標(biāo)題: Titlebook: Compact Models and Performance Investigations for Subthreshold Interconnects; Rohit Dhiman,Rajeevan Chandel Book 2015 Springer India 2015 [打印本頁] 作者: mandatory 時間: 2025-3-21 17:47
書目名稱Compact Models and Performance Investigations for Subthreshold Interconnects影響因子(影響力)
書目名稱Compact Models and Performance Investigations for Subthreshold Interconnects影響因子(影響力)學(xué)科排名
書目名稱Compact Models and Performance Investigations for Subthreshold Interconnects網(wǎng)絡(luò)公開度
書目名稱Compact Models and Performance Investigations for Subthreshold Interconnects網(wǎng)絡(luò)公開度學(xué)科排名
書目名稱Compact Models and Performance Investigations for Subthreshold Interconnects被引頻次
書目名稱Compact Models and Performance Investigations for Subthreshold Interconnects被引頻次學(xué)科排名
書目名稱Compact Models and Performance Investigations for Subthreshold Interconnects年度引用
書目名稱Compact Models and Performance Investigations for Subthreshold Interconnects年度引用學(xué)科排名
書目名稱Compact Models and Performance Investigations for Subthreshold Interconnects讀者反饋
書目名稱Compact Models and Performance Investigations for Subthreshold Interconnects讀者反饋學(xué)科排名
作者: 女上癮 時間: 2025-3-21 21:05 作者: jettison 時間: 2025-3-22 02:38 作者: 的是兄弟 時間: 2025-3-22 07:56 作者: coltish 時間: 2025-3-22 10:06 作者: 過分 時間: 2025-3-22 16:48
2199-8582 r sub-threshold circuits.Investigates variability issues in .The book provides a detailed analysis of issues related to sub-threshold interconnect performance from the perspective of analytical approach and design techniques. Particular emphasis is laid on the performance analysis of coupling noise 作者: 過分 時間: 2025-3-22 20:52
Book 2015ign techniques. Particular emphasis is laid on the performance analysis of coupling noise and variability issues in sub-threshold domain to develop efficient compact models. The proposed analytical approach gives physical insight of the parameters affecting the transient behavior of coupled intercon作者: insolence 時間: 2025-3-22 21:35
Soziale Exklusion und Wohlfahrtsstaat,xcess power to be dissipated. Global or long interconnects in nanometer technologies have attracted increasing attention because of their growing influence on the overall performance of integrated circuits over the past few years.作者: stressors 時間: 2025-3-23 05:07 作者: Crumple 時間: 2025-3-23 06:33 作者: 不要不誠實 時間: 2025-3-23 10:25 作者: 小官 時間: 2025-3-23 16:53
https://doi.org/10.1007/978-3-663-11397-3ral key process parameters during the device fabrication. The increase in variability affects the design of low-power circuits in the nanometer regime. This causes fluctuations in the IC performance. Therefore, the relative impact of process variations on power and timing has become more significant with each technology generation.作者: 實施生效 時間: 2025-3-23 21:32
Variability in Subthreshold Interconnects,ral key process parameters during the device fabrication. The increase in variability affects the design of low-power circuits in the nanometer regime. This causes fluctuations in the IC performance. Therefore, the relative impact of process variations on power and timing has become more significant with each technology generation.作者: 壓倒性勝利 時間: 2025-3-24 00:57 作者: 文件夾 時間: 2025-3-24 05:56
https://doi.org/10.1007/978-3-531-90499-3en interconnects is reduced and the thickness of the conductor is increased in order to reduce the parasitic resistance of the conductors. The coupling capacitance has therefore increased significantly and has become comparable to the interconnect capacitance.作者: 平常 時間: 2025-3-24 08:02
Design Challenges in Subthreshold Interconnect Circuits,l or polysilicon wires which connect billions of active devices to carry signals within a VLSI chip. There are a number of such wires in the whole chip. Of these, the length of long interconnects in large chips is of the order of 10?mm.作者: 投票 時間: 2025-3-24 11:22 作者: archetype 時間: 2025-3-24 15:35 作者: 使隔離 時間: 2025-3-24 19:49 作者: 火車車輪 時間: 2025-3-24 23:20
Soziale Exklusion und Wohlfahrtsstaat,exponential growth of the total number of interconnects/wires as the feature size of MOS transistors decreases in scaled deep submicron CMOS technologies. Interconnect length, however, has not scaled down with feature size and remains long relative to other on-chip geometries. Interconnects are meta作者: 杠桿支點 時間: 2025-3-25 03:38
Soziale Exklusion und Wohlfahrtsstaat,ase in resulting integration density and chip size. The trend toward larger chip size has necessitated using longer interconnects. These connect various components on a very-large-scale integration chip and distribute power, ground, clock, data, and control signals. The performance of a logic gate i作者: spinal-stenosis 時間: 2025-3-25 11:29 作者: BURSA 時間: 2025-3-25 12:30
https://doi.org/10.1007/978-3-531-90499-3OS logic gates. For either an in-phase or out-of-phase transition, the coupling capacitance affects the waveform shape of the output voltage and the propagation delay of each inverter, primarily changing the speed of a CMOS integrated circuit. If one of these CMOS logic gates is quiet, while other l作者: 縮短 時間: 2025-3-25 18:31 作者: 展覽 時間: 2025-3-25 23:52 作者: Oration 時間: 2025-3-26 01:01 作者: 卷發(fā) 時間: 2025-3-26 05:23 作者: TRUST 時間: 2025-3-26 09:01
Introduction,cation devices, and a host of many other electronic equipments in the present era. VLSI chips find wide applications in all modern electronic circuits and systems. Further, VLSI technology has reduced the voluminous electronic parts which were used to manufacture early day’s electronic equipment and作者: regale 時間: 2025-3-26 14:13
Design Challenges in Subthreshold Interconnect Circuits,exponential growth of the total number of interconnects/wires as the feature size of MOS transistors decreases in scaled deep submicron CMOS technologies. Interconnect length, however, has not scaled down with feature size and remains long relative to other on-chip geometries. Interconnects are meta作者: climax 時間: 2025-3-26 18:46
Subthreshold Interconnect Circuit Design,ase in resulting integration density and chip size. The trend toward larger chip size has necessitated using longer interconnects. These connect various components on a very-large-scale integration chip and distribute power, ground, clock, data, and control signals. The performance of a logic gate i作者: 變異 時間: 2025-3-26 22:27 作者: Spinal-Fusion 時間: 2025-3-27 02:13
Subthreshold Interconnect Noise Analysis,OS logic gates. For either an in-phase or out-of-phase transition, the coupling capacitance affects the waveform shape of the output voltage and the propagation delay of each inverter, primarily changing the speed of a CMOS integrated circuit. If one of these CMOS logic gates is quiet, while other l作者: 變化 時間: 2025-3-27 06:40 作者: 審問,審訊 時間: 2025-3-27 11:32 作者: 揉雜 時間: 2025-3-27 14:45
Conference proceedings 2006r. ...Recent Developments of Electrical Drives. covers a wide range of interests of industry engineers, and scientists involved in modelling, control, measurements, new motor structures design, and could be also useful for engineers working in the field of electrical drives implementation. .作者: Wernickes-area 時間: 2025-3-27 19:11 作者: reject 時間: 2025-3-28 01:43 作者: 巨頭 時間: 2025-3-28 05:44
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