標(biāo)題: Titlebook: CMOS Integrated Analog-to-Digital and Digital-to-Analog Converters; Rudy Plassche Book 2003Latest edition Springer Science+Business Media [打印本頁] 作者: 喜悅 時(shí)間: 2025-3-21 18:36
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作者: 壕溝 時(shí)間: 2025-3-21 21:25
Specifications of converters,must include the application of converters in conversion systems (see references [14, 15]). Dynamic specifications of converters are needed to obtain insight in the applicability of a certain converter in a digital signal processing system: for example, digital audio or digital video. In a conversio作者: Macronutrients 時(shí)間: 2025-3-22 01:13
High-speed A/D converters,ompares the input voltage with a set of increasing reference voltages. The comparator outputs represent the input signal in a digital (thermometer) code which can be easily converted into a Gray or binary weighted output code. The flash architecture shows a good speed performance and can easily be i作者: 內(nèi)閣 時(shí)間: 2025-3-22 07:28 作者: 瘙癢 時(shí)間: 2025-3-22 10:34
High-resolution A/D converters,he introduction of digital audio recording equipment such as Super Audio Compact Disc (SACD) players requires resolutions from 16 to 24 bits. Monolithic converters with such a high linearity are difficult to design and require special circuit configurations. When a low conversion speed is needed, in作者: 索賠 時(shí)間: 2025-3-22 15:24
High-resolution D/A converters,n example of such a market is digital audio. The large dynamic range of a digital audio system requires converters with resolutions from 16 to 24 bits. Monolithic converters with such a high linearity are difficult to design and require special circuit configurations. The most simple types of D/A co作者: 索賠 時(shí)間: 2025-3-22 20:13 作者: 掃興 時(shí)間: 2025-3-22 23:31 作者: Servile 時(shí)間: 2025-3-23 04:49 作者: Delude 時(shí)間: 2025-3-23 06:06 作者: 產(chǎn)生 時(shí)間: 2025-3-23 12:01
Limitations of comparators,tage or the input stage of a comparator. The amplitude of the input signal is usually much larger than the linear range of the input amplifier stages. In this way a limitation of signals for the individual amplifier stages occurs. This amplitude limitation results in variations of the delay times of作者: confide 時(shí)間: 2025-3-23 13:58
Technology and device matching,ter for example needs for l. yield and ±? LSB INL an element matching of 2.5%. In case we want to increase the yield to 3. then the matching must be increased to 1.25%. In this section matching parameters of devices in MOS technology will be given. It must be noted, however, that mostly the matching作者: Nucleate 時(shí)間: 2025-3-23 19:49
Testing of D/A and A/D converters,mously on the test procedures. In general, static performance tests can be performed by using digital voltmeters which can be a part of an Automatic Test Equipment set (ATE). Dynamic tests, especially in the case of high-dynamic-range tests, require special equipment. Furthermore, these dynamic test作者: nominal 時(shí)間: 2025-3-23 23:38
Book 2003Latest edition Spurious Free Dynamic Range (SFDR), Integral Non-Linearity (INL), Differential Non-Linearity (DNL) and sampling clock jitter requirements. Relations between these specifications and practical issues like matching of components and offset parameters of differential pairs are derived. ..CMOS Integrat作者: progestogen 時(shí)間: 2025-3-24 05:28 作者: FLING 時(shí)間: 2025-3-24 09:11
Fields of Research and Technology,s are generally more difficult to standardize and consume more test time (see [35, 36, 16, 17]). Up until now dynamic test results have been listed very briefly in specification sheets. In this chapter we will determine test configurations and test procedures in order to arrive at a unanimous qualification of converters.作者: 諷刺 時(shí)間: 2025-3-24 11:49
https://doi.org/10.1007/978-981-97-6814-1nal spectrum. The spurious free dynamic range is a very good measure for the linearity of the converter at high output signal frequencies. Therefore special designs are needed that perform this function. In many cases the resolution is limited to 10 to 12 bits, although extension into the 14 to 16 bit range will come up soon.作者: intertwine 時(shí)間: 2025-3-24 15:07
Ibtisam E. Tothill,Mohammed J. Abdinut low-pass filter reconstructs the analog signal and removes the modulation signal. Maximum speed of these types of converters is limited to the kHz range or low Mega Hertz range. The advantage of these systems is the small amount of accurate components that are needed in a practical implementation.作者: Esalate 時(shí)間: 2025-3-24 19:01 作者: Obliterate 時(shí)間: 2025-3-25 02:54
High-speed D/A converters,nal spectrum. The spurious free dynamic range is a very good measure for the linearity of the converter at high output signal frequencies. Therefore special designs are needed that perform this function. In many cases the resolution is limited to 10 to 12 bits, although extension into the 14 to 16 bit range will come up soon.作者: 沒血色 時(shí)間: 2025-3-25 04:33 作者: STANT 時(shí)間: 2025-3-25 08:45
Voltage and current references,erse-biasing transistors. Today’s reference sources are built using the band-gap voltage of silicon as a low-temperature dependent reference voltage. In this chapter different circuits will be described that use the band-gap principle to stabilize a voltage or a current. Examples of band-gap reference voltages are given in references [75, 76, 78].作者: 王得到 時(shí)間: 2025-3-25 13:20 作者: GRAVE 時(shí)間: 2025-3-25 19:33
Testing of D/A and A/D converters,s are generally more difficult to standardize and consume more test time (see [35, 36, 16, 17]). Up until now dynamic test results have been listed very briefly in specification sheets. In this chapter we will determine test configurations and test procedures in order to arrive at a unanimous qualification of converters.作者: BULLY 時(shí)間: 2025-3-25 22:41
Ram Prasad,Vivek Kumar,Manoj Kumar the counting operation in the time-to-number conversion cycle. A speed improvement is obtained by using a coarse and fine conversion cycle in the time-to-number counting operation. A well-known analog-to-digital converter based on this system is the dual slope converter. This converter is mostly used in digital voltmeters.作者: Coeval 時(shí)間: 2025-3-26 00:18
High-resolution A/D converters, the counting operation in the time-to-number conversion cycle. A speed improvement is obtained by using a coarse and fine conversion cycle in the time-to-number counting operation. A well-known analog-to-digital converter based on this system is the dual slope converter. This converter is mostly used in digital voltmeters.作者: affinity 時(shí)間: 2025-3-26 06:58
Book 2003Latest editionA/D and D/A converters, high-resolution A/D and D/A converters, sample-and-hold amplifiers, voltage and current references, noise-shaping converters and sigma-delta converters, technology parameters and matching performance, comparators and limitations of comparators and finally testing of converters. .作者: jealousy 時(shí)間: 2025-3-26 10:17
0893-3405 (INL), Differential Non-Linearity (DNL) and sampling clock .CMOS Integrated Analog-to-Digital and Digital-to-Analog Converters. describes in depth converter specifications like Effective Number of Bits (ENOB), Spurious Free Dynamic Range (SFDR), Integral Non-Linearity (INL), Differential Non-Linear作者: Archipelago 時(shí)間: 2025-3-26 14:31
Chaos in Ballistic Nanostructures,nts limits the dynamic range of an analog system. The ratio between the maximum allowable analog signal and the noise determines the dynamic range of the system. The signal-to-noise (S/N) ratio is a measure of the maximum dynamic range.作者: famine 時(shí)間: 2025-3-26 18:11
Atom Optics: Using Light to Position Atoms,insight in the applicability of a certain converter in a digital signal processing system: for example, digital audio or digital video. In a conversion system the complete conversion from analog into digital or digital into analog information is performed. Such systems include input or output amplification and anti-alias filtering.作者: GEON 時(shí)間: 2025-3-27 00:11
Challenges and Future of Nanotechnology, amplifier samples the analog input signal during a short time and then holds the signal during the full clock period giving the analog-to-digital converter about twice the time to perform the conversion as in the case of a track-and-hold amplifier.作者: 細(xì)胞 時(shí)間: 2025-3-27 01:25 作者: Morsel 時(shí)間: 2025-3-27 09:14 作者: Affirm 時(shí)間: 2025-3-27 09:42 作者: 下垂 時(shí)間: 2025-3-27 14:23 作者: guzzle 時(shí)間: 2025-3-27 21:42 作者: 凹槽 時(shí)間: 2025-3-28 01:40
The Springer International Series in Engineering and Computer Sciencehttp://image.papertrans.cn/c/image/220353.jpg作者: optic-nerve 時(shí)間: 2025-3-28 02:37
https://doi.org/10.1007/978-1-4757-3768-4CMOS; Jitter; Signal; Standard; Symbol; Transducer; analog; circuit; filtering; filters; material; signal proce作者: 愛好 時(shí)間: 2025-3-28 07:20
978-1-4419-5367-4Springer Science+Business Media New York 2003作者: Amplify 時(shí)間: 2025-3-28 12:01 作者: correspondent 時(shí)間: 2025-3-28 14:58 作者: 原告 時(shí)間: 2025-3-28 19:46
Harold U. Baranger,R. M. Westerveltompares the input voltage with a set of increasing reference voltages. The comparator outputs represent the input signal in a digital (thermometer) code which can be easily converted into a Gray or binary weighted output code. The flash architecture shows a good speed performance and can easily be i作者: manifestation 時(shí)間: 2025-3-28 23:21
https://doi.org/10.1007/978-981-97-6814-1ese converters are used in telecom applications to generate the modulation signals in mobile phones. Other applications are Ethernet communication sets. Numerous applications are in the area instrumentation systems needing an accurate reconstruction of analog signals from digitally generated signals作者: 整潔漂亮 時(shí)間: 2025-3-29 06:48 作者: liposuction 時(shí)間: 2025-3-29 09:24 作者: DEFT 時(shí)間: 2025-3-29 15:02 作者: 天空 時(shí)間: 2025-3-29 16:07 作者: 果仁 時(shí)間: 2025-3-29 23:29 作者: Esophagus 時(shí)間: 2025-3-30 00:32
Ethical Aspects of Nanotechnology, of the reference source is very important for high-resolution, high-accuracy converters. A well-known device for stabilizing a reference voltage is a zener diode. In integrated circuits, however, the zener diode can cause problems with the reliability of the circuit. In modern technologies it is no作者: Iniquitous 時(shí)間: 2025-3-30 05:08 作者: 你不公正 時(shí)間: 2025-3-30 09:00 作者: 抑制 時(shí)間: 2025-3-30 14:38
Fields of Research and Technology,mously on the test procedures. In general, static performance tests can be performed by using digital voltmeters which can be a part of an Automatic Test Equipment set (ATE). Dynamic tests, especially in the case of high-dynamic-range tests, require special equipment. Furthermore, these dynamic test作者: 是貪求 時(shí)間: 2025-3-30 16:52
High-speed A/D converters,ut amplifiers resulting in a lower power consumption. The influence of offset voltages in the input amplifiers can be reduced by using averaging between active amplifier stages. At the same time, signal-to-noise ratio is improved without using more power. An alternative to the full-flash architectur
