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標(biāo)題: Titlebook: Counterfeit Integrated Circuits; Detection and Avoida Mark (Mohammad) Tehranipoor,Ujjwal Guin,Domenic Fo Book 2015 Springer International P [打印本頁]

作者: 筆記    時間: 2025-3-21 18:26
書目名稱Counterfeit Integrated Circuits影響因子(影響力)




書目名稱Counterfeit Integrated Circuits影響因子(影響力)學(xué)科排名




書目名稱Counterfeit Integrated Circuits網(wǎng)絡(luò)公開度




書目名稱Counterfeit Integrated Circuits網(wǎng)絡(luò)公開度學(xué)科排名




書目名稱Counterfeit Integrated Circuits被引頻次




書目名稱Counterfeit Integrated Circuits被引頻次學(xué)科排名




書目名稱Counterfeit Integrated Circuits年度引用




書目名稱Counterfeit Integrated Circuits年度引用學(xué)科排名




書目名稱Counterfeit Integrated Circuits讀者反饋




書目名稱Counterfeit Integrated Circuits讀者反饋學(xué)科排名





作者: SKIFF    時間: 2025-3-21 21:26
Counterfeit Integrated Circuits, wide variety of electronic systems. A recent report [1] from the Information Handling Services Inc. [2] shows that reports of counterfeit parts have quadrupled since 2009 (see Fig. 2.1). This data has been compiled from two reporting entities—The Electronic Resellers Association International (ERAI
作者: Adornment    時間: 2025-3-22 02:11
Counterfeit Defects,a part or a batch of parts under investigation. Counterfeit defects are those anomalies and changes that are not typically found in authentic parts. A counterfeit part may often contain one or more different anomalies and deviations from normal/usual form and/or functionality of a genuine component.
作者: 充足    時間: 2025-3-22 06:30

作者: Overthrow    時間: 2025-3-22 09:17
Electrical Tests for Counterfeit Detection,ect a subset of these defects. Also highlighted were the limitations of physical tests including their high test time and cost, destructive nature, and limitation to certain defects and certain counterfeit types. Tests such as material analysis and scanning electron or acoustic microscopy require ex
作者: ARCHE    時間: 2025-3-22 15:40

作者: ARCHE    時間: 2025-3-22 20:58
Advanced Detection: Physical Tests,es can fail to detect more and more sophisticated counterfeiting. Counterfeiters are utilizing more advanced techniques making the discrepancies from the authentic ICs so subtle and at times impossible to detect.
作者: dyspareunia    時間: 2025-3-23 00:00
Advanced Detection: Electrical Tests, due their destructive nature, cannot be applied to all chips. Electrical tests (see Chap.?5) on the other hand require different test set ups for all the unique types of ICs one could encounter in practice (digital, analog, mixed signal, memories, processors, FPGAs,?etc.). In addition, test program
作者: trigger    時間: 2025-3-23 03:21
Hardware IP Watermarking,th increasing logic density, we are now able to fit more and more components onto a semiconductor die and create functionally dense System-on-a-Chips (SoCs). On the other hand, system complexity has grown exponentially.
作者: Ataxia    時間: 2025-3-23 07:11
Counterfeit Integrated Circuits,) Inc. [3] and the Government-Industry Data Exchange Program (GIDEP) [4]. This report states that the majority of counterfeit incidents were reported by US-based military bodies and electronic firms from the aerospace industry.
作者: 外觀    時間: 2025-3-23 11:05

作者: 出價    時間: 2025-3-23 13:56

作者: Intellectual    時間: 2025-3-23 20:59

作者: 填料    時間: 2025-3-24 00:57

作者: GIBE    時間: 2025-3-24 04:30

作者: locus-ceruleus    時間: 2025-3-24 06:50
le to test as many components as possible, if not all, quick and efficient test methods are required to ensure that ICs pass stringent acceptance tests and that they meet functionality, quality, authenticity and reliability requirements.
作者: crumble    時間: 2025-3-24 13:22
round them. In order to achieve this goal, we must be able to continuously monitor counterfeiting activity and assess counterfeit detection methods in order to evaluate their effectiveness in detecting counterfeit components. We also need to develop a common platform to evaluate the efficacy of a set of test methods.
作者: aesthetic    時間: 2025-3-24 15:18

作者: 合法    時間: 2025-3-24 22:28
Counterfeit Test Coverage: An Assessment of Current Counterfeit Detection Methods,round them. In order to achieve this goal, we must be able to continuously monitor counterfeiting activity and assess counterfeit detection methods in order to evaluate their effectiveness in detecting counterfeit components. We also need to develop a common platform to evaluate the efficacy of a set of test methods.
作者: Deject    時間: 2025-3-25 02:11

作者: FADE    時間: 2025-3-25 04:48

作者: 低位的人或事    時間: 2025-3-25 10:46

作者: 馬賽克    時間: 2025-3-25 14:04
Advanced Detection: Physical Tests,es can fail to detect more and more sophisticated counterfeiting. Counterfeiters are utilizing more advanced techniques making the discrepancies from the authentic ICs so subtle and at times impossible to detect.
作者: Myofibrils    時間: 2025-3-25 17:21
Hardware IP Watermarking,th increasing logic density, we are now able to fit more and more components onto a semiconductor die and create functionally dense System-on-a-Chips (SoCs). On the other hand, system complexity has grown exponentially.
作者: 健談    時間: 2025-3-25 21:07
Zentrum für Kindheits- und Jugendforschungrom harmful chemicals? How do you know that the components in your laptop were produced and inspected by a reliable manufacturer? With networks of production and consumption becoming increasingly globalized, the pressure to address problems associated with counterfeiting is incredibly intense.
作者: languor    時間: 2025-3-26 03:05
Weiblich, ledig, kinderlos und altes can fail to detect more and more sophisticated counterfeiting. Counterfeiters are utilizing more advanced techniques making the discrepancies from the authentic ICs so subtle and at times impossible to detect.
作者: 格子架    時間: 2025-3-26 07:01

作者: CHOIR    時間: 2025-3-26 09:17

作者: Ischemia    時間: 2025-3-26 12:45

作者: CODA    時間: 2025-3-26 19:35

作者: SUGAR    時間: 2025-3-27 00:12
Combating Die and IC Recycling,In today’s electronic component supply chain recycled and remarked parts account for a significant percentage of counterfeit components. The detection of these parts poses a significant challenge to the global electronic component supply chain due to the lack of efficient, robust, and low-cost detection and avoidance technologies.
作者: dragon    時間: 2025-3-27 04:06
Prevention of Unlicensed and Rejected ICs from Untrusted Foundry and Assembly,In Chap.10, we discussed the emergence of IP reuse and the challenges it has created with respect to IP piracy. Another recent trend is the transition of most semiconductor companies to a fabless business model. In the past, a company would have full control of their product from design to fabrication/assembly.
作者: Somber    時間: 2025-3-27 08:44
Chip ID,To prevent the widespread infiltration of counterfeit parts, traceability of electronic components in the supply chain demands more attention. Due to globalization, these components are now manufactured and assembled across the world. Thus, it is necessary to trace the origin of a component to validate the authenticity of its manufacturer.
作者: ANTE    時間: 2025-3-27 11:16

作者: Eructation    時間: 2025-3-27 17:05
978-3-319-36485-8Springer International Publishing Switzerland 2015
作者: 不可救藥    時間: 2025-3-27 17:48

作者: DEI    時間: 2025-3-28 01:44
Zentrum für Kindheits- und Jugendforschung wide variety of electronic systems. A recent report [1] from the Information Handling Services Inc. [2] shows that reports of counterfeit parts have quadrupled since 2009 (see Fig. 2.1). This data has been compiled from two reporting entities—The Electronic Resellers Association International (ERAI
作者: Expand    時間: 2025-3-28 05:26

作者: 外貌    時間: 2025-3-28 07:28

作者: 追蹤    時間: 2025-3-28 13:39

作者: dura-mater    時間: 2025-3-28 17:06

作者: remission    時間: 2025-3-28 21:23

作者: SPER    時間: 2025-3-29 02:18

作者: 馬籠頭    時間: 2025-3-29 06:03
Weiblich, ledig, kinderlos und altth increasing logic density, we are now able to fit more and more components onto a semiconductor die and create functionally dense System-on-a-Chips (SoCs). On the other hand, system complexity has grown exponentially.
作者: Boycott    時間: 2025-3-29 11:06
Mark (Mohammad) Tehranipoor,Ujjwal Guin,Domenic FoHelps beginners and practitioners in the field by providing a comprehensive background on the counterfeiting problem;.Presents innovative taxonomies for counterfeit types, test methods, and counterfei
作者: 美食家    時間: 2025-3-29 14:48
http://image.papertrans.cn/c/image/239093.jpg
作者: 抱狗不敢前    時間: 2025-3-29 17:49

作者: annexation    時間: 2025-3-29 20:42
being counterfeit. The precise defects identified in a part can be linked to (i) the type of counterfeit. For example, recycled components undergo a harmful harvesting process that creates defects that are not likely present in overproduced, cloned, etc. counterfeit types; (ii) the expertise/capabi
作者: 小步走路    時間: 2025-3-30 02:58





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