protein 時間: 2025-3-28 18:20
Efficient Automated Speedpath Debuggingent techniques can also handle large designs with a better performance by debugging an abstract model of the circuit [SV07]. The X value (three-valued logic) is used to abstract a circuit for efficient model checking [GSY07]. However, the previous approaches do not consider any timing information of the circuit.作者: Outshine 時間: 2025-3-28 19:47
Book 2015 authors employ a transaction-based debug approach to systems at the transaction-level, asserting the correct relation of transactions. The automated debug approach for design bugs finds the potential fault candidates at RTL and gate-level of a circuit. Debug techniques for logic bugs and synchroniz作者: Gullible 時間: 2025-3-29 02:50
Advances in BCI: A Neural Bypass Technology to Reconnect the Brain to the Body,as previously been shown that intracortically-recorded signals can be decoded to extract information related to movement, allowing non-human primates and paralyzed humans to control computers, wheelchairs and robotic arms through imagined movements. In non-human primates, these types of signals have作者: 啪心兒跳動 時間: 2025-3-29 03:59
Hans-Josef Wagnere and web design experiences aimed at devices ranging from smart phones to the TV set in your living room. Along the way you will discover how many of the tools in the Adobe Web Design CS6 collection can be fully utilized to create expressive and engaging web applications. This includes: . . ..Buil978-1-4302-4350-2978-1-4302-4351-9作者: 一夫一妻制 時間: 2025-3-29 07:27
Book 2012Latest editionziale bei bestehenden Kunden noch besser auszusch?pfen. Diese Strategie hat ihre Schlagkraft über viele Jahre im praktischen Einsatz bei internationalen Konzernen bewiesen - Millionen Euro an Zusatzums?tzen konnten nachweislich damit erzielt werden. Ein wertvoller Leitfaden für Unternehme, Vertriebs
