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標題: Titlebook: Chemical, Structural and Electronic Analysis of Heterogeneous Surfaces on Nanometer Scale; Renzo Rosei Book 1997 Springer Science+Business [打印本頁]

作者: formation    時間: 2025-3-21 16:52
書目名稱Chemical, Structural and Electronic Analysis of Heterogeneous Surfaces on Nanometer Scale影響因子(影響力)




書目名稱Chemical, Structural and Electronic Analysis of Heterogeneous Surfaces on Nanometer Scale影響因子(影響力)學科排名




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書目名稱Chemical, Structural and Electronic Analysis of Heterogeneous Surfaces on Nanometer Scale網(wǎng)絡(luò)公開度學科排名




書目名稱Chemical, Structural and Electronic Analysis of Heterogeneous Surfaces on Nanometer Scale被引頻次




書目名稱Chemical, Structural and Electronic Analysis of Heterogeneous Surfaces on Nanometer Scale被引頻次學科排名




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書目名稱Chemical, Structural and Electronic Analysis of Heterogeneous Surfaces on Nanometer Scale年度引用學科排名




書目名稱Chemical, Structural and Electronic Analysis of Heterogeneous Surfaces on Nanometer Scale讀者反饋




書目名稱Chemical, Structural and Electronic Analysis of Heterogeneous Surfaces on Nanometer Scale讀者反饋學科排名





作者: 虛弱    時間: 2025-3-21 20:36
Past Triumphs, Future Challenges,hanical properties of sample surfaces. The near-field optical microscope on the other hand measures the reflectivity, absorption or the fluorescence near the sample surface. As an application we discuss the imaging of polymer surfaces.
作者: predict    時間: 2025-3-22 01:53

作者: 說不出    時間: 2025-3-22 06:22
SFFM and SNOM of Heterogeneous Materials,hanical properties of sample surfaces. The near-field optical microscope on the other hand measures the reflectivity, absorption or the fluorescence near the sample surface. As an application we discuss the imaging of polymer surfaces.
作者: Ganglion    時間: 2025-3-22 12:11

作者: MAUVE    時間: 2025-3-22 15:12
Book 1997-scanning photoemission microscopy with slow electrons. (6) theBESSY 2 project for a non-scanning photoelectron microscope withelectron optics. (7) Spatially-resolved .in situ. reaction studiesof chemical waves and oscillatory phenomena with the UV photoemissionmicroscope.
作者: MAUVE    時間: 2025-3-22 19:59

作者: 案發(fā)地點    時間: 2025-3-22 23:42
Chemical, Structural and Electronic Analysis of Heterogeneous Surfaces on Nanometer Scale978-94-011-5724-7Series ISSN 0168-132X
作者: 內(nèi)疚    時間: 2025-3-23 05:12

作者: N防腐劑    時間: 2025-3-23 05:50
C. A. Lunn,M. Takahara,M. Inouye, metals, semiconductors, superconductors, molecular and biological systems, and adsorbed layers [2]. Here we present two new applications in the study of two-and lower-dimensional electron systems involving electrons in surface states of semiconductors and metals. First, STM tip-sample electrical p
作者: 不連貫    時間: 2025-3-23 12:47

作者: overreach    時間: 2025-3-23 17:15
https://doi.org/10.1007/978-3-642-58760-3anning. This problem is particularly relevant for the new class of synchrotron-radiation techniques known as . — which combine the analytical power of established spectroscopies with high lateral resolution.[1] These techniques are becoming extremely important with the advent of the new, ultrabright
作者: 數(shù)量    時間: 2025-3-23 21:51
https://doi.org/10.1007/978-1-4612-4796-8es based on zone plate optics are utilized. One of these is an ultrahigh vacuum scanning photoemission microscope (SPEM) solely intended for surface characterization, while the other is a scanning transmission x-ray microscope (STXM). The former was substantially modified during the last few years a
作者: 單挑    時間: 2025-3-23 23:20
Charge Exchange Between Localized Sitespaper discusses mainly the present state of art of imaging with a multimethod instrument which allows LEED, LEEM, MEM and various emission microscopies without and with energy filtering, using electrons or photons as primary species. It includes also a brief comparison with spin-polarized LEEM and w
作者: 異端    時間: 2025-3-24 03:16

作者: 兩種語言    時間: 2025-3-24 08:04

作者: 圖畫文字    時間: 2025-3-24 11:35

作者: 眨眼    時間: 2025-3-24 17:07
https://doi.org/10.1007/978-94-011-5724-7LEEM; PEEM; PES; SNOM; STM; electron microscope; electron microscopy; microscopy; spectroscopy
作者: judicial    時間: 2025-3-24 19:07

作者: 松馳    時間: 2025-3-24 23:43
Recent Advances in LEEM/PEEM for Structural and Chemical Analysis,paper discusses mainly the present state of art of imaging with a multimethod instrument which allows LEED, LEEM, MEM and various emission microscopies without and with energy filtering, using electrons or photons as primary species. It includes also a brief comparison with spin-polarized LEEM and with pure emission microscopy.
作者: 模范    時間: 2025-3-25 05:18

作者: 哎呦    時間: 2025-3-25 09:26

作者: Fierce    時間: 2025-3-25 12:39

作者: 一美元    時間: 2025-3-25 16:58

作者: LAVE    時間: 2025-3-26 00:00

作者: HEAVY    時間: 2025-3-26 00:27

作者: Decrepit    時間: 2025-3-26 06:34

作者: Vaginismus    時間: 2025-3-26 09:50

作者: 駭人    時間: 2025-3-26 14:34
https://doi.org/10.1007/978-1-4612-4796-8ontrast via absorption spectroscopy in studies of a variety of polymeric materials in transmission. A spatial resolution of 30-40 ran and an energy resolution of 400 meV could be achieved in these experiments.
作者: 遭遇    時間: 2025-3-26 16:58
Scanning Spectro-Microscopy with 250 to 800 eV X-Rays,ontrast via absorption spectroscopy in studies of a variety of polymeric materials in transmission. A spatial resolution of 30-40 ran and an energy resolution of 400 meV could be achieved in these experiments.
作者: 印第安人    時間: 2025-3-26 23:30
0168-132X e: (i) local probe methods, including scanningtunnelling microscopy and its derivatives; and (ii) nanoscalephotoemission and absorption spectroscopy for chemical analysis. .The keynote lectures were delivered by some of the world‘s bestscientists in the field and some of the topics covered include:
作者: dissolution    時間: 2025-3-27 03:54
https://doi.org/10.1007/978-3-642-58760-3 established spectroscopies with high lateral resolution.[1] These techniques are becoming extremely important with the advent of the new, ultrabright synchrotron sources of soft-x-rays: ELETTRA in Trieste, the Advanced Light Source in Berkeley, the SRRC in Hsinchu-Taiwan, and the Pohang source in Korea.
作者: 朝圣者    時間: 2025-3-27 08:48

作者: 路標    時間: 2025-3-27 09:39

作者: APRON    時間: 2025-3-27 13:58

作者: HALO    時間: 2025-3-27 17:45
Some Spectromicroscopy Developments at Bessy,different concepts of photoelectron microscopes have been realized using scanning and imaging techniques, respectively, both of which have proven their advantages in the study of fundamental as well as applied research problems. Most concepts were presented during this workshop and shall therefore not be described here.
作者: 閹割    時間: 2025-3-27 22:34
Shedding Light on Surface Reactions, light is exploited, either an ellipso microscope for surface imaging (EMSI) or a reflection anisotropy microscope (RAM) can be utilised. Pattern formation during the catalytic CO-oxidation is observed by these methods over a wide pressure range annihilating the “pressure gap” between ultra high vacuum (UHV) and ordinary atmospheric conditions.
作者: doxazosin    時間: 2025-3-28 03:58
10樓
作者: Sad570    時間: 2025-3-28 09:05
10樓




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