標(biāo)題: SCIE期刊JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS 2024/2025影響因子:1.142 (J ELECTRON TEST) (0923-8174). (ENGINEE [打印本頁(yè)] 作者: DEBUT 時(shí)間: 2025-3-21 19:42
SCIE(SCI)期刊JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS(20 21 REV HIST)影響因子
SCIE(SCI)期刊JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS(J ELECTRON TEST)影響因子@(工程，電氣和電子)學(xué)科排名
SCIE(SCI)期刊JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS(20 21 REV HIST)總引論文
SCIE(SCI)期刊JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS(J ELECTRON TEST)總引論文@(工程，電氣和電子)學(xué)科排名
SCIE(SCI)期刊JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS(20 21 REV HIST)影響因子
SCIE(SCI)期刊JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS(J ELECTRON TEST)總引頻次@(工程，電氣和電子)學(xué)科排名
SCIE(SCI)期刊JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS(20 21 REV HIST)即時(shí)影響因子
SCIE(SCI)期刊JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS(J ELECTRON TEST)即時(shí)影響因子@(工程，電氣和電子)學(xué)科排名
SCIE(SCI)期刊JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS(20 21 REV HIST)五年累積影響因子
SCIE(SCI)期刊JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS(J ELECTRON TEST)五年累積影響因子@(工程，電氣和電子)學(xué)科排名
作者: athlete’s-foot 時(shí)間: 2025-3-21 22:28
Submitted on: 22 June 2002.
Revised on: 02 October 2002.
Accepted on: 10 November 2002.
___________________JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS作者: Overstate 時(shí)間: 2025-3-22 03:42 作者: neologism 時(shí)間: 2025-3-22 08:31 作者: Anticoagulant 時(shí)間: 2025-3-22 12:03
Submitted on: 10 November 2004.
Revised on: 31 January 2005.
Accepted on: 07 March 2005.
___________________JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS作者: intoxicate 時(shí)間: 2025-3-22 14:27 作者: 緩和 時(shí)間: 2025-3-22 20:06
Submitted on: 26 February 2003.
Revised on: 21 June 2003.
Accepted on: 15 August 2003.
___________________JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS作者: Embolic-Stroke 時(shí)間: 2025-3-22 23:36 作者: 受辱 時(shí)間: 2025-3-23 03:12 作者: 館長(zhǎng) 時(shí)間: 2025-3-23 08:48
Submitted on: 26 November 2010.
Revised on: 01 February 2011.
Accepted on: 02 March 2011.
___________________JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS作者: 蟄伏 時(shí)間: 2025-3-23 13:32 作者: 辯論 時(shí)間: 2025-3-23 17:36
Submitted on: 14 April 2005.
Revised on: 16 June 2005.
Accepted on: 29 July 2005.
___________________JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS作者: 完成才能戰(zhàn)勝 時(shí)間: 2025-3-23 20:40 作者: 過(guò)分 時(shí)間: 2025-3-24 00:51 作者: 憤憤不平 時(shí)間: 2025-3-24 02:32
Submitted on: 10 September 2001.
Revised on: 01 January 2002.
Accepted on: 14 January 2002.
___________________JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS作者: Nmda-Receptor 時(shí)間: 2025-3-24 07:28 作者: Trabeculoplasty 時(shí)間: 2025-3-24 13:06 作者: sacrum 時(shí)間: 2025-3-24 15:40 作者: 皮薩 時(shí)間: 2025-3-24 22:39 作者: Extricate 時(shí)間: 2025-3-25 03:01
Submitted on: 09 July 2007.
Revised on: 14 August 2007.
Accepted on: 09 September 2007.
___________________JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS作者: 紅潤(rùn) 時(shí)間: 2025-3-25 04:18 作者: 小隔間 時(shí)間: 2025-3-25 10:35 作者: CORE 時(shí)間: 2025-3-25 15:41
Submitted on: 20 February 2008.
Revised on: 23 May 2008.
Accepted on: 18 June 2008.
___________________JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS作者: SPALL 時(shí)間: 2025-3-25 18:36
Submitted on: 05 February 2017.
Revised on: 09 March 2017.
Accepted on: 22 April 2017.
___________________JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS作者: 翅膀拍動(dòng) 時(shí)間: 2025-3-25 21:07
Submitted on: 20 October 2024.
Revised on: 30 January 2025.
Accepted on: 25 February 2025.
___________________JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS作者: Liability 時(shí)間: 2025-3-26 03:40 作者: 粗魯性質(zhì) 時(shí)間: 2025-3-26 07:09
Submitted on: 29 May 1999.
Revised on: 26 June 1999.
Accepted on: 24 July 1999.
___________________JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS作者: delta-waves 時(shí)間: 2025-3-26 12:12 作者: 檢查 時(shí)間: 2025-3-26 15:38
Submitted on: 18 May 2020.
Revised on: 02 August 2020.
Accepted on: 13 August 2020.
___________________JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS作者: paltry 時(shí)間: 2025-3-26 20:09
Submitted on: 22 April 2013.
Revised on: 17 August 2013.
Accepted on: 01 October 2013.
___________________JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS作者: muscle-fibers 時(shí)間: 2025-3-26 21:41 作者: circumvent 時(shí)間: 2025-3-27 01:35 作者: MENT 時(shí)間: 2025-3-27 05:35
Submitted on: 25 July 2015.
Revised on: 29 October 2015.
Accepted on: 01 December 2015.
___________________JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS作者: 拖債 時(shí)間: 2025-3-27 13:03 作者: RLS898 時(shí)間: 2025-3-27 13:44 作者: 該得 時(shí)間: 2025-3-27 18:12
