標(biāo)題: Titlebook: BiCMOS Technology and Applications; A. R. Alvarez Book 1993Latest edition Springer Science+Business Media New York 1993 CMOS.Standard.anal [打印本頁] 作者: Constrict 時(shí)間: 2025-3-21 17:15
書目名稱BiCMOS Technology and Applications影響因子(影響力)
書目名稱BiCMOS Technology and Applications影響因子(影響力)學(xué)科排名
書目名稱BiCMOS Technology and Applications網(wǎng)絡(luò)公開度
書目名稱BiCMOS Technology and Applications網(wǎng)絡(luò)公開度學(xué)科排名
書目名稱BiCMOS Technology and Applications被引頻次
書目名稱BiCMOS Technology and Applications被引頻次學(xué)科排名
書目名稱BiCMOS Technology and Applications年度引用
書目名稱BiCMOS Technology and Applications年度引用學(xué)科排名
書目名稱BiCMOS Technology and Applications讀者反饋
書目名稱BiCMOS Technology and Applications讀者反饋學(xué)科排名
作者: Benzodiazepines 時(shí)間: 2025-3-21 23:56
Intelligent Systems and Pattern Recognitionthe device designer wishes to optimize the performance of the transistors while simultaneously maintaining process simplicity. The challenge to achieve this in the BiCMOS environment is heightened because the process requirements for the MOSFET and bipolar transistors often conflict with one another作者: Phonophobia 時(shí)間: 2025-3-22 02:16 作者: 陶器 時(shí)間: 2025-3-22 06:52 作者: Proponent 時(shí)間: 2025-3-22 11:20 作者: craven 時(shí)間: 2025-3-22 14:55
Endra Joelianto,Herman Y. Sutarton and area have been regarded as the theoretical indications for technology performance and density. In a similar manner memory access time, memory power dissipation and memory size have been regarded as the practical indications of technology performance and density. Against this empirical yard sti作者: fixed-joint 時(shí)間: 2025-3-22 20:03
Georg Ruhrmann,J?rg-Uwe Nielandtudies have shown that today test can easily account for onethird of development effort but test-escapes still account for 30% of all defective devices removed from printed circuit boards, Fig. 7.1 [.]. With test playing such an important role, it is imperative that the implications of a technology 作者: 薄膜 時(shí)間: 2025-3-22 22:55
https://doi.org/10.1007/978-3-322-81044-1grated circuits evolved from the bipolar technologies with vertical . transistors and lateral . transistors. While bipolar analog integrated circuits continued to develop, NMOS technologies were becoming popular in digital integrated circuits for their high packing density. For analog applications, 作者: 救護(hù)車 時(shí)間: 2025-3-23 03:51
https://doi.org/10.1007/978-3-319-91941-6 design technology have resulted in increasingly complex designs. Most important of all, the data management of these complex new designs has become difficult. VLSI design is now gated by the available set of software tools. The tools that encompass the entire gamut of design tasks are . software.作者: Eulogy 時(shí)間: 2025-3-23 06:34 作者: 依法逮捕 時(shí)間: 2025-3-23 13:40 作者: 吼叫 時(shí)間: 2025-3-23 14:23
Asma Siagh,Fatima Zohra Laallam,Okba Kazarity and the compatibility of fabricating CMOS and bipolar devices on the same chip. Performance and process tradeoffs are expected as these two device types are merged with minimal additional process steps. Therefore, it is imperative that device reliability issues are integrated with the process architecture and device design issues.作者: micronized 時(shí)間: 2025-3-23 18:53
Wang Wenbo,Guo Ce,Sun Jiurong,Dai Zhendongcells [., .,.], in SRAMs for decoders and word line drivers [.,.,.], and in processors for random logic [.,.,.], The circuit operation and the underlying device characteristics that are important for BiCMOS gates are both quite different from CMOS or ECL gates.作者: 意外的成功 時(shí)間: 2025-3-24 02:04 作者: 禁止 時(shí)間: 2025-3-24 05:01
The Springer International Series in Engineering and Computer Sciencehttp://image.papertrans.cn/b/image/185412.jpg作者: 減震 時(shí)間: 2025-3-24 10:08
https://doi.org/10.1007/978-1-4615-3218-7CMOS; Standard; analog; analog design; integrated circuit; physics; testing; transistor作者: Ruptured-Disk 時(shí)間: 2025-3-24 13:56
978-1-4613-6413-9Springer Science+Business Media New York 1993作者: SSRIS 時(shí)間: 2025-3-24 16:32 作者: Bother 時(shí)間: 2025-3-24 22:49
Digital Design,cells [., .,.], in SRAMs for decoders and word line drivers [.,.,.], and in processors for random logic [.,.,.], The circuit operation and the underlying device characteristics that are important for BiCMOS gates are both quite different from CMOS or ECL gates.作者: Bumptious 時(shí)間: 2025-3-25 01:28
CAD Methods for BiCMOS Design, design technology have resulted in increasingly complex designs. Most important of all, the data management of these complex new designs has become difficult. VLSI design is now gated by the available set of software tools. The tools that encompass the entire gamut of design tasks are . software.作者: 冒失 時(shí)間: 2025-3-25 06:54 作者: Rheumatologist 時(shí)間: 2025-3-25 11:32 作者: 脫落 時(shí)間: 2025-3-25 14:02 作者: 民間傳說 時(shí)間: 2025-3-25 16:58 作者: 吃掉 時(shí)間: 2025-3-26 00:01
BiCMOS Device Design, Optimization, and Scaling, thorough device design approach, coupled with the application of a statistically-based device design methodology, becomes critical for evaluating both performance tradeoff and manufacturability implications.作者: 向外才掩飾 時(shí)間: 2025-3-26 00:52 作者: nonsensical 時(shí)間: 2025-3-26 08:20
https://doi.org/10.1007/978-3-322-81044-1despite the inherent drawbacks of NMOS circuits such as low gain, difficult level shifting, and large offset voltages, many clever circuit design techniques were invented to overcome the shortcomings, and take the full advantage of NMOS technologies [.-.].作者: BRIEF 時(shí)間: 2025-3-26 10:57 作者: 宏偉 時(shí)間: 2025-3-26 15:32
Endra Joelianto,Herman Y. Sutartower dissipation and memory size have been regarded as the practical indications of technology performance and density. Against this empirical yard stick BiCMOS technology has been found to produce memories with MOS-like power and density but with speeds and I/O interfaces which one normally attributes to bipolar memories.作者: fastness 時(shí)間: 2025-3-26 19:10
Georg Ruhrmann,J?rg-Uwe Nielands removed from printed circuit boards, Fig. 7.1 [.]. With test playing such an important role, it is imperative that the implications of a technology to test methods be understood. This will allow for informed decisions to be made about the applicability of a technology to a project and the costs involved.作者: Cognizance 時(shí)間: 2025-3-27 00:02
BiCMOS Standard Memories,wer dissipation and memory size have been regarded as the practical indications of technology performance and density. Against this empirical yard stick BiCMOS technology has been found to produce memories with MOS-like power and density but with speeds and I/O interfaces which one normally attributes to bipolar memories.作者: Overdose 時(shí)間: 2025-3-27 04:18
Testing,s removed from printed circuit boards, Fig. 7.1 [.]. With test playing such an important role, it is imperative that the implications of a technology to test methods be understood. This will allow for informed decisions to be made about the applicability of a technology to a project and the costs involved.作者: 賭博 時(shí)間: 2025-3-27 06:23
Introduction to BiCMOS,e I/Os (TTL, CMOS, or ECL), 4) high performance analog, and 5) latchup immunity [.]. Compared to CMOS, BiCMOS’s reduced dependence on capacitive load and the multiple circuit and I/Os configurations possible greatly enhance design flexibility and can lead to reduced design cycle time. The inherent r作者: 能量守恒 時(shí)間: 2025-3-27 10:33
A Perspective On BiCMOS Trends,jor semiconductor company now boasts some form of BiCMOS technology, its relative process complexity keeps cost stubbornly high. It has also taken the circuit and system designers the full decade to learn how to best exploit BiCMOS, and we’re still learning. Commercial CAD tools, while making signif作者: 系列 時(shí)間: 2025-3-27 14:41
Book 1993Latest edition processing and circuit design is assumed. Given thedivision of the book, it lends itself well to a two-part course; oneon technology and one on design. This will provide advanced studentswith a good understanding of tradeoffs between bipolar and MOS devicesand circuits..作者: 貪心 時(shí)間: 2025-3-27 21:09 作者: Permanent 時(shí)間: 2025-3-28 01:18 作者: 多余 時(shí)間: 2025-3-28 04:07 作者: 有花 時(shí)間: 2025-3-28 08:30
Introduction to BiCMOS,to achieve VLSI circuits with speed-power-density performance previously unattainable with either technology individually. CMOS technology maintains an advantage over Bipolar in power dissipation, noise margins, packing density,and the ability to integrate large complex functions with high yields. B作者: 種植,培養(yǎng) 時(shí)間: 2025-3-28 12:41
BiCMOS Device Design, Optimization, and Scaling,the device designer wishes to optimize the performance of the transistors while simultaneously maintaining process simplicity. The challenge to achieve this in the BiCMOS environment is heightened because the process requirements for the MOSFET and bipolar transistors often conflict with one another作者: Indurate 時(shí)間: 2025-3-28 14:48 作者: Muscularis 時(shí)間: 2025-3-28 20:16
Process Reliability,ity and the compatibility of fabricating CMOS and bipolar devices on the same chip. Performance and process tradeoffs are expected as these two device types are merged with minimal additional process steps. Therefore, it is imperative that device reliability issues are integrated with the process ar作者: 工作 時(shí)間: 2025-3-28 23:13 作者: Engulf 時(shí)間: 2025-3-29 03:35
BiCMOS Standard Memories,n and area have been regarded as the theoretical indications for technology performance and density. In a similar manner memory access time, memory power dissipation and memory size have been regarded as the practical indications of technology performance and density. Against this empirical yard sti作者: 悲觀 時(shí)間: 2025-3-29 09:30
Testing,tudies have shown that today test can easily account for onethird of development effort but test-escapes still account for 30% of all defective devices removed from printed circuit boards, Fig. 7.1 [.]. With test playing such an important role, it is imperative that the implications of a technology 作者: TIGER 時(shí)間: 2025-3-29 13:35
Analog Design,grated circuits evolved from the bipolar technologies with vertical . transistors and lateral . transistors. While bipolar analog integrated circuits continued to develop, NMOS technologies were becoming popular in digital integrated circuits for their high packing density. For analog applications, 作者: Bernstein-test 時(shí)間: 2025-3-29 15:36
CAD Methods for BiCMOS Design, design technology have resulted in increasingly complex designs. Most important of all, the data management of these complex new designs has become difficult. VLSI design is now gated by the available set of software tools. The tools that encompass the entire gamut of design tasks are . software.作者: 牲畜欄 時(shí)間: 2025-3-29 23:09 作者: 你正派 時(shí)間: 2025-3-30 01:25
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10樓作者: 產(chǎn)生 時(shí)間: 2025-3-30 13:35
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